Summary of UNICAT beam time requests

1287 34ID-C CXD of Zeolites
equipment:  
Ross Harder rharder@aps.anl.gov Tue May 26 12:04:05 -0500 2009
1286 34ID-E Deformed Cu
equipment:  
Jon Tischler TischlerJZ@ornl.gov Fri May 08 16:39:33 -0500 2009
1285 34ID-E Annealing of Al
equipment:  
Jon Tischler TischlerJZ@ornl.gov Fri May 08 16:36:37 -0500 2009
1284 33BM X-ray and neutron school experiment
equipment:  
Karapetrova Jenia jenia@anl.gov Fri May 08 12:11:59 -0500 2009
1283 34ID-E Alio XYZ stage commissioning
equipment:  
Wenjun Liu wjliu@anl.gov Thu May 07 15:01:30 -0500 2009
1282 34ID-E X-ray microdiffraction study of nano-twinned Cu under stress
equipment:  
Wenjun Liu wjliu@anl.gov Thu May 07 14:51:40 -0500 2009
1281 33ID Ion adsorption profiles at the quartz-aqueous solution interface under various conditions
equipment: Roper CCD, Vortex detector and control computers
Zhan Zhang zhanzhang@anl.gov Thu May 07 14:20:04 -0500 2009
1280 33ID 33ID setup
equipment:  
Zhan Zhang zhanzhang@anl.gov Thu May 07 14:09:51 -0500 2009
1279 33BM orientation of MgCNi3
equipment:  
Hawoong Hong hong@aps.anl.gov Thu May 07 14:03:15 -0500 2009
1278 33ID metals on oxides
equipment:  
Hawoong Hong hong@aps.anl.gov Thu May 07 13:55:57 -0500 2009
1277 33BM Investigating the strain state and lateral crystallinity in LaNiO3 films and superlattices
equipment:  
Karapetrova Jenia jenia@anl.gov Tue May 05 12:09:09 -0500 2009
1276 33BM Beam line operation
equipment:  
Karapetrova Jenia jenia@anl.gov Tue May 05 12:03:28 -0500 2009
1275 34ID-C development of CXD for biological samples
equipment:  
ross harder rharder@aps.anl.gov Wed Apr 15 10:47:17 -0500 2009
1274 34ID-E Al diffraction
equipment:  
zschack/liu/tischler zschack@anl.gov Fri Mar 27 15:50:29 -0500 2009
1273 Al diffraction
equipment:  
Liu & Tischler zschack@anl.gov Fri Mar 27 15:43:09 -0500 2009
1272 Al diffraction
equipment:  
Liu & Tischler zschack@anl.gov Fri Mar 27 15:42:56 -0500 2009
1271 33BM Beam line study
equipment:  
Karapetrova Evguenia jenia@anl.gov Wed Mar 11 12:45:02 -0500 2009
1270 33ID x-ray microscopy
equipment:  
p zschack zschack@anl.gov Tue Mar 10 18:31:49 -0500 2009
1269 34ID-C diffractometer upgrade
equipment:  
ross harder rharder@aps.anl.gov Mon Mar 02 16:51:24 -0600 2009
1268 34ID-E Test
equipment: None
Kevin Peterson kmpeters@anl.gov Thu Feb 12 15:50:11 -0600 2009
1267 34ID-E 34-ID-E PerkinElmer detector system EPICS control (02/09/2009 8:00am - 02/16/2009 8:00am)
equipment:  
Wenjun Liu wjliu@anl.gov Thu Feb 12 15:05:26 -0600 2009
1266 34ID-C New ccd comparisons for CXD
equipment:  
Ross Harder rharder@aps.anl.gov Sun Feb 08 18:28:55 -0600 2009
1265 33ID 33ID setup
equipment:  
Zhan Zhang zhanzhang@anl.gov Tue Jan 27 14:53:49 -0600 2009
1264 33BM Beam line operation
equipment:  
Evguenia Karapetrova jenia@anl.gov Tue Jan 27 14:06:05 -0600 2009
1263 33ID Final test
equipment: none
Kevin Peterson kmpeters@anl.gov Fri Jan 23 11:19:10 -0600 2009
1262 33ID Testing of new web site
equipment:  
Kevin Peterson kmpeters@anl.gov Wed Jan 21 11:03:02 CST 2009
1261 33BM Anomalous scattering on the Se and Pb edges
equipment:  
Paul Zschack zschack@anl.gov Wed Dec 10 13:42:34 CST 2008
1260 33BM Structure of single crystal overlayers
equipment:  
Bob Broach robert.broach@uop.com Mon Dec 01 10:34:34 CST 2008
1259 33BM Calibration of large Perkin Elmer detector
equipment: topo table
Jon Tischler TischlerJZ@ornl.gov Tue Nov 25 12:47:39 CST 2008
1258 33ID Beamline setup
equipment:  
Zhan Zhang zhanzhang@anl.gov Tue Sep 30 17:07:08 CDT 2008
1257 33BM Beam line operation
equipment:  
Evguenia Karapetrova jenia@anl.gov Tue Sep 30 16:18:21 CDT 2008
1256 34ID-C Coherent x-ray scattering on GaN nano-rods
equipment:  
Thomas Schmidt / Ian Robinson tschmidt@ifp.uni-bremen.de / i.robinson@ucl.ac.uk Fri Sep 12 17:55:25 CDT 2008
1255 34ID-E Microdiffraction studies of individual helix nanostructures for testing theory of dislocation-driven growth mechanism
equipment:  
Wenjun Liu wjliu@anl.gov Wed Sep 10 17:30:37 CDT 2008
1254 33BM Domain Orientations and Strains in Thin Manganite Films
equipment: displex cryostat (Temp range ~20-300K)
John Budai budaijd@ornl.gov Wed Sep 10 07:51:32 CDT 2008
1253 34ID-C 1d ptychography from faulted GaN nanowires
equipment:  
Ross Harder rharder@aps.anl.gov Tue Sep 09 18:04:20 CDT 2008
1252 33BM Structural studies of LaO3-NiO3 superlattice filsm on LaO and STO substrate.
equipment:  
Jenia Karapetrova jenia@anl.gov Tue Sep 09 17:08:45 CDT 2008
1251 34ID-E Correlations between local microstructure and optical properties request
equipment:  
John Budai budaijd@ornl.gov Tue Sep 09 16:57:49 CDT 2008
1250 34ID-E Strain Domains in Ferroelectric Systems
equipment:  
John Budai budaijd@ornl.gov Tue Sep 09 16:51:40 CDT 2008
1249 33ID PLD
equipment:  
Jon Tischler TischlerJZ@ornl.gov Mon Sep 08 16:31:47 CDT 2008
1248 33BM Final in situ XAFS experiments of catalysts at 33BM :(
equipment: Full EXAFS equipment
Simon R. Bare simon.bare@uop.com Mon Sep 08 08:41:03 CDT 2008
1247 34ID-C Mapping of deformation field of CdS dots in Zeolite microcrystals
equipment:  
Hyunjung Kim hkim@sogang.ac.kr Mon Sep 08 06:35:50 CDT 2008
1246 34ID-C Elctric field induced strain in piezoelectric ZnO
equipment:  
Ian Robinson i.robinson@ucl.ac.uk Fri Sep 05 17:15:27 CDT 2008
1245 34ID-C Multicomponent strain analysis by CXD
equipment:  
Ian Robinson i.robinson@ucl.ac.uk Fri Sep 05 17:11:53 CDT 2008
1244 33BM High speed PerkinElmer area detector test
equipment:  
Wenjun Liu wjliu@anl.gov Thu Aug 07 12:55:19 CDT 2008
1243 33ID interface microscopy development
equipment:  
p zschack zschack@anl.gov Thu Jul 17 10:50:54 CDT 2008
1242 34ID-C CXD from sea urchin spicules
equipment:  
ross harder rharder@aps.anl.gov Wed Jul 02 11:22:15 CDT 2008
1241 34ID-C coherent diffraction from cellulose nanocrystals
equipment:  
ross harder rharder@aps.anl.gov Thu Jun 26 16:29:29 CDT 2008
1240 34ID-C Coherent x-ray diffraction imaging of compact crystalling objects
equipment:  
Ross Harder rharder@aps.anl.gov Wed Jun 18 13:45:42 CDT 2008
1239 34ID-C Hopefully the final test of the web form email confirmation
equipment:  
Kevin Peterson kmpeters@anl.gov Tue Jun 10 16:45:00 CDT 2008
1238 Hopefully the final test of the web form email confirmation
equipment:  
Kevin Peterson kmpeters@anl.gov Tue Jun 10 16:44:38 CDT 2008
1237 33ID Testing the web form email confirmation
equipment:  
Kevin Peterson kmpeters@anl.gov Tue Jun 10 14:48:13 CDT 2008
1236 33BM Beam line start up
equipment:  
Karapetrova Jenia jenia@anl.gov Tue Jun 10 08:13:25 CDT 2008
1235 34ID-C beam stability
equipment:  
ross harder rharder@aps.anl.gov Fri May 09 17:33:17 CDT 2008
1234 34ID-E Microdiffraction studies of individual helix nanostructures for testing theory of dislocation-driven growth mechanism.
equipment:  
Wenjun Liu wjliu@anl.gov Fri May 09 16:30:42 CDT 2008
1233 33BM diffraction measurement from prospective samples
equipment:  
Hawoong Hong h-hong@uiuc.edu Fri May 09 11:56:28 CDT 2008
1232 34ID-C rotational rheology of fatty acids
equipment: K-B mirrors
Mengning Liang mliang2@uiuc.edu Thu May 08 12:58:34 CDT 2008
1231 34ID-C Defects in Thin Film posts
equipment:  
Ross Harder rharder@aps.anl.gov Mon May 05 23:43:30 CDT 2008
1230 34ID-E 3D X-Ray Microbeam investigation of deformation in Cu
equipment:  
Ben Larson larsonbc@ornl.gov Sat May 03 10:57:13 CDT 2008
1229 34ID-E 3D X-Ray Microbeam investigation of deformation in Cu
equipment:  
Ben Larson larsonbc@ornl.gov Sat May 03 10:47:21 CDT 2008
1228 33BM Deformation in Single Crystal Cu
equipment: CCD
Ben Larson larsonbc@ornl.gov Sat May 03 10:29:32 CDT 2008
1227 34ID-E Superlattice Symmetry in a Phase-Separated Manganite System
equipment:  
John Budai budaijd@ornl.gov Fri May 02 16:56:48 CDT 2008
1226 34ID-E Microstructure and light transport in nanowhiskers
equipment:  
John Budai budaijd@ornl.gov Fri May 02 16:54:17 CDT 2008
1225 34ID-C Ptychographical Coherent Diffractive Imaging of extended test objects
equipment: n/a
Oleg Shpyrko oshpyrko@physics.ucsd.edu Fri May 02 15:39:35 CDT 2008
1224 33ID PLD
equipment: usual for PLD, perhaps a small CCD to measure rods?
Jon Tischler TischlerJZ@ornl.gov Fri May 02 15:12:39 CDT 2008
1223 34ID-C Mapping of deformation field of CdS dots in Zeolite microcrystals
equipment: Gas inlet with flow control needed. The three kinds of gases, NO, O2 and C3H6`will be needed.
Hyunjung Kim hkim@sogang.ac.kr Fri May 02 11:20:36 CDT 2008
1222 33ID Graphite thin films on 6H-SiC Surface
equipment: Surface Diffraction Chamber, Six-circle diffractometer
Longxiang Zhang lzhang24@uiuc.edu Thu May 01 16:27:27 CDT 2008
1221 33BM Investigating the Temperature dependent structural transition of a BTO substrate on Fe3O4 film.
equipment: Displex
Evguenia Karapetrova jenia@anl.gov Mon Apr 28 11:46:00 CDT 2008
1220 33BM In situ EXAFS of catalysts
equipment: Standard EXAFS equipment
Simon Bare simon.bare@uop.com Mon Apr 28 07:00:45 CDT 2008
1219 34ID-C Coherent X-ray Diffraction of Zinc Oxide nanowires
equipment: KB mirrors Detectors CCD detector
Steven Leake sjl300@hotmail.com Mon Apr 28 05:26:50 CDT 2008
1218 34ID-C Strains in wired-up ZnO nanocrystals
equipment: KB mirrors
Ian Robinson i.robinson@ucl.ac.uk Sat Apr 26 11:40:45 CDT 2008
1217 33BM high resolution in situ powder diffraction
equipment:  
Bob Broach robert.broach@uop.com Fri Apr 25 13:42:00 CDT 2008
1216 33BM diffraction of SiGe and NiSi on Si
equipment:  
Joseph C. Woicik woicik@bnl.gov Wed Apr 23 14:56:04 CDT 2008
1215 33BM Temperature dependent lattice changes due to in-plane Orbital Ordering of Manganite superlattices.
equipment: High Temperature Displex coordinate with sector 4
Evguenia Karapetrova jenia@anl.gov Wed Apr 09 14:47:34 CDT 2008
1214 33BM thin film diffraction
equipment:  
p zschack zschack@anl.gov Wed Apr 02 09:14:11 CDT 2008
1213 33BM diffraction of metal overlayers on SrTiO3 on Si and SiGe relaxation
equipment:  
joseph woicik woicik@bnl.gov Wed Mar 05 17:30:24 CST 2008
1212 33BM diffraction of metal overlayers on SrTiO3 on Si and SiGe relaxation
equipment:  
joseph woicik woicik@bnl.gov Wed Mar 05 17:29:36 CST 2008
1211 33ID Low thermal conductivity Thin-film diffraction
equipment:  
p zschack zschack@anl.gov Tue Mar 04 15:47:45 CST 2008
1210 33BM oxide interface structure
equipment:  
p zschack zschack@anl.gov Sat Feb 23 09:44:13 CST 2008
1209 34ID-E Evaluation of KB mirrors in high vacuum
equipment:  
Wenjun Liu wjliu@anl.gov Mon Jan 07 12:15:24 CST 2008
1208 34ID-E In-line/at wavelength metrology of x-ray KB-mirrors
equipment:  
Wenjun Liu wjliu@anl.gov Wed Jan 02 17:36:42 CST 2008
1207 34ID-E Microdiffraction studies of ferroelastic and ferroelectric domain boundaries, and individual Si/SiGe helix nanostructures.
equipment:  
Wenjun Liu wjliu@anl.gov Wed Jan 02 17:14:53 CST 2008
1206 34ID-E Beamline alignment and evaluation of new KB mirrors
equipment:  
Wenjun Liu wjliu@anl.gov Wed Jan 02 17:01:25 CST 2008
1205 34ID-E Ex-situ and in-situ investigation of pop-in during nanoindentation of Cu and Cu1%Co single crystals
equipment: The ORNL nanoindentation system may require the use of the present sample PM-500, so if a new sample translation system is installed, the in-situ aspect of the experiment will be coordinated with beamline staff to ensure that the experiment is possilble. The ex-situ aspects of the measurements will be performed in any case.
Bennett Larson larsonbc@ornl.gov Fri Dec 28 23:48:38 CST 2007
1204  
equipment:  
Bennett Larson   Fri Dec 28 23:31:32 CST 2007
1203 34ID-E Deformation in nanoindented Cu and Steel
equipment:  
Bennett Larson larsonbc@ornl.gov Fri Dec 28 23:31:06 CST 2007
1202  
equipment:  
Bennett Larson   Fri Dec 28 23:25:35 CST 2007
1201 34ID-E Cell Wall and Cell Interior Strain in Deformed Cu
equipment:  
Bennett Larson Larsonbc@ornl.gov Fri Dec 28 23:24:51 CST 2007
1200 33ID PLD
equipment:  
Jon Tischler TischlerJZ@ornl.gov Fri Dec 21 16:31:52 CST 2007
1199 33BM In situ XAFS of catalysts
equipment: Standard EXAFS detectors
Simon R Bare simon.bare@uop.com Fri Dec 21 09:42:05 CST 2007
1198 34ID-C coherent dark field imaging
equipment:  
ross rharder@aps.anl.gov Thu Dec 20 15:50:28 CST 2007
1197 33BM Investigation of Al2O3 surfaces with different treatment
equipment: Be dome.
