####################################################
# Peter Czoschke <czoschke@mrl.uiuc.edu>
# requesting 5 days, at minimum=3 days
# beamline 33ID, Structural Quantum Size Effects in Pb/Si(111)
# instrument 33ID-E surface
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# top:/home/www/beamtime-requests/req00586.txt
# UNICAT Member Beam Time Request  #586
# created Mon Apr 19 09:29:21 CDT 2004
####################################################

beamline:
	33ID

collaboration:
	Yes

collaborator_Hawoong:
	ON

contact:
	czoschke@mrl.uiuc.edu

days:
	5

description:
	Electronic contributions play a significant role in determining the growth behavior and surface morphology of ultrathin metal films.  By analyzing the thickness distribution of islands grown with different initial coverages, the relative stability, and hence the relative surface energy, of different thickness films can be determined.  This experiment would use such a process to experimentally map out the thickness-dependence of the relative surface energy for Pb/Si(111) and look for interface phase shift effects by comparing films grown on both the 7x7 and root3Xroot3 surfaces.

equipment_required:
	

experiment:
	Structural Quantum Size Effects in Pb/Si(111)

foreign_nationals:
	

hazards:
	LN2 will be used.

instrument:
	33ID-E surface

instrument_other:
	

minimumdays:
	3

name:
	Peter Czoschke

nonmembers:
	

unacceptable_dates:
	July 21-27
Aug. 3-5

z34ID_details:
	


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