#
# arev:/usr/local/unicat/unireq/beamreq/req00034.txt
# UNICAT Member Beam Time Request  #34

# created Tue Dec 15 21:18:19 CST 1998
#

days:
	5

description:
	Previous surface CXD experiments have been completed at ESRF and NSLS,
	but not yet attempted at UNICAT.  With previous data, we have reached
	the point that we can invert the diffraction patterns in 1D to make
	images of the sample height along stripes about 5um wide by 100um long.
	Since the 100um dimension is within the SOC of a typical goniometer
	circle (Huber or Newport) we should be able to assemble a 2D surface
	profile from a set of adjacent 1D profiles.  This can be independently
	verified by forming a second 2D profile at 90 degrees to the first.
	
	The experiment consists of beam-defining slits right in front of the
	sample, grazing incidence reflection into a 2.5m-long flight path
	and detection by CCD.  The samples are etched Si(111) wafers whose
	oxide is partially regrown; we know these to have roughness in the
	interesting length-scale-range of 10A over 100um.
	
	The importance of the work is to keep moving forward on the development
	of CXD data-analysis methods while sector 34 is under construction.
	The experiment is debugged (except for the CCD part) so we know the
	samples are suitable for ESRF or NSLS/X25 brightness levels.  The
	biggest advantage of using APS is the expectation of improved beam
	stability, as we found last year in our Cu_3Au experiments.

equipment+required:
	Huber or Newport diffractometer (working interface)

experiment:
	2D mapping of surface coherent diffraction

hazards:
	All procedures have been previously 'enveloped' at UNICAT.
	The etching of the samples will have been carried out before
	we come to ANL.

name:
	Ian Robinson

new+request:
	on

nonmembers:
	

station:
	33ID-D

unacceptable+dates:
	1/30 to 2/3
	1/1 to 1/10



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