####################################################
# Wenjun Liu <wjliu@anl.gov>
# requesting 6 days, at minimum=5 days
# beamline 34ID-E, Characterization of whiskers by 3D x-ray microdiffraction
# instrument 34ID-E microbeam
####################################################
# top:/home/www/beamtime-requests/req00666.txt
# UNICAT Member Beam Time Request  #666
# created Mon Aug 23 17:11:02 CDT 2004
####################################################

beamline:
	34ID-E

collaboration:
	No

collaborator_Wenjun:
	ON

contact:
	wjliu@anl.gov

days:
	6

description:
	Sn whisker growth is of interest owing to the application of Pb-free solder
in electronic manufacturing, and is believed to be a stress relief phenomenon. 
By using three dimensional X-ray microdiffraction technique, the local stress level,
the orientation of the grains in the finish around a whisker, and the growth direction
of whiskers will be determined. We hope this new approach to whisker growth can address
long-standing questions about growth mechanism of whiskers in electronic manufacturing.

equipment_required:
	

experiment:
	Characterization of whiskers by 3D x-ray microdiffraction

foreign_nationals:
	

hazards:
	No hazards

instrument:
	34ID-E microbeam

instrument_other:
	

minimumdays:
	5

name:
	Wenjun Liu

nonmembers:
	

unacceptable_dates:
	none

z34ID_change_undulator:
	yes

z34ID_details:
	no

z34ID_on_axis:
	no

z34ID_parasitic:
	no

z34ID_taper:
	no


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