####################################################
# Longxiang Zhang <lzhang24@uiuc.edu>
# requesting 4 days, at minimum=3 days
# beamline 33ID, Graphite thin films on 6H-SiC Surface
# instrument 33ID-E surface
####################################################
# top:/home/www/beamtime-requests/req01222.txt
# UNICAT Member Beam Time Request  #1222
# created Thu May 01 16:27:27 CDT 2008
####################################################

apsrun:
	2008-02

beamline:
	33ID

collaboration:
	No

contact:
	lzhang24@uiuc.edu

days:
	4

description:
	TDS study of graphitization process of 6H-SiC under different experimental conditions. Research of the quality of resulting graphite thin layers is also conducted for the preparation of future study of metal thin films on graphite substrate.

equipment_required:
	Surface Diffraction Chamber, Six-circle diffractometer

experiment:
	Graphite thin films on 6H-SiC Surface

foreign_nationals:
	Ruqing Xu

hazards:
	Only material of intense use is 6H-SiC in form of wafers, which is non-hazardous and requires no special safety precautions. Experiment will be carried out in situ and follow general safety procedures of UNICAT

instrument:
	33ID-E surface

instrument_other:
	

minimumdays:
	3

name:
	Longxiang Zhang

new_request:
	ON

nonmembers:
	

submit:
	Submit

unacceptable_dates:
	June 8- June 20

z34ID_change_undulator:
	no

z34ID_details:
	

z34ID_on_axis:
	no

z34ID_parasitic:
	no

z34ID_taper:
	no


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