Hawoong Hong h-hong@uiuc.edu Thu Dec 20 14:07:37 CST 2007
1196 34ID-C coherent diffraction
equipment:  
ross rharder@aps.anl.gov Tue Dec 18 00:40:11 CST 2007
1195 34ID-E Interactions Between Phase Domains in a Complex Manganite System
equipment:  
John Budai budaijd@ornl.gov Mon Dec 17 17:44:19 CST 2007
1194 33BM Temperature Dependence of Strain Domains in Thin Manganite Films
equipment: Cryostat for low temperature measurements; Range ~20-300K
John Budai budaijd@ornl.gov Mon Dec 17 17:38:32 CST 2007
1193 33ID TDS study of V3Si
equipment: displex
Ruqing Xu ruqingxu@uiuc.edu Mon Dec 17 17:12:54 CST 2007
1192 33ID Pd nanoparticles on sapphire
equipment:  
Hawoong Hong h-hong@uiuc.edu Mon Dec 17 16:39:16 CST 2007
1191 33BM Interfacial and long range structural response of Ferromagnetic films lattice matched to ferroelectric materials in applied fields.
equipment:  
Karapetrova Evguenia jenia@anl.gov Mon Dec 17 15:51:52 CST 2007
1190 33BM Beam line studies
equipment:  
Karapetrova Evguenia jenia@anl.gov Mon Dec 17 15:18:20 CST 2007
1189 34ID-C Coherent X-ray Diffraction of Zinc Oxide nanowires
equipment: KB mirrors Detectors CCD detector Chemistry Lab: furnace/oven
Steven Leake sjl300@hotmail.com Sun Dec 16 05:45:53 CST 2007
1188 34ID-C Investigation of a silicon-blade monochromator
equipment:  
Ian Robinson i.robinson@ucl.ac.uk Sat Dec 15 16:09:03 CST 2007
1187 34ID-C CXD investigation of strain due to thiol adsorption
equipment:  
Ian Robinson i.robinson@ucl.ac.uk Sat Dec 15 16:03:10 CST 2007
1186 34ID-C CXD investigation of nanowire structure
equipment:  
Ian Robinson i.robinson@ucl.ac.uk Sat Dec 15 15:59:51 CST 2007
1185 33BM High resolution powder diffraction
equipment:  
Bob Broach robert.broach@uop.com Fri Dec 14 14:54:02 CST 2007
1184 33BM anomalous reflectivity from thermoelectric multilayers
equipment:  
p zschack zschack@anl.gov Sat Nov 03 07:32:17 CDT 2007
1183 33BM Beam line start up
equipment:  
Karapetrova Evguenia jenia@anl.gov Mon Oct 01 12:51:59 CDT 2007
1182 33BM Diffuse scattering by precipitated crystals
equipment:  
Rozaliya Barabash barabashr@ornl.gov Thu Sep 06 10:15:11 CDT 2007
1181 34ID-E 3D x-ray microscopy of deformation in nano-indented metals
equipment:  
Ben Larson Larsonbc@ornl.gov Wed Sep 05 12:20:45 CDT 2007
1180 34ID-E 3D x-ray microscopy of deformation microstructures in stainless steel poly crystals
equipment:  
Ben Larson Larsonbc@ornl.gov Wed Sep 05 12:18:47 CDT 2007
1179 34ID-E 3D x-ray microscopy of deformation patterning in highly deformed Cu
equipment:  
Ben Larson Larsonbc@ornl.gov Wed Sep 05 12:16:22 CDT 2007
1178 33ID PLD
equipment:  
Jon Tischler TischlerJZ@ornl.gov Fri Aug 31 20:33:43 CDT 2007
1177 33BM Strain in Cu
equipment: Hawoong's CCD, analyzer
Jon Tischler TischlerJZ@ornl.gov Thu Aug 30 16:20:07 CDT 2007
1176 34ID-E PerkinElmer detector demonstration
equipment:  
Wenjun Liu wjliu@anl.gov Wed Aug 29 14:27:38 CDT 2007
1175 34ID-E Microdiffraction studies of individual Si/SiGe helix nanostructures and ferroelectric domain boundaries.
equipment:  
Wenjun Liu wjliu@anl.gov Wed Aug 29 14:20:45 CDT 2007
1174 34ID-E Beamline alignment and new KB mirror evaluation
equipment:  
Wenjun Liu wjliu@anl.gov Wed Aug 29 14:01:52 CDT 2007
1173 33BM annealing effects on reflectivity of sapphire
equipment:  
Hawoong Hong h-hong@uiuc.edu Wed Aug 29 10:41:52 CDT 2007
1172 34ID-E Microstructural Inhomogeneities in Manganite Systems
equipment:  
John Budai budaijd@ornl.gov Tue Aug 28 18:29:24 CDT 2007
1171 34ID-C Coherent x-ray diffraction from nanowires
equipment:  
Ross Harder rharder@ackme.info Tue Aug 28 13:06:45 CDT 2007
1170 33BM Study of the examine the strain state of Fe3O4 thin films deposited on BaTiO3 substrates
equipment: displex
Karapetrova Evguenia jenia@anl.gov Mon Aug 27 15:21:10 CDT 2007
1169 33BM Observation of Temperature Dependent Phase Separation by X-ray Diffraction Measurements of the Colossal Magneto Resistive Material LPCMO
equipment: displex
Aaron Gray ajgray@uiuc.edu Fri Aug 24 17:02:35 CDT 2007
1168 33BM In situ XAFS studies of catalysts
equipment: Standard XAFS equipment
Simon Bare simon.bare@uop.com Thu Aug 23 12:53:20 CDT 2007
1167 34ID-C Coherent X-ray Diffraction of Zinc Oxide nanowires
equipment: KB mirrors, CCD detectors and diffractometer
Steven Leake sjl300@hotmail.com Thu Aug 23 05:13:14 CDT 2007
1166 34ID-C Catalytic Decomposition and Selective Reduction Mechanism in Zeolites: In situ Coherent X-ray Diffraction Study
equipment: UHV Chamber
Hyunjung Kim hkim@sogang.ac.kr Wed Aug 22 10:36:49 CDT 2007
1165 34ID-C In situ introduction of point defect strain in Zinc Oxide
equipment: KB mirrors. CCD detector UHV chamber
Ian Robinson i.robinson@ucl.ac.uk Wed Aug 22 03:44:24 CDT 2007
1164 34ID-C Gallium Arsenide nanowires
equipment: KB mirrors. CCD detector
Ian Robinson i.robinson@ucl.ac.uk Wed Aug 22 03:40:07 CDT 2007
1163 33BM x-ray diffraction of relaxation in strained sige
equipment: displex should be at hand.
joseph woicik woicik@bnl.gov Tue Aug 21 17:10:45 CDT 2007
1162 34ID-E Strain gradient analysis in ODS alloys and GaN films.
equipment: None
Barabash Rozaliya barabashr@ornl.gov Mon Aug 20 15:41:33 CDT 2007
1161 33BM Thermoelectric thin-film diffraction
equipment:  
zschack zschack@anl.gov Mon Aug 20 08:52:17 CDT 2007
1160 33ID Thin Film Diffraction
equipment:  
zschack zschack@anl.gov Sat Aug 11 11:07:36 CDT 2007
1159 34ID-E Investigation of yum.uni.aps.anl.gov crashes experienced during energy scans at 34-ID-E
equipment: The crashes have been observed only during John Budai's beam time. This work should be scheduled when he is available to conduct his research.
Pete Jemian jemian@anl.gov Mon Jul 30 11:34:16 CDT 2007
1158 33BM high resolution in situ powder diffraction
equipment:  
Bob Broach robert.broach@uop.com Mon Jul 16 10:34:01 CDT 2007
1157 33BM Structural Effects of the Core/Shell Motif on Bimetallic Pt/Pd Nanoclusters
equipment: Water aspirator
Sergio Sanchez ssanche3@uiuc.edu Thu Jul 05 14:15:06 CDT 2007
1156 34ID-E Microdiffraction on Al2O3 particle dispersed 1100 Al
equipment:  
Judy Pang pangj@ornl.gov Thu Jul 05 10:12:58 CDT 2007
1155 33ID beam line setup
equipment:  
p zschack zschack Wed May 30 08:12:38 CDT 2007
1154 33BM Beam line start up
equipment:  
Karapetrova Jenia jenia@anl.gov Tue May 29 10:14:26 CDT 2007
1153 33ID Melting of a Pb monolayer on a Si substrate
equipment:  
Aaron Gray ajgray@uiuc.edu Fri May 04 15:57:01 CDT 2007
1152 34ID-C X-ray microsocpy on SrTiO3 wafers
equipment: x-ray microscope.
Hawoong Hong h-hong@uiuc.edu Wed May 02 10:20:47 CDT 2007
1151 34ID-E 3D x-ray microscopy investigation of deformation patterning in lighly deformed Cu
equipment:  
Ben Larson Larsonbc@ornl.gov Wed May 02 09:48:14 CDT 2007
1150 34ID-E 3D x-ray microscopy investigation of deformation microstructure in stainless steel polycrystals
equipment:  
Ben Larson Larsonbc@ornl.gov Wed May 02 09:37:08 CDT 2007
1149 34ID-E 3D x-ray microscopy investigation of deformation in nanoindented metals
equipment:  
Ben Larson Larsonbc@ornl.gov Wed May 02 09:31:46 CDT 2007
1148 33ID Oxidation
equipment:  
p zschack zschack@anl.gov Tue May 01 11:07:06 CDT 2007
1147 33ID PLD
equipment: will need the MAR if we cannot go fast
Jon Tischler TischlerJZ@ornl.gov Tue May 01 11:02:24 CDT 2007
1146 33BM line profile in deformed Cu
equipment: huber + analyzer + Hawoong's ccd
Jon Tischler TischlerJZ@ornl.gov Tue May 01 11:00:28 CDT 2007
1145 34ID-E Temperature-dependent strain fields in epitaxial manganite films
equipment: Eliot Specht's small cryogenic stage for 34ID-E
John Budai budaijd@ornl.gov Tue May 01 09:05:48 CDT 2007
1144 34ID-E Phase Domains in Multiferroic Manganites
equipment:  
John Budai budaijd@ornl.gov Tue May 01 08:58:17 CDT 2007
1143 33ID Study of TDS behavior at low temperature
equipment: displex
Ruqing Xu ruqingxu@uiuc.edu Mon Apr 30 16:33:27 CDT 2007
1142 33BM Identifying Orbital Ordering in Digital Superlattice LaxSr1-xMnO3 Films.
equipment: displex
Karapetrova Evguenia jenia@anl.gov Mon Apr 30 16:31:32 CDT 2007
1141 34ID-E Microdiffraction studies of individual Si/SiGe helix nanostructures and YBCO films
equipment:  
Wenjun Liu wjliu@anl.gov Mon Apr 30 13:30:33 CDT 2007
1140 34ID-E Beamline alignment and new KB mirror evaluation
equipment:  
Wenjun Liu wjliu@anl.gov Mon Apr 30 13:01:09 CDT 2007
1139 34ID-C CXD from Nano Wires
equipment:  
Ross Harder rharder@ackme.info Mon Apr 30 11:48:35 CDT 2007
1138 33BM x-ray topography
equipment:  
David Black david.black@nist.gov Mon Apr 30 09:12:43 CDT 2007
1137 34ID-C Coherent X-ray Diffraction of Zinc Oxide nanowires
equipment: KB mirrors, CCD detectors and diffractometer
Steven Leake sjl300@hotmail.com Mon Apr 30 05:10:12 CDT 2007
1136 33BM In situ XAFS studies of catalysts
equipment: Standard XAFS equipment
Simon R. Bare simon.bare@uop.com Sun Apr 29 18:08:26 CDT 2007
1135 33BM In situ XAFS studies of catalysts
equipment: Standard XAFS equipment
Simon R. Bare simon.bare@uop.com Sun Apr 29 18:06:53 CDT 2007
1134 34ID-C X-ray ptychography of InAs Quantun Dot samples
equipment:  
Ian Robinson i.robinson@ucl.ac.uk Sun Apr 29 11:38:59 CDT 2007
1133 34ID-C Measurement of Dislocation structures by CXD
equipment:  
Ian Robinson i.robinson@ucl.ac.uk Sun Apr 29 11:36:52 CDT 2007
1132 34ID-C Hard X-ray microscopy
equipment: CCD camera
Christoph Rau rau@anl.gov Fri Apr 27 21:31:32 CDT 2007
1131 33BM Diffuse scattering on precipitated alloys
equipment:  
Rozaliya Barabash barabashr@ornl.gov Fri Apr 27 15:17:34 CDT 2007
1130 34ID-E Analysis of spatially resolved defects distribution in epitaxially grown GaN films
equipment:  
Rozaliya Barabash barabashr@ornl.gov Fri Apr 27 15:07:44 CDT 2007
1129 33BM High resolution and in situ powder diffraction
equipment:  
Bob Broach robert.broach@uop.com Fri Apr 27 07:42:11 CDT 2007
1128 33BM reflectivity of furnace cleaned sapphire (001)
equipment: Be dome.
Hawoong Hong h-hong@uiuc.edu Thu Apr 26 09:48:52 CDT 2007
1127 33BM diffraction of epitaxial sto layers on si
equipment: possibly displex
joseph woicik woicik@bnl.gov Wed Apr 25 12:16:26 CDT 2007
1126 34ID-C Mapping of deformation field of CdS dots in Zeolite microcrystals
equipment:  
Hyunjung Kim hkim@sogang.ac.kr Wed Apr 25 11:20:14 CDT 2007
1125 33ID CTR measurements of interface structures
equipment: pilatus
p zschack zschack@anl.gov Tue Apr 03 16:58:17 CDT 2007
1124 34ID-E Characterization of Elastic - plastic deformation of nickel alloy 600 using electron, x-ray and neutron diffractiopn methods
equipment:  
Marina Fuller mfuller@uwo.ca Thu Mar 15 13:38:20 CDT 2007
1123  
equipment:  
Marina Fuller mfuller@uwo.ca Thu Mar 15 13:36:19 CDT 2007
1122 33BM EXAFS studies of supported metallic nanoparticles
equipment:  
Joo Kang kang@mrl.uiuc.edu Tue Mar 13 15:15:47 CDT 2007
1121 33ID Thin-film diffraction from thermoelectric supperlattice materials
equipment:  
p Zschack zschack@anl.gov Tue Feb 27 14:38:10 CST 2007
1120 34ID-E thin-film diffraction
equipment:  
p zschack zschack@anl.gov Tue Feb 06 17:00:12 CST 2007
1119 34ID-C Coherent X-ray Diffraction Studies of Zeolite microcrystals
equipment:  
Hyunjung Kim hkim@sogang.ac.kr Tue Jan 02 10:41:46 CST 2007
1118 33BM X-ray topography characterisation of Si crystals for angular dispersive IXS spectrometer
equipment: Topography set-up, CCD camera for rough imaging, x-ray films for high-resolution imaging.
