####################################################
# Joseph Woicik <woicik@anl.gov>
# requesting 6 days, at minimum=5 days
# beamline 33BM, "DAFS of BaTiO3/SrTiO3/SrTiO3 superlattices"
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# top:/home/www/beamtime-requests/req00443.txt
# UNICAT Member Beam Time Request  #443
# created Wed Aug 20 12:06:35 CDT 2003
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beamline:
	33BM

collaboration:
	No

collaborator_Paul:
	ON

contact:
	woicik@anl.gov

days:
	6

description:
	DAFS at the Ti K edge of BaTiO3/SrTiO3/SrTiO3 superlattices will
be attempted.

Glancing incidence XRD of strained GeSi films on Si will be measured.

Diffraction of BiFeO films on STO and Si will also be performed.

equipment_required:
	Eventually, this experiment will require the use of the displex with
the diffractometer.  But, not the first time due to the complexity of
the experiment.

experiment:
	DAFS of BaTiO3/SrTiO3/SrTiO3 superlattices

foreign_nationals:
	

hazards:
	None.

minimumdays:
	5

name:
	Joseph Woicik

new_request:
	ON

nonmembers:
	Julie Cross

unacceptable_dates:
	I propose starting this experiment with the last one I submitted
for exafs of LaAlO films december 10 and running to the end of the
run which is december 21.  The experiment will require one crystal
change then.

z34ID_details:
	


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