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# Yong Chu <ychu@aps.anl.gov>
# requesting 6 days days, at minimum=6 days days
# beamline 34ID-C, X-ray Full-Field Diffraction MIcroscopy Investigation on SiC micropipes
# instrument 34ID-C coherent
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# top:/home/www/beamtime-requests/req01024.txt
# UNICAT Member Beam Time Request  #1024
# created Wed Aug 23 10:56:34 CDT 2006
####################################################

apsrun:
	2006-03

beamline:
	34ID-C

collaboration:
	Yes

contact:
	ychu@aps.anl.gov

days:
	6 days

description:
	X-ray Full-Field microscopy technique is used to probe the local distribution of strain and crystallographic orientation due to the micropipes in SiC single crystal wafers.   The sensitivity to strain and misorientation of the crystalline planes are probed using bright-field contrast similar to TEM.  The experiment in the last Aug showed distinct contrast around the tip. 

The experiment requires the use of:
1) KB mirors focused to the center of the diffractometer
2) Kappa diffractometer
3) Low-noise, high-resolution CCD detector (We will bring the CCD). 
4) X-ray energy:  10 keV.  This experiment could run parasitically only if the E-station is running at a constant energy of 10 keV or slighly lower.  Or, this experiment require the control of undulator energy.

equipment_required:
	Kappa diffractometer, KB mirrors

experiment:
	X-ray Full-Field Diffraction MIcroscopy Investigation on SiC micropipes

foreign_nationals:
	

hazards:
	

instrument:
	34ID-C coherent

instrument_other:
	

minimumdays:
	6 days

name:
	Yong Chu

nonmembers:
	Yuncheng Zhong (XMI group/sector 2)

submit:
	Submit

unacceptable_dates:
	Dec 1-8, 2006

z34ID_change_undulator:
	no

z34ID_details:
	The microscoe requires the use of contant beam energy.  The setup required due to the energy change in the middle of the run is enormous and this experiment needs to run with the E-station users who will be using constant beam energy of 9-10 keV

z34ID_parasitic:
	no


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