Yuri Shvyd'ko, APS, XSD shvydko@aps.anl.gov Thu Dec 21 14:11:43 CST 2006
1117 34ID-C Coherent X-ray Diffraction of Zinc Oxide nanowires
equipment: KB mirrors Detectors CCD Chemistry Lab: furnace/oven
Steven Leake sjl300@hotmail.com Wed Dec 20 07:51:28 CST 2006
1116 34ID-E Deformation measurements with software development and evaluation
equipment:  
Ben Larson bcl@ornl.gov Wed Dec 20 02:47:58 CST 2006
1115 34ID-E In situ nanoindentation of Si, Cu, and sapphire
equipment: ORNL nanoindentation system will be used
Ben Larson bcl@ornl.gov Wed Dec 20 02:37:57 CST 2006
1114 34ID-E Fe and Ni polycrystal indent deformation
equipment:  
Ben Larson bcl@ornl.gov Wed Dec 20 02:28:22 CST 2006
1113  
equipment:  
Ben Larson b Wed Dec 20 02:21:52 CST 2006
1112  
equipment:  
Ben Larson   Wed Dec 20 02:21:40 CST 2006
1111 34ID-E Deformation physics using nanoindents in Cu
equipment:  
Ben Larson bcl@ornl.gov Wed Dec 20 02:20:19 CST 2006
1110  
equipment:  
Ben Larson   Wed Dec 20 02:15:16 CST 2006
1109 34ID-E Dislocation Cell Wall Strain in Deformed Cu
equipment:  
Ben Larson bcl@ornl.gov Wed Dec 20 02:12:03 CST 2006
1108 34ID-E Microdiffraction studies of individual ZnO nanostructures
equipment:  
John Budai budaijd@ornl.gov Tue Dec 19 17:42:43 CST 2006
1107 33BM line profile in deformed Cu
equipment: analyzers
Jon Tischler TischlerJZ@ornl.gov Mon Dec 18 22:03:25 CST 2006
1106 33ID Inelatic X-ray scattering
equipment: ktek detector, and beam path
Jon Tischler TischlerJZ@ornl.gov Mon Dec 18 22:01:31 CST 2006
1105 33ID PLD
equipment: usual for PLD
Jon Tischler TischlerJZ@ornl.gov Mon Dec 18 21:57:48 CST 2006
1104 34ID-E Imaging the complex wave fields at the focus of x-ray K-B mirrors
equipment:  
Wenjun Liu wjliu@anl.gov Mon Dec 18 19:53:14 CST 2006
1103 34ID-E Beamline realignment and new KB mirror evaluation
equipment:  
Wenjun Liu wjliu@anl.gov Mon Dec 18 19:28:19 CST 2006
1102 34ID-E Studies of Cr poisoning and void formation in solid oxide fuel cells using x-ray microprobe
equipment: N/A.
Jules Routbort routbort@anl.gov Mon Dec 18 10:01:31 CST 2006
1101 34ID-C Coherent Diffraction from nanowires
equipment:  
Ross Harder rharder@ackme.info Sun Dec 17 16:33:30 CST 2006
1100 33BM x-ray diffraction of epitaxial films
equipment:  
Joseph Woicik woicik@bnl.gov Sat Dec 16 09:19:53 CST 2006
1099 33BM High resolution and in situ powder diffraction
equipment:  
Bob Broach robert.broach@uop.com Fri Dec 15 12:05:30 CST 2006
1098 34ID-E Micro Laue diffraction of uniaxially tested nickel alloy 600 samples
equipment: 0
Dr. Marina Suominen Fuller mfuller@uwo.ca Fri Dec 15 08:52:16 CST 2006
1097 34ID-C Coherent diffraction experiment on inclusions in diamond
equipment:  
Qun Shen qshen@aps.anl.gov Thu Dec 14 17:27:54 CST 2006
1096 34ID-C Coherent diffraction experiment on inclusions in diamond
equipment:  
Qun Shen qshen@aps.anl.gov Thu Dec 14 17:26:52 CST 2006
1095 34ID-E Coded aperture microscopy
equipment:  
Gene Ice IceGE@ornl.gov Thu Dec 14 10:37:40 CST 2006
1094 34ID-E Self-Organized Domains in Multiferroic Manganites
equipment:  
John Budai budaijd@ornl.gov Thu Dec 14 10:25:00 CST 2006
1093 34ID-C X-ray ptychography of domain wall structures
equipment: KB mirrors
Ian Robinson i.robinson@ucl.ac.uk Thu Dec 14 05:01:05 CST 2006
1092 34ID-C Exploration of strained Si membrane Cantilevers
equipment: KB mirrors
Ian Robinson i.robinson@ucl.ac.uk Thu Dec 14 04:53:29 CST 2006
1091 34ID-C Grain mapping of "amorpous" Silicon
equipment: KB mirrirs
Ian Robinson i.robinson@ucl.ac.uk Thu Dec 14 04:48:08 CST 2006
1090 33ID TDS temperature dependence of Copper
equipment: displex, vacuum pump, scintillator detector,
Ruqing Xu ruqingxu@uiuc.edu Wed Dec 13 21:10:48 CST 2006
1089 33ID Reflection Surface X-ray Diffraction Study of Indium Thin Film on Si(111)
equipment:  
Jaseung Ku jku2@uiuc.edu Wed Dec 13 17:05:43 CST 2006
1088 33ID TDS imaging
equipment:  
Hawoong Hong h-hong@uiuc.edu Wed Dec 13 16:41:52 CST 2006
1087 33ID Pd nano-islands on sapphire
equipment: Surface diffractometer
Hawoong Hong h-hong@uiuc.edu Wed Dec 13 16:39:49 CST 2006
1086 34ID-C hard X-ray microscopy
equipment: CCD
Christoph Rau rau@anl.gov Wed Dec 13 16:37:39 CST 2006
1085 33ID Pb films on vicinal Si surfaces near the melting temperature
equipment: CCD camera
Aaron Gray ajgray@uiuc.edu Wed Dec 13 15:47:52 CST 2006
1084 34ID-C Development of hard x-ray vortex optics
equipment: Standard equipment available at 34-ID-C.
Ian McNulty mcnulty@aps.anl.gov Wed Dec 13 14:11:34 CST 2006
1083 33BM Interfacial Structure of Ordered Oxide Bi-Layers.
equipment: displex
Karapetrova Evguenia jenia@anl.gov Wed Dec 13 13:56:00 CST 2006
1082 34ID-C GISAXS studies of metal nano-crystal formation by dewetting process
equipment: UHV chamber and diffractometer
roberto felici felici@esrf.fr Wed Dec 13 10:54:57 CST 2006
1081 34ID-E Self-organized patterning in Cu
equipment:  
Judy Pang pangj@ornl.gov Wed Dec 13 10:35:34 CST 2006
1080 33BM x-ray topography
equipment:  
David Black david.black@nist.gov Wed Dec 13 09:14:19 CST 2006
1079 33BM thermoelectric thin film scattering
equipment:  
zschack zschack@anl.gov Wed Dec 13 05:27:39 CST 2006
1078 34ID-E Xray imaging of antiferromagnetic domains in Cr films
equipment: cryostat
Yeong-Ah Soh yeong-ah.soh@dartmouth.edu Tue Dec 12 21:27:05 CST 2006
1077 34ID-C Lensless 3D Imaging of Nanoscale Dynamics of Antiferromagnetic Domain Walls in Chromium
equipment:  
Oleg Shpyrko oshpyrko@anl.gov Tue Dec 12 15:26:06 CST 2006
1076 34ID-E Diffuse scattering from irradiated materials
equipment: Second CCD for transmission measurements
Eliot Specht spechted@ornl.gov Tue Dec 12 14:31:33 CST 2006
1075 33ID Superlattice in the superconducting cuprate
equipment: Displex, energy sensitive detector
Takeshi Egami egami@utk.edu Tue Dec 12 09:22:10 CST 2006
1074 34ID-E Microdiffraction measurements of hydride particles in Pd to quantify lnear-surface ocal strain
equipment: Turbo pump station
Brent J. Heuser bheuser@uic.edu Mon Dec 11 12:44:27 CST 2006
1073 33BM In situ EXAFS studies of catalysts
equipment: Standard EXAFS equipment
Simon Bare simon.bare@uop.com Mon Dec 11 12:32:25 CST 2006
1072 33BM In situ EXAFS of catalysts
equipment: Standard XAFS equipment
Simon Bare simon.bare@uop.com Mon Dec 11 12:32:13 CST 2006
1071 34ID-C Coherent x-ray diffraction of embedded hydride particles in Pd
equipment: Turbo pump station
Brent J. Heuser bheuser@uic.edu Mon Dec 11 12:13:46 CST 2006
1070 34ID-C rotational brownian motion of nanocrystals using coherent x-ray diffraction
equipment: Kirkpatrick-Baez mirrors
Mengning Liang mliang2@uiuc.edu Mon Dec 11 11:21:05 CST 2006
1069 34ID-C Huang scattering and GISAXS from Iron
equipment:  
Ross Harder rharder@ackme.info Wed Dec 06 09:59:44 CST 2006
1068 34ID-C CXD measurements of embedded hydride particles in Pd
equipment: Tubo pump station
Brent Heuser bheuser@uiuc.edu Tue Dec 05 11:03:17 CST 2006
1067 33BM EXAFS of supported bi- and mono-metallic nanoparticles
equipment:  
Joo Kang kang@mrl.uiuc.edu Mon Nov 20 18:08:49 CST 2006
1066 PLD
equipment:  
p zschack zschack@anl.gov Wed Nov 08 08:36:27 CST 2006
1065 vibration analysis of DCM
equipment:  
p zschack zschack@anl.gov Wed Nov 08 08:34:26 CST 2006
1064 33BM Local structure of ceramic glasses
equipment:  
Gene Ice IceGE@ornl.gov Wed Oct 25 07:57:23 CDT 2006
1063 34ID-C Huang and GISAXS on FE and Cu-Mo alloys
equipment:  
Ross Harder rharder@ackme.info Tue Oct 10 13:37:05 CDT 2006
1062 33ID vibration studies
equipment:  
p zschack zschack@anl.gov Mon Oct 09 12:52:48 CDT 2006
1061 34ID-E beamline alignment and testing
equipment:  
Wenjun Liu wjliu@anl.gov Mon Oct 02 14:42:00 CDT 2006
1060 33BM In situ XAFS of catalysts
equipment: Standard EXAFS equipment
Simon Bare simon.bare@uop.com Tue Aug 29 11:17:51 CDT 2006
1059 33BM In situ XAFS of catalysts
equipment: Standard EXAFS equipment
Simon Bare simon.bare@uop.com Tue Aug 29 11:16:46 CDT 2006
1058 33BM High resolution and in situ powder diffraction studies of catalysts and adsorbents
equipment:  
Bob Broach robert.broach@uop.com Mon Aug 28 16:53:33 CDT 2006
1057 33BM High resolution and in situ powder diffraction on catalysts and adsorbents
equipment:  
Bob Broach robert.broach@uop.com Mon Aug 28 16:51:44 CDT 2006
1056 33BM x-ray topography
equipment:  
David Black david.black@nist.gov Mon Aug 28 15:07:46 CDT 2006
1055 34ID-E In situ indentation of Si and Cu
equipment:  
Ben Larson bcl@ornl.gov Mon Aug 28 14:28:25 CDT 2006
1054 34ID-E Plastic deformation and elastic strain in deformed Si
equipment:  
Ben Larson bcl@ornl.gov Mon Aug 28 14:22:42 CDT 2006
1053 34ID-E Plastic and elastic strain in deformed Cu
equipment:  
Ben Larson bcl@ornl.gov Mon Aug 28 14:15:45 CDT 2006
1052 34ID-E Nanobeam
equipment:  
Gene Ice IceGE@ornl.gov Sun Aug 27 07:05:16 CDT 2006
1051 34ID-E Patterned apertures will be tested to accelerate 3D differential aperture microscopy
equipment:  
Gene Ice IceGE@ornl.gov Sun Aug 27 07:02:01 CDT 2006
1050 34ID-E 3D wire and monowire measurements near the crack tip after fatigue and/or overload
equipment:  
Rozaliya Barabash BarabashR@ornl.gov Sun Aug 27 06:53:57 CDT 2006
1049 34ID-E Local behavior of intercrystalline region in a bicrystal
equipment:  
Rozaliya Barabash BarabashR@ornl.gov Sun Aug 27 06:52:16 CDT 2006
1048 34ID-E Wire scan studies of supported GaN films
equipment:  
Rozaliya Barabash BarabashR@ornl.gov Sun Aug 27 06:49:36 CDT 2006
1047 34ID-E Diffuse scattering using microbeams and micronsized precipitates
equipment:  
Rozaliya Barabash BarabashR@ornl.gov Sun Aug 27 06:47:47 CDT 2006
1046 33ID Diffuse scattering of strain fields in alloys with nanosized precipitates
equipment:  
Rozaliya Barabash BarabashR@ornl.gov Sun Aug 27 06:44:28 CDT 2006
1045 34ID-E Laue diffraction of crystal precipitates in amorphous braze
equipment:  
Gene Ice IceGE@ornl.gov Sun Aug 27 06:38:28 CDT 2006
1044 33BM Powder diffraction of local strain induced by wear
equipment: Powder diffraction with a small beam.
Gene Ice IceGE@ornl.gov Sun Aug 27 06:32:11 CDT 2006
1043 33ID TDS temperature dependence study
equipment: displex, temprature controller, vacuum pump
Ruqing Xu ruqingxu@uiuc.edu Fri Aug 25 18:07:48 CDT 2006
1042 33BM TDS temperature dependence study
equipment: displex, vaccuum pump, temprature controller
Ruqing Xu ruqingxu@uiuc.edu Fri Aug 25 17:51:28 CDT 2006
1041 33BM Atomic pair distribution function study of transition-metal-ion doped 3:2 mullite structure
equipment: Vortex Detector for Pair Distribution Function study
Prof. Waltraud M. Kriven kriven@uiuc.edu Fri Aug 25 16:56:56 CDT 2006
1040 33BM Strain in Cu
equipment: analyzer on 2-theta, we would really like a CCD on 2-theta for the Cu, and analyzer for reflectivity
Jon Tischler TischlerJZ@ornl.gov Fri Aug 25 15:00:37 CDT 2006
1039 33ID PLD
equipment: All the laser stuff, and a CCD (the Mar we used last time was nice)
Jon Tischler TischlerJZ@ornl.gov Fri Aug 25 14:57:12 CDT 2006
1038 33ID Inelastic X-ray scattering
equipment: Inelastic arm , ketk
Jon Tischler TischlerJZ@ornl.gov Fri Aug 25 14:55:11 CDT 2006
1037 33ID Metal islands on oxides
equipment:  
Hawoong Hong h-hong@uiuc.edu Fri Aug 25 13:42:25 CDT 2006
1036 34ID-C Hard X-ray microsscopy
equipment: setup imaging and tomography Kodak CCD camera
Christoph Rau rau@anl.gov Fri Aug 25 09:56:04 CDT 2006
1035 33ID Pb films on Si substrates near the melting temperature
equipment:  
Aaron Gray ajgray@uiuc.edu Thu Aug 24 21:01:07 CDT 2006
1034 34ID-C Coherent diffraction imaging with crystal guard apertures
equipment:  
Qun Shen qshen@aps.anl.gov Thu Aug 24 15:02:34 CDT 2006
1033 33BM topography on Be single crystal
equipment:  
Wenjun Liu wjliu@anl.gov Thu Aug 24 14:21:59 CDT 2006
1032 34ID-C Metal diffusion studies in Bismuth films
equipment:  
Jack Sadleir sadleir@milkyway.gsfc.nasa.gov Thu Aug 24 11:48:44 CDT 2006
1031 34ID-E micro-Huang scattering
equipment: Second CCD detector for lower-angle scattering; can the old CCD detector be used for this?
