#################################################### # Ruqing Xu # requesting 5 days, at minimum=4 days # beamline 33ID, TDS temperature dependence study # instrument 33ID-D kappa #################################################### # top:/home/www/beamtime-requests/req01043.txt # UNICAT Member Beam Time Request #1043 # created Fri Aug 25 18:07:48 CDT 2006 #################################################### apsrun: 2006-03 beamline: 33ID collaboration: Yes contact: ruqingxu@uiuc.edu days: 5 description: (The same proposal has been submitted for beamline 33BM, it would be good if this experiment can be done in 33ID because higher intensity beam would help to improve our signal-noise ratio for the L-branch phonons.) ----- We are continuing our study of TDS temperature dependence with line scans. In the July 2006 run, the data for T-branch scans have yielded good quantitative result of phonon frequencies, which proves that our approach is plausible; however, we still need to improve our signal-noise ratio for the L-branch phonons, as well as longer time to study more k-points in the reciprocal space to make a complete story. We will also revise the sample holder to ensure a clean signal. ----- Basic description: X-ray incident on a single crystal sample of Cu(or Nb), which will be mounted in a displex with a heater to control its temperature. TDS intensity will be measured with a point detector at different k-points and different temperatures. equipment_required: displex, temprature controller, vacuum pump experiment: TDS temperature dependence study foreign_nationals: Ruqing Xu, Hawoong Hong, Jaseung Ku hazards: Cu sample might need to be processed with nitric acid, wich is corrosive & toxic. instrument: 33ID-D kappa instrument_other: minimumdays: 4 name: Ruqing Xu nonmembers: submit: Submit unacceptable_dates: z34ID_details: #REMOTE_HOST: chiangpc12.mrl.uiuc.edu #REMOTE_ADDR: 130.126.102.112 #CONTENT_LENGTH: 1468 #HTTP_REFERER: http://www.uni.aps.anl.gov/admin/unireq.html #HTTP_USER_AGENT: Mozilla/4.0 (compatible; MSIE 6.0; Windows NT 5.1; SV1; .NET CLR 1.1.4322)