#################################################### # David Black # requesting 3 days, at minimum=3 days # beamline 33BM, Topography # instrument 33BM-B topography #################################################### # top:/home/www/beamtime-requests/req00779.txt # UNICAT Member Beam Time Request #779 # created Sun Apr 17 15:31:26 CDT 2005 #################################################### apsrun: 2005-02 beamline: 33BM collaboration: No collaborator_Jenia: ON contact: david.black@nist.gov days: 3 description: Characterize the defect microstructure of semiconductor materials equipment_required: Apogee camera experiment: Topography foreign_nationals: hazards: none instrument: 33BM-B topography instrument_other: minimumdays: 3 name: David Black nonmembers: unacceptable_dates: June 2 - 15 June 30 - July 5 July 14 - August 1 z34ID_details: #REMOTE_HOST: luk.uni.aps.anl.gov #REMOTE_ADDR: 164.54.216.151 #CONTENT_LENGTH: 438 #HTTP_REFERER: http://www.uni.aps.anl.gov/unireq.htm #HTTP_USER_AGENT: Mozilla/5.0 (Windows; U; Windows NT 5.1; en-US; rv:1.2.1) Gecko/20021130