Eliot Specht spechted@ornl.gov Thu Aug 24 09:20:50 CDT 2006
1030 33ID dcm vibrations
equipment:  
p zschack   Thu Aug 24 08:21:21 CDT 2006
1029 dcm vibrations
equipment:  
p zschack   Thu Aug 24 08:20:49 CDT 2006
1028 dcm vibrations
equipment:  
p zschack   Thu Aug 24 08:20:43 CDT 2006
1027 34ID-C Coherent X-ray Diffraction measurements from Nanowires
equipment:  
Ross Harder rharder@ackme.info Wed Aug 23 16:19:00 CDT 2006
1026 33ID Ge TDS experiment
equipment: Mar345 detector
Jaseung Ku jku2@uiuc.edu Wed Aug 23 13:51:46 CDT 2006
1025  
equipment:  
Jaseung Ku jku2@uiuc.edu Wed Aug 23 13:28:32 CDT 2006
1024 34ID-C X-ray Full-Field Diffraction MIcroscopy Investigation on SiC micropipes
equipment: Kappa diffractometer, KB mirrors
Yong Chu ychu@aps.anl.gov Wed Aug 23 10:56:34 CDT 2006
1023 34ID-C CXD study of magnetic domains in Chromium
equipment:  
Ian Robinson i.robinson@ucl.ac.uk Tue Aug 22 09:01:15 CDT 2006
1022 34ID-C Ion Irradiation of nanocrystals
equipment:  
Ian Robinson i.robinson@ucl.ac.uk Tue Aug 22 08:50:03 CDT 2006
1021 34ID-C Structure of nanowires
equipment:  
Ian Robinson i.robinson@ucl.ac.uk Tue Aug 22 08:43:55 CDT 2006
1020 34ID-E Crack tip propagation in Al
equipment:  
Judy Pang pangj@ornl.gov Mon Aug 21 15:02:51 CDT 2006
1019 34ID-E Diffraction studies of individual oxide nanostructures
equipment:  
John Budai budaijd@ornl.gov Fri Aug 18 17:25:33 CDT 2006
1018 34ID-E Spatially-resolved studies of phase separation in transition metal oxides
equipment:  
John Budai budaijd@ornl.gov Fri Aug 18 17:21:23 CDT 2006
1017 33BM more diffraction of heteroepitaxial layers of SrTiO3 on Si
equipment: possibly the displex for the 4 circle
Joseph Woicik woicik@bnl.gov Fri Aug 18 10:33:24 CDT 2006
1016 33ID Crystal truncation rod characterization of thin-film STO on silicon
equipment: Beryllium dome, CCD detector.
Fred Walker walkerfj@ornl.gov Tue Aug 15 14:48:36 CDT 2006
1015 33BM Study of the Structural Relaxation Process of Epitaxially grown Fe on GaAs(001).
equipment:  
Karapetrova Evguenia jenia@anl.gov Thu Aug 03 17:05:43 CDT 2006
1014 33BM EXAFS of supported Au catalysts with Self-Assembled Monolayer surface probes
equipment: Ion chambers, fluorescence detector, liquid nitrogen.
Laurent Menard lmenard@uiuc.edu Mon Jul 31 10:45:45 CDT 2006
1013 34ID-E Micro diffraction of tensile tested nickel alloy 600
equipment: none
Marina Fuller mfuller@uwo.ca Sat Jul 29 11:30:27 CDT 2006
1012 33BM thin flm scattering (including beam line set up)
equipment:  
p zschack zschack@anl.gov Wed Jul 26 10:14:38 CDT 2006
1011 33ID Diffuse scattering from cuprate superconductor
equipment: displex
Takeshi Egami egami@utk.edu Tue Jul 25 01:29:07 CDT 2006
1010 33BM EXAFS studies of supported bimetallic catalysts
equipment:  
Joo Kang kang@mrl.uiuc.edu Tue Jul 18 11:47:04 CDT 2006
1009 33ID DCM vibration and Newport studies
equipment:  
p zschack zschack@anl.gov Wed Jul 12 08:12:57 CDT 2006
1008 34ID-E Spatially resolved analysis of strain and plastic defromation in GaN films and Ti welds
equipment:  
Rozaliya Barabash barabashr@ornl.gov Fri Jun 30 16:50:34 CDT 2006
1007 34ID-E microdiffraction
equipment:  
Ben Larson larsonbc@ornl.gov Wed Jun 28 16:16:57 CDT 2006
1006 34ID-E Beamline alignment and study
equipment:  
Wenjun Liu wjliu@anl.gov Wed Jun 21 12:13:12 CDT 2006
1005 33BM In-plane diffraction study of thin film superlattices including VSe2, TaSe2, W, WSe2, BiSe, Bi2Te3, TiTe2, NbSe2, Sb2Te3
equipment:  
Paul Zschack zschack@anl.gov Wed Jun 14 11:13:01 CDT 2006
1004 34ID-E Microdiffraction on pre-cracked Ni bicrystal
equipment:  
Judy Pang pangj@ornl.gov Thu Jun 08 09:40:30 CDT 2006
1003 33ID USAXS setup
equipment:  
Jan Ilavsky ilavsky@aps.anl.gov Tue May 30 11:37:17 CDT 2006
1002 33BM EXAFS of oxide supported metal nanoparticles and solution spectroelectrochemistry of Au clusters
equipment:  
Laurent Menard lmenard@uiuc.edu Wed May 24 16:34:32 CDT 2006
1001 33BM Beam line start up.
equipment:  
Karapetrova Jenia jenia@anl.gov Wed May 24 16:31:56 CDT 2006
1000 34ID-E Strain distribution induced by nanoindentation of Cu1%Co single crystal
equipment:  
Ben Larson bcl@ornl.gov Mon May 08 01:33:49 CDT 2006
999 34ID-E Strain distribution associated with In situ nanoindentation of Si
equipment:  
Ben Larson bcl@ornl.gov Mon May 08 01:25:26 CDT 2006
998 34ID-E Tensile/Compression deformation in Cu and bent/annealed Si and measurement software evaluation/development
equipment:  
Ben Larson bcl@ornl.gov Mon May 08 01:20:50 CDT 2006
997 34ID-E Nanoindent deformation in Cu and measurement software evaluation/development
equipment:  
Ben Larson bcl@ornl.gov Mon May 08 01:09:11 CDT 2006
996 34ID-E Diffraction studies of individual oxide nanostructures
equipment:  
John Budai budaijd@ornl.gov Thu May 04 15:46:11 CDT 2006
995 34ID-E Spatially-resolved studies of phase separation in transition metal oxides
equipment:  
John Budai budaijd@ornl.gov Thu May 04 15:06:26 CDT 2006
994 33BM x-ray topography
equipment:  
David Black david.black@nist.gov Tue May 02 15:10:26 CDT 2006
993 33BM High Temperature X-ray Diffraction Investigations of Kinetics of Crystallization and Crystal Size growth in Oxide Ceramic Materials
equipment: None
Prof. Waltraud M. Kriven kriven@uiuc.edu Mon May 01 15:59:41 CDT 2006
992 33ID Pb films on Si substrates near the melting temperature
equipment:  
Aaron Gray ajgray@uiuc.edu Mon May 01 11:22:30 CDT 2006
991 33ID Pb films on Si substrates near the melting temperature
equipment:  
Aaron Gray ajgray@uiuc.edu Mon May 01 11:21:47 CDT 2006
990 33ID Inelastic x-ray scattering
equipment: k-tek detector
Ben Larson bcl@ornl.gov Mon May 01 10:45:28 CDT 2006
989 33ID MgB2 TDS
equipment:  
Hawoong Hong h-hong@uiuc.edu Mon May 01 09:20:35 CDT 2006
988 33ID X-ray studies of the growth of Ag films on Ge(111) and Ge(110)
equipment: n/a
Yen-Ru Lee junolee@uiuc.edu Mon May 01 01:19:04 CDT 2006
987 33ID Analysis of relationship between various types of voids and performance of anisotropic Electron Beam-Physical Vapor Deposited Thermal Barrier Coatings
equipment: -
Arturo Flores Renteria arturo.flores@dlr.de Mon May 01 01:07:54 CDT 2006
986 33ID X-ray diffraction study of the growth of Ag on Ge (100)
equipment:  
Jaseung Ku jku2@uiuc.edu Sun Apr 30 19:49:20 CDT 2006
985 33ID STO Pulsed Laser Deposition
equipment: CCD. May need to look at background fluctuation during May.
Jon Tischler zzt@ornl.gov Sat Apr 29 16:52:13 CDT 2006
984  
equipment:  
Ben Larson   Sat Apr 29 16:44:39 CDT 2006
983 33BM Cu TDS
equipment: displex, vacuum pumps
Ruqing Xu ruqingxu@uiuc.edu Sat Apr 29 02:33:08 CDT 2006
982 34ID-C Hard X-ray microscopy
equipment: CCD Camera KB system
C. Rau rau@anl.gov Fri Apr 28 17:57:35 CDT 2006
981 33ID Inelastic X-ray scattering
equipment: Ktek detector, Ge(111) backscattering analyzer, backscattering beam path, something to hold channel cut crystal for high energy resolution.
Jon Tischler TischlerJZ@ornl.gov Fri Apr 28 12:32:37 CDT 2006
980 33ID Structure of Anisotropic Nanoparticles
equipment:  
Eric Mock ericmock@uiuc.edu Tue Apr 25 17:46:28 CDT 2006
979 33ID USAXS Studies of gradient materials for SOFC's, H separation membranes and nanowire templates
equipment: Regular USAXS at 17 keV
Andrew Allen andrew.allen@nist.gov Tue Apr 25 16:13:17 CDT 2006
978 USAXS Studies of gradient materials for SOFC's, H separation membranes and nanowire templates
equipment: Regular USAXS at 17 keV
Andrew Allen andrew.allen@nist.gov Tue Apr 25 16:12:47 CDT 2006
977 USAXS Studies of gradient materials for SOFC's, H separation membranes and nanowire templates
equipment: Regular USAXS at 17 keV
Andrew Allen andrew.allen@nist.gov Tue Apr 25 16:12:13 CDT 2006
976 USAXS Studies of gradient materials for SOFC's, H separation membranes and nanowire templates
equipment: Regular USAXS at 17 keV
Andrew Allen andrew.allen@nist.gov Tue Apr 25 16:11:49 CDT 2006
975 33BM Determination of the Pair Correlation in the Zr-based Amorphous Alloys.
equipment: No
Yang,Ning nyang@aps.anl.gov Tue Apr 25 15:30:45 CDT 2006
974 33ID USAXS Flow Cell Studies of Standerd Carbon Nanotube Reference Material, Carbon Nanotube Alignment and Real-Time Nanoparticle Precipitation
equipment: Regular USAXS configuration at 10-12 keV. Interface controls with NIST USAXS flow cell.
Andrew Allen andrew.aleen@nist.gov Tue Apr 25 14:48:59 CDT 2006
973 33ID PLD
equipment: CCD for diffuse scattering
Jon Tischler tischlerJZ@ornl.gov Tue Apr 25 14:33:18 CDT 2006
972 34ID-C X-ray Diffraction Microscopy Investigation on Surface Structure of RuO2.
equipment:  
Yong Chu ychu@aps.anl.gov Tue Apr 25 12:14:34 CDT 2006
971 34ID-C Coherence Studies of X-ray optics for coherent x-ray diffraction
equipment: Kirkpatrick-Baez mirrors
Mengning Liang mliang2@uiuc.edu Tue Apr 25 11:21:33 CDT 2006
970 34ID-C CXD measurements of hydride formation in polycrystalline Pd
equipment: Turbo pump station
Brent Heuser bheuser@uiuc.edu Tue Apr 25 09:03:20 CDT 2006
969 34ID-C Nanowire coherent diffraction
equipment: KB mirrors required
Ian Robinson i.robinson@ucl.ac.uk Mon Apr 24 22:11:21 CDT 2006
968 34ID-C Metal diffusion studies in Bismuth films
equipment:  
Jack Sadleir sadleir@milkyway.gsfc.nasa.gov Mon Apr 24 22:08:51 CDT 2006
967 34ID-C Metal diffusion studies in Bismuth films
equipment:  
Jack Sadleir sadleir@milkyway.gsfc.nasa.gov Mon Apr 24 22:08:15 CDT 2006
966 34ID-C Characterisation of Nanocrystals dewetted from thin films
equipment: Oven in chem lab KB mirrors required
Ian Robinson i.robinson@ucl.ac.uk Mon Apr 24 22:05:48 CDT 2006
965 34ID-C Phase constrast imaging tests using gratings
equipment:  
Ian Robinson i.robinson@ucl.ac.uk Mon Apr 24 21:58:16 CDT 2006
964 33ID Pb films on Si substrates near the melting temperature
equipment:  
Aaron Gray ajgray@uiuc.edu Mon Apr 24 12:35:28 CDT 2006
963 33BM high resolution and in situ powder diffraction of zeolites and adsorbents
equipment:  
Bob Broach robert.broach@uop.com Mon Apr 24 11:59:58 CDT 2006
962 33BM high resolution and in situ powder diffraction of zeolites and adsorbents
equipment:  
Bob Broach robert.broach@uop.com Mon Apr 24 11:57:04 CDT 2006
961 33BM In situ XAFS of catalysts Pt II
equipment: standard EXAFS equipment
Simon R. Bare simon.bare@uop.com Wed Apr 19 17:11:23 CDT 2006
960 33BM In situ XAFS of catalysts
equipment: standard EXAFS equipment
Simon R. Bare simon.bare@uop.com Wed Apr 19 17:10:37 CDT 2006
959 33BM In situ XAFS of catalysts
equipment: standard EXAFS equipment
Simon R. Bare simon.bare@uop.com Wed Apr 19 17:09:38 CDT 2006
958 33ID USAXs setup
equipment:  
Jan Ilavsky ilavsky@aps.anl.gov Wed Apr 19 13:57:14 CDT 2006
957 33ID Carbon Sequestration in Marine Sediments: Preservation by pores filled with organic matter
equipment: USAXS sample paddles
John F. McCarthy and Laura Liegerman jmccart1@utk.edu Wed Apr 19 13:57:06 CDT 2006
956 33ID USAXS setup and testing
equipment:  
Jan Ilavsky ilavsky@aps.anl.gov Wed Apr 19 13:55:16 CDT 2006
955 33ID USAXS imaging
equipment:  
Jan Ilavsky ilavsky@aps.anl.gov Wed Apr 19 13:52:31 CDT 2006
954 33BM XAFS evaluation on 33BM-B
equipment:  
Evguenia Karapetrova jenia@anl.gov Tue Apr 18 12:33:52 CDT 2006
953 33BM XAFS studies of catalyst materials and metallic glasses.
