####################################################
# Rozaliya Barabash <BarabashR@ornl.gov>
# requesting 7 days, at minimum=4 days
# beamline 34ID-E, GaN on SiC and Si
# instrument 34ID-E microbeam
####################################################
# top:/home/www/beamtime-requests/req00757.txt
# UNICAT Member Beam Time Request  #757
# created Fri Apr 08 13:05:25 CDT 2005
####################################################

apsrun:
	2005-02

beamline:
	34ID-E

collaboration:
	No

collaborator_Wenjun:
	ON

contact:
	BarabashR@ornl.gov

days:
	7

description:
	Measure the inhomogeneous strain field in a GaN film and on the substrate with 3D microdiffraction measurements.

equipment_required:
	Standard microdiffraction equipment

experiment:
	GaN on SiC and Si

foreign_nationals:
	Rozaliya Barabash

hazards:
	None

instrument:
	34ID-E microbeam

instrument_other:
	

minimumdays:
	4

name:
	Rozaliya Barabash

nonmembers:
	

unacceptable_dates:
	July 4-10
August 5-31

z34ID_change_undulator:
	no

z34ID_details:
	This experiment needs at least one day of dedicated beamtime and preferably two days of dedicated time in the middle of the experiment.

z34ID_on_axis:
	no

z34ID_parasitic:
	yes

z34ID_taper:
	yes


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