####################################################
# Gene E. Ice <IceGE@ornl.gov>
# requesting 12 days, at minimum=10 days
# beamline 34ID-E, Sn and Zn whiskers
# instrument 34ID-E microbeam
####################################################
# top:/home/www/beamtime-requests/req00544.txt
# UNICAT Member Beam Time Request  #544
# created Fri Dec 19 07:55:40 CST 2003
####################################################

beamline:
	34ID-E

collaboration:
	No

collaborator_Wenjun:
	ON

contact:
	IceGE@ornl.gov

days:
	12

description:
	Anomalous grain growth resulting in whiskers on Sn films is a major headache for semiconductor manufacturers trying to eliminte the use of Pb based solders. In addition this is an interesting fundamental grain-growth problem that has attracted enormous interest world-wide. The semiconductor industry has concluded that x-ray microdiffraction represents the best tool for understanding Sn whisker growth. Experiments have been previously performed both at Unicat and at the ALS polychromatic microdiffraction facility. In this set of experiments we wish to study a little-known but similar behavior observed in Zn films. Zn films are particularly interesting for two reasons: (1) the crystal structure is distinct from Sn and (2) the absorption coeffiient is significantly lower which will allow for studying thicker films and larger grains. 

We intend to build on our previous work in the following ways.
a. We will obtain Sn Samples with larger grains and well mapped whisker structures.
b. We will obtain Zn samples with large grains and well mapped whisker structures.

We will measure the grain boundary structure of the films and compare to CSL models. We will study the near-whisker grain boundary structure. We will measure the strain in a 2D cross section through a whisker.

equipment_required:
	

experiment:
	Sn and Zn whiskers

foreign_nationals:
	

hazards:
	None known

instrument:
	34ID-E microbeam

instrument_other:
	

minimumdays:
	10

name:
	Gene E. Ice

nonmembers:
	

unacceptable_dates:
	These measurements can be done without Gene on site-although it would be preferable to avoid the following dates.

Jan 23-Feb 1
Feb 7-15
April 14
May 2-16

z34ID_change_undulator:
	no

z34ID_details:
	None

z34ID_on_axis:
	no

z34ID_parasitic:
	yes

z34ID_taper:
	no


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