####################################################
# Ian Robinson <ikr@uiuc.edu>
# requesting 6 days, at minimum=4 days
# beamline 34ID, "Imaging the strain field of dislocations in SiGe thin films"
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# top:/home/www/beamtime-requests/req00337.txt
# UNICAT Member Beam Time Request  #337
# created Fri Dec 13 11:18:11 CST 2002
####################################################

beamline:
	34ID

collaboration:
	Yes

contact:
	ikr@uiuc.edu

days:
	6

description:
	CXD measurement of prefabricated samples with low disloaction density.  GeSi diffraction peak is isolated from that of substrate.  These will require focal spot of about 1 micron (spacing of dislocations).

equipment+required:
	KB mirrors
	CCD

experiment:
	Imaging the strain field of dislocations in SiGe thin films

foreign+nationals:
	

hazards:
	

minimumdays:
	4

name:
	Ian Robinson

nonmembers:
	

unacceptable+dates:
	


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