equipment: Lytle detector
Ning Yang nyang@aps.anl.gov Tue Apr 18 09:39:39 CDT 2006
952 33BM Huang scattering from NiAl superalloy
equipment: displex cryostat vortex detector
Eliot Specht spechted@ornl.gov Tue Apr 18 07:57:29 CDT 2006
951 34ID-C GISAXS Study of Titanium Dioxide Thin Films
equipment:  
Wei Zhang & Ross Harder wzhang4@uiuc.edu Mon Apr 17 15:51:14 CDT 2006
950 34ID-C Coherent Diffraction Studies of CdS Nanostructure in Zeolites
equipment:  
Hyunjung Kim hkim@sogang.ac.kr Mon Apr 17 09:49:27 CDT 2006
949 33ID Superlattices in superconducting cuprates
equipment: displex, 2-d detector
T. Egami egami@utk.edu Fri Apr 14 16:28:20 CDT 2006
948 33ID depth dependent relaxation of strained sige alloys grown on si(001)
equipment:  
joseph woicik woicik@bnl.gov Fri Apr 14 11:57:44 CDT 2006
947 34ID-C Quasi-dynamic studies of an cochlea
equipment: CCD camera, Full-field microscope
Christoph Rai rau@anl.gov Thu Apr 13 18:02:50 CDT 2006
946 34ID-C Testing X-ray optics
equipment: CCD camera, full-field microscope setup
Christoph Rau rau@anl.gov Thu Apr 13 17:43:51 CDT 2006
945 33ID diffuse scattering and newport studies
equipment:  
p zschack zschack Fri Apr 07 08:37:43 CDT 2006
944 34ID-E Microbeam investigations of deformed crystals
equipment:  
Ben Larson bcl@ornl.gov Tue Apr 04 10:41:41 CDT 2006
943 33BM Si and superconductor study
equipment:  
Evguenia Karapetrova jenia@anl.gov Wed Mar 29 15:06:39 CST 2006
942 34ID-C au-bi thin films
equipment:  
jack sadlier   Sat Mar 25 11:15:32 CST 2006
941 34ID-C Coherent X-ray Diffraction studies on Bismuth thin films
equipment:  
John Sadleir sadleir@milkyway.gsfc.nasa.gov Sat Mar 25 10:24:10 CST 2006
940 34ID-C CXD study of Hydride Particle Formation
equipment:  
Brent Heuser bheuser@uiuc.edu Wed Mar 22 09:51:18 CST 2006
939 34ID-C CXD measurement of an embedded hydride particle in epitaxial thin film Pd
equipment:  
Brent Heuser bheuser@uiuc.edu Tue Mar 21 11:58:53 CST 2006
938 34ID-C X-ray diffraction microscopy investigation on the interfacial structures
equipment: Kappa diffractometer, KB bender and mirrors,
Yong Chu ychu@aps.anl.gov Tue Mar 14 10:59:38 CST 2006
937 33ID Microstructure of Silica Nanoparticles in Low MW PEG
equipment: Use of a constant temperatrue water bath and the vaccum pump
Benjamin Anderson banders3@uiuc.edu Sat Mar 11 02:41:18 CST 2006
936 34ID-C Coherent X-ray diffraction on Nanocrystals
equipment:  
Ross Harder rharder@uiuc.edu Fri Mar 10 22:21:43 CST 2006
935 33BM Studies of supported Pt bimetallic catalysts
equipment:  
Joo Kang kang@mrl.uiuc.edu Fri Mar 10 16:34:19 CST 2006
934 33BM Structural behavior of Au catalysts on TiO2
equipment:  
Laurent Menard lmenard@uiuc.edu Mon Mar 06 15:20:24 CST 2006
933 33ID USAXS setup and preliminary tests
equipment:  
Jan Ilavsky ilavsky@aps.anl.gov Thu Mar 02 10:08:23 CST 2006
932 34ID-C Nano-Tomography and Imaging and scientific applications
equipment: Nano-tomography equipment
Christoph Rau rau@anl.gov Wed Feb 22 20:10:23 CST 2006
931 33BM Exafs of oxid supported gold nanoparticles
equipment:  
Laurent Menard lmenard@uiuc.edu Mon Feb 20 11:28:12 CST 2006
930 33ID SBUSAXS setup
equipment:  
Jan Ilavsky ilavsky@aps.anl.gov Tue Feb 14 16:17:31 CST 2006
929 33BM Lysozyme test run on 33BM
equipment: CIPD detector
Robert Von Dreele vondreele@anl.gov Mon Feb 06 13:18:39 CST 2006
928 34ID-E microdiffraction from strained material
equipment:  
Ben Larson larsonbc@ornl.gov Fri Feb 03 13:58:04 CST 2006
927 34ID-E Structure determination of unknowns including precipitates in amorphous braze
equipment:  
Gene Ice IceGE@ornl.gov Thu Feb 02 09:48:53 CST 2006
926 33ID beam line / newport setup
equipment:  
p zschack zschack@anl.gov Tue Jan 31 08:24:36 CST 2006
925 34ID-C Coherent diffraction on thin films
equipment: none
R. Felici felici@esrf.fr Mon Jan 30 16:22:04 CST 2006
924 34ID-E beamline alignment
equipment:  
Wenjun Liu wjliu@anl.gov Mon Jan 30 16:10:44 CST 2006
923 33BM diffraction from thermo-electric superlattices
equipment: none
p zschack zschack@anl.gov Tue Jan 10 10:22:10 CST 2006
922 powder diffraction
equipment: fast powder camera
p zschack zschack@anl.gov Tue Jan 10 10:19:16 CST 2006
921 33BM XAFS study of supported Pt clusters
equipment:  
Joo Kang kang@mrl.uiuc.edu Mon Jan 09 12:26:03 CST 2006
920 33BM Electronic impacts on Au bond lengths in ligand protected and supported Au nanoparticles
equipment:  
Laurent Menard lmenard@uiuc.edu Wed Dec 14 12:33:20 CST 2005
919 33BM X-ray reflectivity studies of ultra-thin ferroelectric films
equipment:  
John Budai budaijd@ornl.gov Thu Dec 08 19:02:27 CST 2005
918 34ID-C Brownian motion studies of Alumina and Silver nanoparticles
equipment: K-B mirrors
Mengning Liang mliang2@uiuc.edu Thu Dec 08 15:53:08 CST 2005
917 33ID PLD
equipment: everything for PLD, and some kind of 2-d detector too.
Jon Tischler TischlerJZ@ornl.gov Thu Dec 08 13:08:11 CST 2005
916 33ID Inelastic X-ray scattering
equipment: k-tek detector, Ge backscattering analyzer, small alignment laser
Jon Tischler TischlerJZ@ornl.gov Thu Dec 08 13:03:38 CST 2005
915 34ID-C Continued Investigation of ITO and Ge Exposed to Atomic Oxygen
equipment: The KB mirrors will be necessary for this work.
Ross Harder rharder@uiuc.edu Thu Dec 08 11:59:07 CST 2005
914 33ID Growth studies of Fe3O4/MgO films using pulsed laser deposition
equipment:  
Yen-Ru Lee junolee@uiuc.edu Thu Dec 08 03:50:45 CST 2005
913 34ID-E Ge distribution in Diatoms
equipment: Standard Microbeam Station; KTek detector
Jon tischler zzt@ornl.gov Thu Dec 08 02:34:02 CST 2005
912 34ID-E Strain and particle size vs depth in MoN films
equipment: Standard Microbeam Station;
Ben Larson larsonbc@ornl.gov Thu Dec 08 02:24:35 CST 2005
911 34ID-E Long Range Internal Stress in Deformed Cu
equipment: Standard Microbeam Station
Ben Larson larsonbc@ornl.gov Thu Dec 08 02:14:17 CST 2005
910 34ID-E Plastic deformation under nanoindented NiTi
equipment: Standard Microbeam Station
Ben Larson larsonbc@ornl.gov Thu Dec 08 02:06:35 CST 2005
909 34ID-E Plastic deformation under nanoindented Cu
equipment: Standard Microbeam Station
Ben Larson larsonbc@ornl.gov Thu Dec 08 01:59:50 CST 2005
908 34ID-E In Situ Nanoindentation of Si
equipment: Standard Microbeam Station
Ben Larson larsonbc@ornl.gov Thu Dec 08 01:47:24 CST 2005
907 34ID-E Determination of unknown phases in amorphous brazed materials
equipment:  
Gene Ice IceGE@ornl.gov Wed Dec 07 21:39:00 CST 2005
906 34ID-E Diffuse microdiffraction
equipment:  
Gene Ice IceGE@ornl.gov Wed Dec 07 21:35:55 CST 2005
905 34ID-E Structure refinement of unknown crystals.
equipment:  
Gene Ice IceGE@ornl.gov Wed Dec 07 21:29:52 CST 2005
904 34ID-E Toward a nondispersive nanobeam.
equipment:  
Gene Ice IceGE@ornl.gov Wed Dec 07 21:22:39 CST 2005
903 34ID-E Elastic strain and plastic deformation near a crack tip.
equipment:  
Judy Pang PangJ@ornl.gov Wed Dec 07 21:16:46 CST 2005
902 34ID-C Nano-Tomography
equipment: KB system CCD
Christoph Rau rau@anl.gov Wed Dec 07 17:31:17 CST 2005
901 34ID-C alignment beamline + 30micron focus with KB system
equipment: KB system CCD camera
Christoph Rau rau@anl.gov Wed Dec 07 17:20:18 CST 2005
900 34ID-E Analysis of the nanostructural state in the near surface region of weld and GaN layers
equipment:  
Barabash barabashr@ornl.gov Wed Dec 07 14:54:29 CST 2005
899 34ID-C Coherent X-ray diffraction from BaTiO3 single crystal nanowire
equipment: K-B mirrors
Yang Da yangda@uiuc.edu Wed Dec 07 14:40:33 CST 2005
898 34ID-C X-ray diffraction study of polycrystalline titanium oxide films
equipment:  
Wei Zhang wzhang4@uiuc.edu Wed Dec 07 13:40:47 CST 2005
897 33ID Structure of Anisotropic Nanoparticles
equipment:  
Eric Mock ericmock@uiuc.edu Tue Dec 06 22:00:40 CST 2005
896 34ID-C GISAXS of AgCo and CuCo precipitates induced by ion irradiation
equipment: KB mirrors (strictly MRL, not UNICAT)
Ian Robinson ikr@uiuc.edu Tue Dec 06 20:39:08 CST 2005
895 34ID-C Structure of silicon nanowires
equipment: KB mirrors (strictly MRL, not UNICAT)
Ian Robinson ikr@uiuc.edu Tue Dec 06 20:32:48 CST 2005
894 Magnetic quenching of TDS
equipment:  
Hawoong Hong h-hong@uiuc.edu Tue Dec 06 17:09:43 CST 2005
893 33BM MgB2 TDS
equipment:  
Hawoong Hong h-hong@uiuc.edu Tue Dec 06 17:04:36 CST 2005
892 33ID quantum well island on oxides
equipment:  
Hawoong Hong h-hong@uiuc.edu Tue Dec 06 17:03:17 CST 2005
891 33BM V3Si TDS
equipment: displex, Mar345
Ruqing Xu ruqingxu@uiuc.edu Tue Dec 06 15:16:03 CST 2005
890 33BM Simulated welding
equipment: CCD detector spot-welder
Eliot Specht spechted@ornl.gov Tue Dec 06 14:13:27 CST 2005
889 34ID-E Effect of local deformation on grain growth
equipment: oven in LOM lab
John Budai budaijd@ornl.gov Tue Dec 06 10:25:08 CST 2005
888 33ID USAXS improvements and rapid access/short test studies
equipment:  
Jan Ilavsky ilavsky@aps.anl.gov Mon Dec 05 21:44:21 CST 2005
887 33BM EXAFS
equipment:  
Simon Bare simon.bare@uop.com Mon Dec 05 15:32:26 CST 2005
886 33BM EXAFS
equipment:  
Simon Bare simon.bare@uop.com Mon Dec 05 15:31:14 CST 2005
885 33BM Powder diffraction
equipment:  
Bob Broach robert.broach@uop.com Mon Dec 05 15:29:38 CST 2005
884 33BM Powder diffraction
equipment:  
Bob Broach robert.broach@uop.com Mon Dec 05 15:27:57 CST 2005
883 33ID Liquid Pb films on Si
equipment:  
Aaron Gray ajgray@uiuc.edu Mon Dec 05 14:25:40 CST 2005
882 33BM Thermal Diffuse Scattering(TDS) experiment of a single crystal diamond( and Ge)
equipment: Displex, Mar detector
Jaseung Ku jku2@uiuc.edu Fri Dec 02 22:10:44 CST 2005
881 33ID USAXS from conductiing polymer composites
equipment:  
Lyle Levine lyle.levine@nist.gov Fri Nov 25 13:35:05 CST 2005
880 33BM Resonant X-ray Scattering Study of the Atomic Structure of Bulk Metallic Glasses.
equipment:  
Takeshi Egami egami@utk.edu Fri Nov 25 12:39:22 CST 2005
879 33ID Microstructure of silica nanoparticles in low MW PEG
equipment: NONE
Benjamin Anderson banders3@uiuc.edu Wed Nov 23 11:53:52 CST 2005
878 33BM diffraction of sige
equipment:  
joseph woicik woicik@bnl.gov Thu Nov 17 15:11:12 CST 2005
877 33BM Characterization of diamond for electronics
equipment: darkroom
David Black david.black@nist.gov Wed Nov 16 08:28:18 CST 2005
876 33BM defect characterization of CZT
equipment: topography apparatus darkroom
David Black david.black@nist.gov Wed Nov 16 08:24:36 CST 2005
875 33ID SR-USAXS studies of gradient microstructures in porous catalyst membranes, advanced SOFC layers, and H-storage materials.
equipment: SR-USAXS configuration at 16.9 keV energy.
Dr. Andrew J. Allen andrew.allen@nist.gov Tue Nov 15 11:46:19 CST 2005
874 33ID NIST USAXS Flow Cell Studies of PA Co-assembly, DNA-Wrapped CNT Dispersions and Gold Nanoshell Suspensions
equipment: Control macros for online flow-cell components through 33-ID beam line control computer. Regular USAXS at around 11 keV with NIST Flow Cell.
Dr. Andrew J. Allen andrew.allen@nist.gov Tue Nov 15 10:57:42 CST 2005
873 34ID-E Microdiffraction from laser-interference patterned Ni/Al multilayer films
equipment:  
John Budai budaijd@ornl.gov Sun Oct 16 18:07:31 CDT 2005
872 33BM Beam line 33BM start up
equipment:  
Karapetrova Jenia jenia@anl.gov Mon Oct 03 16:43:21 CDT 2005
871 33ID beam line setup and R&D
equipment:  
p zschack zschack@anl.gov Mon Oct 03 15:51:10 CDT 2005
870 34ID-E Beamline alignment and test
equipment:  
Wenjun Liu wjliu@anl.gov Mon Oct 03 15:35:09 CDT 2005
869 34ID-C coherence studies using nanocrystals
equipment: K-B mirrors
Mengning Liang mliang2@uiuc.edu Wed Aug 31 12:14:59 CDT 2005
868 34ID-C Continued x-ray diffraction studies of Indium Tin Oxide films
equipment:  
Ross J Harder rharder@uiuc.edu Wed Aug 31 10:23:46 CDT 2005
867 34ID-E Fractal study on Cu
equipment:  
Judy Pang pangj@ornl.gov Mon Aug 29 12:11:45 CDT 2005
866 33BM x-ray topography of electronic materials
equipment:  
David Black david.black@nist.gov Fri Aug 26 07:21:40 CDT 2005
865 33ID A-USAXS from silicon nitride sample
equipment: none
Pete Jemian jemian@anl.gov Fri Aug 26 00:49:26 CDT 2005
864 34ID-E Ge Distribution in Diatoms
equipment: K-Tek detector
Jon Tischler zzt@ornl.gov Fri Aug 26 00:16:46 CDT 2005
863 34ID-E Al 7075 Fatigue Fracture
equipment:  
Wenge Yang Yangw@ornl.gov Fri Aug 26 00:05:51 CDT 2005
862 34ID-E TiAl in situ creep
equipment:  
Wenge Yang yangw@ornl.gov Thu Aug 25 23:52:13 CDT 2005
861 34ID-E Si nanoindentation in situ
equipment:  
Wenge Yang yangw@ornl.gov Thu Aug 25 23:26:58 CDT 2005
860 34ID-E CU Nanoindent Deformation
equipment:  
Wenge Yang yangw@ornl.gov Thu Aug 25 23:22:11 CDT 2005
859 34ID-C High-resolution Hard X-ray MIcroscopy
equipment: CCD camera
Vasilica Crecea crecea@uiuc.edu Thu Aug 25 15:43:55 CDT 2005
858 34ID-C Grazing incidence angle diffraction experiemt on Si nanowire
equipment: K-B mirrors
Yang Da yangda@uiuc.edu Wed Aug 24 16:01:14 CDT 2005
857 34ID-C X-ray diffraction study of polycrystalline titanium oxide films
equipment:  
Wei Zhang wzhang4@uiuc.edu Wed Aug 24 15:43:35 CDT 2005
856 34ID-C Suitability of 34ID for thin film investigations
equipment: KB Mirrors might be useful, but not essential
Ian Robinson ikr@uiuc.edu Wed Aug 24 15:20:14 CDT 2005
855 34ID-C XPCS on the OTE-water interface
equipment: No mirrors needed. Radiation damage is a serious problem
Ian Robinson ikr@uiuc.edu Wed Aug 24 15:15:24 CDT 2005
854 34ID-C Coherent diffraction from beta hematin
equipment: KB mirrors will be needed Oct 4 to about Nov 8
Ian Robinson ikr@uiuc.edu Wed Aug 24 15:03:58 CDT 2005
853 33ID USAXS of diesel soot
equipment:  
Tom Watkins watkinstr@ornl.gov Mon Aug 22 19:58:07 CDT 2005
852 33ID USAXS from standard samples
equipment:  
Pete Jemian jemian@anl.gov Mon Aug 22 16:53:53 CDT 2005
851 33BM In-situ phase transitions in metals
equipment: CCD detector, spot-welder
Eliot Specht spechted@ornl.gov Mon Aug 22 15:47:01 CDT 2005
850 33ID Inelastic X-ray scattering
equipment: need Ktek detector
Jon Tischler TischlerJZ@ornl.gov Mon Aug 22 15:37:02 CDT 2005
849 33ID PLD
equipment: usual for PLD
Jon Tischler TischlerJZ@ornl.gov Mon Aug 22 15:34:13 CDT 2005
848 33BM Cu strain Asymmetry
equipment: Huber, detector, analyzer
Jon Tischler TischlerJZ@ornl.gov Mon Aug 22 15:30:54 CDT 2005
847 phonon dispersion of superconducting materials
equipment:  
Hawoong Hong h-hong@uiuc.edu Mon Aug 22 09:15:55 CDT 2005
846 33BM V3Si TDS
equipment: displex, MAR345
Ruqing Xu ruqingxu@uiuc.edu Sun Aug 21 23:20:51 CDT 2005
845 33BM Oxidation and reduction of supported Pt and Al clusters
equipment:  
Joo Kang kang@mrl.uiuc.edu Sun Aug 21 20:47:30 CDT 2005
844 33ID Growth studies of Fe3O4/MgO films using pulsed laser deposition
equipment:  
Yen-Ru Lee junolee@uiuc.edu Sun Aug 21 14:19:03 CDT 2005
843 33BM Installation, testing, and calibration of curved image plate detector for in-situ high temperature powder x-ray diffraction
equipment: None
Prof. Waltraud M. Kriven kriven@uiuc.edu Sat Aug 20 18:23:57 CDT 2005
842 33ID Structure of Anisotropic Nanoparticles
equipment:  
Eric Mock ericmock@uiuc.edu Sat Aug 20 16:47:51 CDT 2005
841 34ID-E Mechanisms Controlling Local Orientation of Epitaxial Oxide Films
equipment:  
John Budai budaijd@ornl.gov Fri Aug 19 18:31:26 CDT 2005
840 34ID-E Fan-beam imaging
equipment: Apogee CCD
Christoph Rau rau@anl.gov Fri Aug 19 16:41:14 CDT 2005
839 34ID-C Setting up a diffraction experiment
equipment: KB-mirror
Christoph Rau rau@anl.gov Fri Aug 19 16:21:36 CDT 2005
838 34ID-C Nano-Tomography
equipment: Apogee CCD Kb mirrors
Christoph Rau rau@anl.gov Fri Aug 19 16:11:07 CDT 2005
837 33ID Diffuse x-ray scattering from CuAu crystals
equipment: Kappa diffractometer- linear sensitive detector, graphite mono etc.
Gene E. Ice IceGE@ornl.gov Fri Aug 19 16:03:48 CDT 2005
836 34ID-C In-line phase contrast imaging
equipment: Apogee CCD
Christoph Rau rau@anl.gov Fri Aug 19 15:59:52 CDT 2005
835 34ID-E Multiple Differential Aperture Microscopy
equipment:  
Gene E. Ice IceGE@ornl.gov Fri Aug 19 08:24:30 CDT 2005
834 34ID-E Characterization of plastic and elastic deformation in Ti nano structure obtained by friction stir weld
equipment:  
Rozaliya Barabash barabashr@ornl.gov Fri Aug 19 08:22:18 CDT 2005
833 34ID-E Diffuse x-ray scattering in small grains
equipment:  
Gene E. Ice IceGE@ornl.gov Fri Aug 19 08:22:16 CDT 2005
832 34ID-E Sn Whisker Strain and Orientation
equipment:  
Gene E. Ice IceGE@ornl.gov Fri Aug 19 08:18:49 CDT 2005
831 34ID-E S[atially resolved characterization of the FIB structured GaN thinlayers
equipment:  
Rozaliya Barabash barabashr@ornl.gov Fri Aug 19 08:15:06 CDT 2005
830 34ID-E 3D Fluorescence measurements using DAXM
equipment:  
Gene E. Ice IceGE@ornl.gov Fri Aug 19 08:15:03 CDT 2005
829 34ID-E Phase identification of crystals in amorphous braze
equipment:  
Gene E. Ice IceGE@ornl.gov Fri Aug 19 08:04:03 CDT 2005
828 33BM Depth profiling of Ti Al Nb wear sample
equipment:  
Gene E. Ice IceGE@ornl.gov Fri Aug 19 07:58:21 CDT 2005
827 33BM Co-ordination and bonding in transition layer glasses.
equipment:  
Gene E. Ice IceGE@ornl.gov Fri Aug 19 07:52:57 CDT 2005
826 33ID SR-USAXS Studies of Plasma-Sprayed Materials for Next-Generation Catalyst Membranes, Electrolytes and Coatings
equipment:  
Andrew Allen andrew.allen@nist.gov Thu Aug 18 21:34:21 CDT 2005
825 33ID USAXS Flow Cell Studies of Peptide Amphiphiles and Carbon Nanotube Alignment
equipment: USAXS flow cell with working microlab computer interface.
Andrew Allen andrew.allen@nist.gov Thu Aug 18 21:10:40 CDT 2005
824 33BM more diffraction and possibly some dafs
equipment:  
joseph woicik woicik@bnl.gov Thu Aug 18 14:57:58 CDT 2005
823 33ID Liquid Pb films on Si
equipment:  
Aaron Gray aarongr@gmail.com Thu Aug 18 14:24:44 CDT 2005
822 33BM Resonant X-ray Scattering Study of the Atomic Structure of Bulk Metallic Glasses
equipment: vortex detector
Takeshi Egami egami@utk.edu Thu Aug 18 10:37:48 CDT 2005
821 33ID Diffuse scattering from superconducting cuprate
equipment: displex, vortex detector
Takeshi Egami egami@utk.edu Thu Aug 18 10:30:14 CDT 2005
820 33BM In situ EXAFS of catalysts
equipment:  
Simon Bare simon.bare@uop.com Tue Aug 16 15:39:41 CDT 2005
819 33BM In Situ EXAFS of Catalysts
equipment:  
Simon Bare simon.bare@uop.com Tue Aug 16 15:36:43 CDT 2005
818 33BM powder diffraction
equipment:  
Bob Broach robert.broach@uop.com Tue Aug 16 15:32:16 CDT 2005
817 33BM High resolution in situ powder diffraction
equipment:  
Bob Broach robert.broach@uop.com Tue Aug 16 15:29:28 CDT 2005
816 33BM diffraction and diffuse scattering
equipment: none
p zschack zschack@anl.gov Tue Aug 16 06:33:56 CDT 2005
815 33BM In Situ EXAFS structural determination of electrochemically-charged gold clusters
equipment:  
Laurent Menard lmenard@uiuc.edu Mon Aug 15 09:07:39 CDT 2005
814 34ID-E Beamline alignment and test
equipment:  
Wenjun Liu wjliu@anl.gov Tue May 31 15:30:10 CDT 2005
813 34ID-E Microstructure studies using nano-focusing beam diffraction
equipment: Nano-focusing stage
Wenge Yang yangw@ornl.gov Thu May 12 08:34:49 CDT 2005
812 34ID-E Sn Whisker Strain and Orientation
equipment:  
Gene E. Ice IceGE@ornl.gov Wed Apr 27 14:35:26 CDT 2005
811 33ID USAXS
equipment:  
jemian jemian@anl.gov Tue Apr 26 16:18:14 CDT 2005
810 34ID-C Grazing incidence x-ray scattering from Indium Tin Oxide Films
equipment:  
Ross Harder rharder@uiuc.edu Mon Apr 25 14:26:53 CDT 2005
809 34ID-C Reflectivity measurements of hydrophobic OTE films
equipment:  
Mengning Liang mliang2@uiuc.edu Sun Apr 24 23:04:05 CDT 2005
808 34ID-C crystallinity of gold tagger particles and coherent x-ray diffraction of static and dynamic nanoparticles
equipment: K-B mirrors
Mengning Liang mliang2@uiuc.edu Sun Apr 24 23:01:44 CDT 2005
807 34ID-C Study dislocation and strain using coherent X-ray diffraction
equipment: k-B mirrors
Yang Da yangda@uiuc.edu Sun Apr 24 21:45:17 CDT 2005
806 34ID-C Grazing Incidence X-ray Study of TiO2 films
equipment:  
Wei Zhang wzhang4@uiuc.edu Sat Apr 23 21:54:17 CDT 2005
805 34ID-C Coherent diffraction on thin Bi films
equipment: KB mirrors are probably not needed
Ian Robinson ikr@uiuc.edu Sat Apr 23 16:26:46 CDT 2005
804 34ID-C Coherent diffraction calibrations on myosin
equipment: KB mirrors
Ian Robinson ikr@uiuc.edu Sat Apr 23 16:21:44 CDT 2005
803 34ID-C Tomography of concrete
equipment:  
C. Rau rau@anl.gov Fri Apr 22 14:54:54 CDT 2005
802 34ID-C Study of dentritic growth
equipment: Apogee camera
C. Rau rau@anl.gov Fri Apr 22 14:51:08 CDT 2005
801 34ID-E Investigation of crack tip properties in Al
equipment:  
Judy Pang pangj@ornl.gov Fri Apr 22 09:51:15 CDT 2005
800 33ID Inelatic X-ray scattering
equipment: K-tek detector, HeNe laser
Jon Tischler TischlerJZ@ornl.gov Thu Apr 21 00:48:38 CDT 2005
799 33ID PLD
equipment:  
Jon Tischler TischlerJZ@ornl.gov Thu Apr 21 00:44:53 CDT 2005
798 34ID-E Inhomogeneous nanocrystalline/Bulk Amorphous Alloys After Strain
equipment: Extra CCD for 34-ID
Gene E. Ice IceGE@ornl.gov Wed Apr 20 09:29:41 CDT 2005
797 34ID-E Calibration of ultrasonic resonance measurements
equipment:  
Gene E. Ice IceGE@ornl.gov Wed Apr 20 09:25:19 CDT 2005
796 34ID-E Nanoprobe beam development and first experiments
equipment: Second CCD
Gene E. Ice IceGE@ornl.gov Wed Apr 20 09:20:54 CDT 2005
795 34ID-E Point defect characterization in polycrystalline samples
equipment:  
F. J. Walker walkerfj@ornl.gov Tue Apr 19 15:22:31 CDT 2005
794 34ID-E Strain around Nanoindentations
equipment:  
David Black david.black@nist.gov Tue Apr 19 14:56:44 CDT 2005
793 34ID-E Plastic and elastic deformation measurement near crack tip
equipment: Microdiffraction station
Wenge Yang yangw@ornl.gov Tue Apr 19 12:17:04 CDT 2005
792 34ID-E Fast measurement of local lattice rotation in indeted Cu single crystals
equipment: microdiffraction station
Wenge Yang yangw@ornl.gov Tue Apr 19 12:13:34 CDT 2005
791 34ID-E In-situ creep study of Ti-Al Alloy, Cu and Si single crystals
equipment: microdiffraction station and compression stage
Wenge Yang yangw@ornl.gov Tue Apr 19 12:07:23 CDT 2005
790 34ID-E Asymmetrical strain measurement of deformed Cu sample (tension and compression)
equipment: MIcrobeam station
Wenge Yang yangw@ornl.gov Tue Apr 19 12:00:51 CDT 2005
789 34ID-E In-situ nanoindent measurement in Si
equipment: Microdiffraction stage and nanoindent stage
Wenge Yang yangw@ornl.gov Tue Apr 19 11:55:18 CDT 2005
788  
equipment:  
Wenge Yang yangw Tue Apr 19 11:45:21 CDT 2005
787 33BM Scattering from MgB2
equipment:  
Hawoong Hong h-hong@uiuc.edu Mon Apr 18 09:37:08 CDT 2005
786 33ID Phonon dispersion under magnetic field
equipment:  
Hawoong Hong h-hong@uiuc.edu Mon Apr 18 09:32:41 CDT 2005
785 33ID Nucleation and growth of QSE islands on semiconductor
equipment:  
Hawoong Hong h-hong@uiuic.edu Mon Apr 18 09:24:05 CDT 2005
784 33BM Catalytic properties in relation to structure of Pt nanoparticles
equipment:  
Joo Kang kang@mrl.uiuc.edu; 217-265-5068 Mon Apr 18 00:01:28 CDT 2005
783 33BM XAFS of Supported Metallic Nanoparticle Catalysts
equipment:  
Laurent Menard lmenard@uiuc.edu Sun Apr 17 22:06:48 CDT 2005
782 34ID-E Piezoelectric response of single ZnO nanorods
equipment:  
John Budai budaijd@ornl.gov Sun Apr 17 16:46:50 CDT 2005
781 34ID-E Grain growth in 2D metal films
equipment:  
John Budai budaijd@ornl.gov Sun Apr 17 16:38:45 CDT 2005
780 33ID Growth studies of Fe3O4/MgO films using pulsed laser deposition
equipment: Laser ablation chamber
Yen-Ru Lee junolee@uiuc.edu Sun Apr 17 16:09:40 CDT 2005
779 33BM Topography
equipment: Apogee camera
David Black david.black@nist.gov Sun Apr 17 15:31:26 CDT 2005
778 33ID Liquid Pb films on Si
equipment:  
Aaron Gray ajgray@uiuc.edu Sun Apr 17 15:31:19 CDT 2005
777 33BM phonon dispersions in CDW material : 2H-NbSe2 by x-ray thermal difuse scattering
equipment: displex
Yen-Ru Lee junolee@uiuc.edu Sun Apr 17 15:29:19 CDT 2005
776 33ID Structure and Rheology of Anisotropic Particles
equipment:  
Eric Mock ericmock@uiuc.edu Sun Apr 17 14:34:57 CDT 2005
775 33ID Diffuse scattering from superconducting cuprate
equipment: Displex, energy sensitive detector.
Takeshi Egami egami@utk.edu Sun Apr 17 10:07:05 CDT 2005
774 34ID-C Coherent imaging : Cochlea imaging, dynamic studies
equipment: Apogee camera
C. Rau rau@anl.gov Fri Apr 15 21:14:43 CDT 2005
773 34ID-C Microscopy of Nanostructures
equipment: Apogee camera KB mirror + table
Christoph Rau rau@anl.gov Fri Apr 15 20:54:31 CDT 2005
772 33BM Installation, testing, and calibration of curved image plate detector for in-situ high temperature powder x-ray diffraction
equipment: None
Prof. Waltraud M. Kriven kriven@uiuc.edu Fri Apr 15 14:32:21 CDT 2005
771 33ID Neutron irradiated iron
equipment: Displex, Vortex (APS detector pool), Kappa Diffractometer
Fredrick Walker WalkerFJ@ornl.gov Fri Apr 15 13:34:27 CDT 2005
770 33ID Anomalous USAXS studies of solid oxide fuel cell components
equipment: Regular USAXS at ~ 17.9 keV, for ASAXS measurements. (NOT side-bounce).
Andrew Allen andrew.allen@nist.gov, 301-975-5982 Fri Apr 15 12:05:03 CDT 2005
769 33ID USAXS Flow Cell Studies of nanoparticle precipitation, carbon nanotube dispersion quality, and bio-particle interactions
equipment: Regular USAXS at 10.5 keV, or thereabouts. USAXS flow cell with interfacing to USAXS control system.
Andrew Allen andrew.allen@nist.gov, 301-975-5982 Fri Apr 15 11:39:46 CDT 2005
768 33BM more diffraction
equipment:  
joseph woicik woicik@bnl.gov Thu Apr 14 10:34:29 CDT 2005
767 33BM In situ XAFS of Catalysts
equipment: Standard EXAFS equipment
Simon Bare simon.bare@uop.com Thu Apr 14 10:27:59 CDT 2005
766 33BM In situ XAFS of catalysts
equipment: Standard EXAFS equipment
Simon Bare simon.bare@uop.com Thu Apr 14 10:25:40 CDT 2005
765 33BM In situ XAFS of catalysts
equipment: Standard EXAFS equipment
Simon Bare simon.bare@uop.com Thu Apr 14 10:22:45 CDT 2005
764 34ID-E Grain boundaries in textured Ni
equipment: none
Eliot Specht spechted@ornl.gov Wed Apr 13 13:59:30 CDT 2005
763 33ID Single diffraction from tiny crystals + diffuse scattering from single crystals
equipment:  
Bob Broach robert.broach@uop.com Tue Apr 12 15:24:15 CDT 2005
762 33BM High resolution in situ powder diffraction
equipment:  
Bob Broach robert.broach@uop.com Tue Apr 12 15:16:31 CDT 2005
761 33BM High resolution in situ powder diffraction
equipment:  
Bob Broach robert.broach@uop.com Tue Apr 12 15:14:53 CDT 2005
760 33BM High resolution in situ powder diffraction
equipment:  
Bob Broach robert.broach@uop.com Tue Apr 12 12:55:42 CDT 2005
759 34ID-C X-ray Tomogrpahy at Sub-micrometer Resolution
equipment:  
Vasilica Crecea crecea@uiuc.edu Tue Apr 12 09:59:51 CDT 2005
758 34ID-E 3D measurments of dislocation tensor in shock sample
equipment: standard microbeam equipment
Rozaliya Barabash BarabashR@ornl.gov Fri Apr 08 13:11:03 CDT 2005
757 34ID-E GaN on SiC and Si
equipment: Standard microdiffraction equipment
Rozaliya Barabash BarabashR@ornl.gov Fri Apr 08 13:05:25 CDT 2005
756 33BM Study of the effect of VME rebooting on beam
equipment: bender
Karapetrova Evguenia jenia@anl.gov Thu Apr 07 15:04:53 CDT 2005
755 33BM Powder diffraction from Ti samples
equipment: Area detector, and point counting
Gene E. ice IceGE@ornl.gov Thu Mar 24 10:09:31 CST 2005
754 Nanophase measurements in wear tracks of Ti alloys
equipment: Solid state detector, second CCD detector set for glancing angle measurement
Eri Fujiwara Fujiwarae@ornl.gov Thu Mar 24 10:06:13 CST 2005
753 34ID-E Microdiffraction analysis of Ti alloys
equipment: Ortec solid state detector, second CCD set at glancing angle for monochromatic micro-powder measurements
Gene E. Ice IceGE@ornl.gov Thu Mar 24 10:05:50 CST 2005
752 Nanophase measurements in wear tracks of Ti alloys
equipment: Solid state detector, second CCD detector set for glancing angle measurement
Eri Fujiwara Fujiwarae@ornl.gov Thu Mar 24 10:00:33 CST 2005
751 33ID USAXS operations at 18 keV
equipment:  
Pete Jemian jemian@anl.gov Mon Mar 14 13:38:09 CST 2005
750 33BM EXAFS oxide passivating layers on supported platinum nanoparticles
equipment: variac, water inlet and outlet for cooling of sample cell, liquid nitrogen
Laurent Menard lmenard@uiuc.edu 217-244-7440 Tue Feb 22 10:42:07 CST 2005
749 34ID-E Beamline R&D
equipment:  
Wenjun Liu wjliu@anl.gov Mon Jan 31 11:52:03 CST 2005
748 33BM Beam line study 33BM
equipment:  
Karapetrova Evguenia jenia@anl.gov Mon Jan 31 09:43:23 CST 2005
747 34ID-C Study of the phase seperation of NiAu3 alloy
equipment:  
Wei Zhang wzhang4@uiuc.edu Wed Dec 15 09:57:00 CST 2004
746 33ID 33ID - Jan 31 - Feb 3, 2005
equipment:  
Paul Zschack zschack@anl.gov Mon Dec 13 14:49:50 CST 2004
745 33BM 33BM - March 24-27, 2005
equipment:  
Paul Zschack zschack@anl.gov Mon Dec 13 14:47:45 CST 2004
744 33BM 33BM - Feb 25 - Feb 28, 2005
equipment:  
Paul Zschack zschack@anl.gov Mon Dec 13 14:46:31 CST 2004
743 33BM - Feb 25 - Feb 28, 2005
equipment:  
Paul Zschack zschack@anl.gov Mon Dec 13 14:45:15 CST 2004
742 34ID-C High-resolution X-ray Microscopy
equipment:  
Vasilica Crecea crecea@uiuc.edu Sun Dec 12 20:14:56 CST 2004
741 34ID-C Study of the phase seperation of Ni,Au alloy
equipment:  
Wei Zhang wzhang4@uiuc.edu Sat Dec 11 15:20:28 CST 2004
740 34ID-E Test of nano focusing mirror
equipment:  
Wenjun Liu wjliu@anl.gov Fri Dec 10 13:35:57 CST 2004
739 34ID-C Continued investigation of Quantum Dots and Antiphase Domains.
equipment:  
Ross Harder rharder@uiuc.edu Wed Dec 08 17:25:42 CST 2004
738 34ID-C Coherent diffraction experiment of Ge quantum wires on Si(124)
equipment: K-B mirrors
Yang Da yangda@uiuc.edu Wed Dec 08 16:35:27 CST 2004
737 34ID-C Angular diffusion of alumina nanocrystals
equipment: KB mirrors
Mengning Liang mliang2@uiuc.edu Wed Dec 08 13:36:39 CST 2004
736 33ID Pore Sizes in Diesel Soot, part 2
equipment: none needed
Thomas Watkins watkinstr@ornl.gov Tue Dec 07 15:34:38 CST 2004
735 34ID-E Strain and grain growth near stress corrosion cracks
equipment:  
Gene E. Ice IceGE@ornl.gov Tue Dec 07 13:01:22 CST 2004
734 34ID-E Diffuse x-ray scattering in small grains
equipment:  
Gene E. Ice IceGE@ornl.gov Tue Dec 07 12:59:18 CST 2004
733 33BM Studies of strain and phase transformation in Ti alloys
equipment: Powder diffraction setup
Gene E. Ice IceGE@ornl.gov Tue Dec 07 12:55:39 CST 2004
732 34ID-E Studies of Cement strain accomodation
equipment:  
Gene E. Ice IceGE@ornl.gov Tue Dec 07 12:52:56 CST 2004
731 34ID-E Multiple Differential Aperture Microscopy
equipment:  
Gene E. Ice IceGE@ornl.gov Tue Dec 07 12:45:23 CST 2004
730 34ID-C SAXS study of self-assembly of biopolymers
equipment:  
Robert Coridan coridan@uiuc.edu Tue Dec 07 11:55:11 CST 2004
729 SAxelf-assembly of biopolymers
equipment:  
Robert Coridan coridan@uiuc.edu Tue Dec 07 11:50:58 CST 2004
728 33BM X-ray radiography of AlCu
equipment: the apogee digital camera or other digital camera from the detector pool
David Black david.black@nist.gov Tue Dec 07 11:18:40 CST 2004
727 33BM X-ray Topography of SiGe films
equipment: the apogee digital camera or other digital camera from the detector pool
David Black david.black@nist.gov Tue Dec 07 11:15:55 CST 2004
726 34ID-E Analysis of deformation inhomogeneities in the deformed Al bicrystals
equipment:  
Barabash Rozaliya barabashr@ornl.gov Mon Dec 06 19:03:40 CST 2004
725  
equipment:  
Barabash Rozaliya   Mon Dec 06 18:57:16 CST 2004
724 34ID-E Spacially resolved characterization of lattice rotations, crystallographic tilt and strain tensot in GaN layers
equipment:  
Barabash Rozaliya barabashr@ornl.gov Mon Dec 06 18:54:43 CST 2004
723 33ID structure of polyethlyene terephthalate by SB-USAXS
equipment:  
Bob Broach robert.broach@uop.com Mon Dec 06 18:07:38 CST 2004
722 33BM XAFS
equipment:  
Simon Bare simon.bare@uop.com Mon Dec 06 14:21:35 CST 2004
721 33BM XAFS
equipment:  
Simon Bare simon.bare@uop.com Mon Dec 06 14:20:23 CST 2004
720 33BM High Resolution Powder Diffraction
equipment:  
Bob Broach robert.broach@uop.com Mon Dec 06 14:17:22 CST 2004
719 33BM high resolution powder diffraction
equipment:  
Bob Broach robert.broach@uop.com Mon Dec 06 14:15:49 CST 2004
718 34ID-C CXD on protein crystals
equipment:  
Sebastien Boutet boutet@uiuc.edu Mon Dec 06 03:56:28 CST 2004
717 33BM Imaging TDS
equipment:  
Hawoong Hong h-hong@uiuc.edu Sun Dec 05 22:23:23 CST 2004
716 33BM Change of lattice vibration under magnetic field
equipment:  
Hawoong Hong h-hong@uiuc.edu Sun Dec 05 22:18:35 CST 2004
715 33ID Kinetics of QSE island growth on semiconductors
equipment:  
Hawoong Hong h-hong@uiuc.edu Sun Dec 05 22:13:17 CST 2004
714 33ID Surface reconstruction studies of Fe3O4 films using pulsed laser deposition
equipment:  
Yen-Ru Lee junolee@uiuc.edu Sun Dec 05 20:47:28 CST 2004
713 34ID-E Self-affinity in deformed Cu
equipment:  
Judy Pang pangj@ornl.gov Sun Dec 05 17:50:20 CST 2004
712 33ID PLD, part 2
equipment: PLD
Jon Tischler TischlerJZ@ornl.gov Sun Dec 05 16:28:37 CST 2004
711 33ID PLD
equipment: All the usual for PLD
Jon Tischler TischlerJZ@ornl.gov Sun Dec 05 16:26:03 CST 2004
710 33ID Inelatic X-ray scattering
equipment: Inelastic scattering beam path and analyer, Also need APS Ktek detector
Jon Tischler TischlerJZ@ornl.gov Sun Dec 05 16:22:49 CST 2004
709 33BM strain measurement in deformed samples
equipment: Huber with ananlyzer
Jon Tischler TischlerJZ@ornl.gov Sun Dec 05 16:19:07 CST 2004
708 34ID-C Micro-imaging and tomography of a Cochlea
equipment: Apogee CCD camera
C. Rau rau@anl.gov Sun Dec 05 15:26:17 CST 2004
707 34ID-C Training of "new blood" UIUC students
equipment:  
Ian Robinson ikr@uiuc.edu Sun Dec 05 14:55:11 CST 2004
706 34ID-C Germanium Quantum Dots
equipment: KB mirrors
Ian Robinson ikr@uiuc.edu Sun Dec 05 14:43:20 CST 2004
705 34ID-E Crack tip deformation microstructure of Al alloy
equipment: Microbeam station
Wenge Yang yangw@ornl.gov Sun Dec 05 14:42:51 CST 2004
704 34ID-E Asymmetrical strain measurement of deformed Cu sample (tension and compression)
equipment: Microbeam station
Wenge Yang yangw@ornl.gov Sun Dec 05 14:39:51 CST 2004
703 34ID-E In-situ / ex-situ nanoindentation study of Al2O3 / Cu single crystals
equipment: Nanondentation stage and AFM.
Wenge Yang yangw@ornl.gov Sun Dec 05 14:30:09 CST 2004
702 34ID-E In-situ creep study of Ti-Al Alloy
equipment: Creep stage will be made in UNICAT microdiffraction hutch.
Wenge Yang yangw@ornl.gov Sun Dec 05 14:23:23 CST 2004
701 34ID-E In-situ measurement of plastic/elastic strain during nanoindentation in Si/Al single crystals
equipment: Nanoindentation stage
Wenge Yang yangw@ornl.gov Sun Dec 05 14:12:41 CST 2004
700 34ID-C Micro-Tomography
equipment: Apogee CCD camera
Chriistoph Rau rau@anl.gov Sun Dec 05 13:44:22 CST 2004
699 34ID-C Nano-Imaging and Tomography of Photonic Crystals
equipment: Apogee CCD camera. KB mirror.
Christoph Rau rau@anl.gov Sun Dec 05 13:16:15 CST 2004
698 33BM In-situ high temperature phase transformation studies in hafnia-tantala system, and rare earth vanadates and phosphates
equipment: None
Waltraud M. Kriven kriven@uiuc.edu Sun Dec 05 12:05:30 CST 2004
697 33BM phonon dispersions in CDW material : 2H-NbSe2 by x-ray thermal difuse scattering
equipment: cryostats,superconducting magnets,Roper CCD, Mar 345
Yen-Ru Lee junolee@uiuc.edu Sun Dec 05 01:38:07 CST 2004
696 33ID Scattering from Anisotropic Particles and Gels
equipment: SBUSAXS; water bath with temperature control
Subramanian Ramakrishnan ramakris@scs.uiuc.edu Sat Dec 04 17:41:39 CST 2004
695 33ID growth studies of TiN films on sapphire using pulsed laser deposition
equipment:  
Aaron Gray ajgray@uiuc.edu Fri Dec 03 18:39:29 CST 2004
694 34ID-E Microstructure and mechanical properties of nanostructures
equipment:  
John Budai budaijd@ornl.gov Fri Dec 03 16:50:27 CST 2004
693 33BM In situ, high-temperature phase transitions
equipment: Huber 4-circle, spot welder, CCD detector.
Eliot Specht spechted@ornl.gov Fri Dec 03 16:49:19 CST 2004
692 33ID Electronic inhomogeneity in cuprates
equipment: Displex.
Takeshi Egami egami@utk.edu Fri Dec 03 16:41:01 CST 2004
691 33ID Anomalous SR-USAXS of SOFC and Catalytic Membranes
equipment: SR-USAXS at 17-18 keV. Anomalous USAXS mode.
Andrew Allen andrew.allen@nist.gov Fri Dec 03 15:59:28 CST 2004
690 33ID Temperature-Mediated Nanoparticle Nucleation and Growth
equipment: Regular USAXS instrument at 10-11 keV energy.
Andrew Allen andrew.allen@nist.gov Fri Dec 03 15:13:21 CST 2004
689 33BM diffraction of strained Si on SiGe
equipment:  
joseph woicik woicik@bnl.gov Wed Dec 01 09:23:20 CST 2004
688 33ID USAXS of sea urchin teeth, single crystal aluminum, and semidilute polymer solutions
equipment: USAXS
Pete Jemian jemian@anl.gov ilavsky@anl.gov vijay@aps.anl.gov Tue Nov 23 16:51:28 CST 2004
687 33ID Investigation of He Bubbles in Borosilicate Glass
equipment: No
Professor BRENT J. HEUSER bheuser@uiuc.edu (217) 333-9610 Mon Nov 15 12:13:48 CST 2004
686 33ID Structural inhomogeneity in the cuprates
equipment: Displex
Takeshi Egami egami@utk.edu Fri Oct 29 15:00:45 CDT 2004
685 33BM Local structure of deformed metallic glasses
equipment:  
Takeshi Egami egami@utk.edu Fri Oct 29 14:55:30 CDT 2004
684 34ID-C Microscopy of nanomaterials
equipment: CCD camera
Christoph Rau rau@anl.gov Thu Oct 21 11:00:56 CDT 2004
683 33BM diffuse scattering
equipment:  
p zschack zschack@anl.gov Wed Oct 20 09:09:47 CDT 2004
682 test of request form with APS run cycle indicated
equipment:  
Pete jemian@top Wed Oct 06 09:34:38 CDT 2004
681 34ID-C Beamline alignment
equipment:  
Christoph Rau rau@anl.gov Tue Oct 05 08:16:31 CDT 2004
680 34ID-C Hard X-ray microscopy on photonic materials
equipment:  
Christoph Rau rau@anl.gov Wed Sep 15 14:22:59 CDT 2004
679 33BM Beam line study
equipment:  
Karapetrova Evguenia jenia@anl.gov Wed Sep 15 13:38:47 CDT 2004
678 34ID-C Saxs and CXD on ferritin
equipment:  
Sebastien Boutet boutet@uiuc.edu Fri Aug 27 13:17:08 CDT 2004
677 33ID Structure of Nickelate with Orbital Frustration
equipment: Displex
Takeshi Egami egami@utk.edu Fri Aug 27 12:35:39 CDT 2004
676 33BM radiographic imaging of Al-Cu
equipment: digital imaging camera possibly the real time camera from the SAXS apparatus
David Black david.black@nist.gov Fri Aug 27 11:04:50 CDT 2004
675 34ID-C X-ray Microscopy on Eye Lenses and Photonic Crystals
equipment:  
Vasilica Crecea crecea@uiuc.edu Fri Aug 27 08:51:30 CDT 2004
674 34ID-C Affect of varying substrates on Silver nanocube stability
equipment: mirrors
Mengning Liang mliang2@uiuc.edu Thu Aug 26 11:16:02 CDT 2004
673 33ID PLD, w/ fast timing
equipment:  
Jon Tischler TischlerJZ@ornl.gov Wed Aug 25 13:37:04 CDT 2004
672 34ID-C Filament Twist and Linker Distribution in F-actin Bundles
equipment:  
Thomas Angelini angelini@uiuc.edu Wed Aug 25 12:21:19 CDT 2004
671 34ID-C Coherent diffraction from dislocations and strain in GeSi/Si interfaces
equipment: KB mirrors
Yang Da yangda@uiuc.edu Tue Aug 24 16:31:55 CDT 2004
670 34ID-C In Situ Characterization of the deposition of Co on Au
equipment:  
Wei Zhang wzhang4@uiuc.edu Tue Aug 24 11:49:56 CDT 2004
669 33BM Cu strain Asymmetry
equipment: need Huber with analyzer
Jon Tischler TischlerJZ@ornl.gov Mon Aug 23 17:40:04 CDT 2004
668 33ID Inelastic X-ray scattering
equipment: need K-tek detector
Jon Tischler TischlerJZ@ornl.gov Mon Aug 23 17:32:34 CDT 2004
667 33ID Pulsed Laser Ablation
equipment: usual stuff for PLD (need LeCroy leve adapter)
Jon Tischler TischlerJZ@ornl.gov Mon Aug 23 17:30:09 CDT 2004
666 34ID-E Characterization of whiskers by 3D x-ray microdiffraction
equipment:  
Wenjun Liu wjliu@anl.gov Mon Aug 23 17:11:02 CDT 2004
665 34ID-E Beamline R&D
equipment:  
Wenjun Liu wjliu@anl.gov Mon Aug 23 16:50:07 CDT 2004
664 33BM Diffuse scattering under magnetic field
equipment: Superconducting magnet
Hawoong Hong h-hong@uiuc.edu Mon Aug 23 10:25:41 CDT 2004
663 33ID kinetics in QS Pb island growth
equipment:  
Hawoong Hong h-hong@uiuc.edu Mon Aug 23 10:23:04 CDT 2004
662 33ID USAXS Flow Cell III and Polymer Composites
equipment: USAXS fluid flow cell and interfacing with 33-ID-D computer control required (Pete Jemian needs to be available).
Andrew Allen andrew.allen@nist.gov Sat Aug 21 21:50:37 CDT 2004
661 33BM High temperature phase transformations in the rare earth tantalates, vanadates and phosphates
equipment:  
Waltraud M. Kriven kriven@uiuc.edu Fri Aug 20 14:36:19 CDT 2004
660 34ID-E Growth and microstructure of ZnO nanorods
equipment:  
John Budai budaijd@ornl.gov Fri Aug 20 13:40:33 CDT 2004
659 34ID-C Phase caractherization of industrial samples
equipment: MAR-345 detector
Leonardo Basile lbasile@uiuc.edu Fri Aug 20 11:52:06 CDT 2004
658 34ID-C Phase caractherization of industrial samples
equipment: MAR-345 detector
Leonardo Basile lbasile@uiuc.edu Fri Aug 20 11:51:39 CDT 2004
657 33BM X-ray topography of electronic materials
equipment: digital imaging camera
David Black david.black@nist.gov Fri Aug 20 11:39:46 CDT 2004
656 33ID Quantum size effects in thin film growth
equipment:  
Leonardo Basile lbasile@uiuc.edu Fri Aug 20 11:33:48 CDT 2004
655 33ID Quantum size effects in thin film growth
equipment:  
Leonardo Basile lbasile@uiuc.edu Fri Aug 20 11:32:20 CDT 2004
654 34ID-C Germanium nanowires
equipment: KB mirrors. (Uncoated)
Ian Robinson ikr@uiuc.edu Fri Aug 20 09:03:38 CDT 2004
653 33BM Phase diagrams of refractory metals
equipment: Tilt and rotation stage on top of topography stages. CCD detector.
Eliot Specht spechted@ornl.gov Fri Aug 20 08:27:56 CDT 2004
652 33BM TDS temperature dependence study on Si
equipment: displex, CCD, image plate
Ruqing Xu ruqingxu@uiuc.edu Thu Aug 19 21:01:28 CDT 2004
651 34ID-E Lattice rotation measurement of indented Cu single crystal
equipment:  
Wenge Yang yangw@ornl.gov Thu Aug 19 16:20:14 CDT 2004
650 34ID-E Deformation microstructure study of plastic deformed Cu crystal
equipment:  
Wenge Yang yangw@ornl.gov Thu Aug 19 16:05:26 CDT 2004
649 34ID-E Ex-situ study of nanoindented Cu single crystal
equipment:  
Wenge Yang yangw@ornl.gov Thu Aug 19 15:55:10 CDT 2004
648 34ID-E In-situ study of creep deformation microstructure in Ti alloy
equipment: We will build a creep stage by then.
Wenge Yang yangw@ornl.gov Thu Aug 19 15:43:06 CDT 2004
647 34ID-E In-situ nanoindent measurement in Si
equipment:  
Wenge Yang yangw@ornl.gov Thu Aug 19 15:33:29 CDT 2004
646 33ID Scattering Studies of Block Copolymers and Colloidal Gels
equipment: Temperature Bath
Subramanian Ramakrishnan ramakris@scs.uiuc.edu Mon Aug 16 18:37:38 CDT 2004
645 33BM In Situ catalyst XAFS
equipment:  
George Mickelson george.mickelson@uop.com Mon Aug 16 14:56:44 CDT 2004
644 33BM In Situ catalyst XAFS
equipment:  
George Mickelson george.mickelson Mon Aug 16 14:54:07 CDT 2004
643 33BM In Situ catalyst XAFS
equipment:  
George Mickelson george.mickelson@uop.com Mon Aug 16 14:50:07 CDT 2004
642 33BM Ion correlations in electrostatically condensed biopolymers
equipment: Standard EXAFS equipment.
John Butler jbutler1@uiuc.edu Mon Aug 16 12:15:04 CDT 2004
641 33ID Growth studies of TiN/sapphire films using pulsed laser deposition
equipment: Roper CCD
Peter Czoschke czoschke@mrl.uiuc.edu Mon Aug 16 09:55:42 CDT 2004
640 34ID-E Multiple Differential Aperture
equipment: None
Gene E. Ice IceGE@ornl.gov Mon Aug 16 07:24:49 CDT 2004
639 34ID-E Nanobeam Optics
equipment: Nanopositioning stage (needs to have offset fixed).
Gene Ice IceGE@ornl.gov Mon Aug 16 07:22:33 CDT 2004
638 34ID-E Pseudoelastic materials
equipment:  
Gene Ice IceGE@ornl.gov Mon Aug 16 07:18:39 CDT 2004
637 34ID-E Distribution of Plastic Strain in Deformed Cu
equipment:  
Judy Pang pangj@ornl.gov Thu Aug 12 13:16:41 CDT 2004
636 34ID-E Dependence of Deformation zone size in Al2024 alloy on fatigue conditions
equipment:  
Judy Pang pangj@ornl.gov Thu Aug 12 13:15:06 CDT 2004
635 33BM diffraction of strained Si, etc.
equipment:  
joseph woicik woicik@bnl.gov Thu Aug 12 11:54:07 CDT 2004
634 34ID-E Distribution of strain and dislocation density in Cu single crystal after shock
equipment: None
34ID-E barabashr@ornl.gov Thu Aug 12 09:59:57 CDT 2004
633 34ID-E Local strain in GaN Layers
equipment: Normal microbeam equipment
Rosa Barabash BarabashR@ornl.gov Thu Aug 12 09:35:00 CDT 2004
632 33BM high resolution powder diffraction
equipment:  
Bob Broach robert.broach@uop.com Mon Aug 02 17:45:38 CDT 2004
631 33ID Single Crystal Diffraction
equipment:  
Bob Broach   Mon Aug 02 17:42:10 CDT 2004
630 33ID USAXS of carbon black in PMMA, carbon nanotubes in PMMA, and PCL tissue scaffolds
equipment:  
Gabrielle Long gglong@aps.anl.gov Thu Jul 29 10:56:23 CDT 2004
629 33ID Pore sizes in diesel soot
equipment:  
Tom Watkins watkinstr@ornl.gov Fri Jul 16 16:20:27 CDT 2004
628 33BM Scattering from high Tc materials
equipment: displex will be used to cool samples
paul zschack zschack@anl.gov Fri Jul 02 15:04:41 CDT 2004
627 33ID Beam Line R&D
equipment:  
p zschack zschack@anl.gov Tue May 25 08:36:06 CDT 2004
626 33BM Beam line start up
equipment:  
Karapetrova Evguenia jenia@anl.gov Mon May 24 13:17:55 CDT 2004
625 33ID USAXS Setup
equipment:  
Pete Jemian jemian@uiuc.edu Mon May 24 09:59:03 CDT 2004
624 34ID-E Study of plastic deformation of crept Ti-Al alloy
equipment: Microdiffaction station
Wenge Yang yangw@ornl.gov Thu Apr 29 15:01:46 CDT 2004
623 34ID-E Ex-situ study of plastic deformation under single crystal Cu
equipment: Microdiffaction station
Wenge Yang yangw@ornl.gov Thu Apr 29 14:54:17 CDT 2004
622 34ID-E Evolution of plastic deformation under nanoindented Si
equipment: Microdiffraction station and indentation stage
Wenge Yang yangw@ornl.gov Thu Apr 29 14:42:51 CDT 2004
621 34ID-E Deformation microstructure study of fatigued Al polycrystals
equipment: Microdiffraction station
Wenge Yang yangw@ornl.gov Thu Apr 29 14:33:34 CDT 2004
620 34ID-E In situ nanoindent measurement in Si
equipment: Microdiffraction station and nanoindentation stage
Wenge Yang yangw@ornl.gov Thu Apr 29 14:25:47 CDT 2004
619 34ID-C Energetic Oxides of Silicon and Aluminum
equipment:  
Ross Harder rharder@uiuc.edu Tue Apr 27 17:06:44 CDT 2004
618 34ID-E Diffuse scattering
equipment:  
Paul Zschack zschack@anl.gov Tue Apr 27 12:06:33 CDT 2004
617 34ID-C Fixation of Ag nanocubes using MPT chemistry
equipment: UHV/KB mirrors
Mengning Liang mliang2@uiuc.edu Mon Apr 26 15:16:04 CDT 2004
615 33ID Diffuse scattering from superconducting cuprate
equipment: Displex, Ge detector
Takeshi Egami egami@utk.edu Fri Apr 23 14:16:02 CDT 2004
614 33BM PDF Measurement of Oxides with High Energy X-rays
equipment: Displex, Ge solid state detector
Takeshi Egami egami@utk.edu Fri Apr 23 14:04:04 CDT 2004
613 34ID-C High-resolution Tomography
equipment:  
Christoph Rau rau@anl.gov Thu Apr 22 17:41:00 CDT 2004
612 34ID-E Growth morphology in phase separated Al-Si
equipment:  
John Budai budaijd@ornl.gov Thu Apr 22 13:21:27 CDT 2004
611 33BM Powder diffraction on Gd5Ge1.9Si2Fe0.1
equipment:  
Jenia Karapetrova jenia@anl.gov Thu Apr 22 12:54:12 CDT 2004
610 34ID-E Microstructure of K(Ta,Nb)O3 films
equipment:  
John Budai budaijd@ornl.gov Thu Apr 22 11:38:00 CDT 2004
609 34ID-E Shock in single crystal Cu
equipment:  
Gene E. Ice IceGE@ornl.gov Wed Apr 21 14:29:40 CDT 2004
608 34ID-E Local deformation in Aluminum Bicrystal
equipment:  
Gene E. Ice IceGE@ornl.gov Wed Apr 21 14:25:52 CDT 2004
607 33ID Pulsed Laser Ablation
equipment: usual for laser
Jon Tischler TischlerJZ@ornl.gov Tue Apr 20 17:24:03 CDT 2004
606 33ID Inealastic X-ray Scattering
equipment: K-tek detector
Jon Tischler TischlerJZ@ornl.gov Tue Apr 20 17:00:08 CDT 2004
605 33ID Pulsed Laser Ablation
equipment:  
Jon Tischler TischlerJZ@ornl.gov Tue Apr 20 16:57:08 CDT 2004
604 33BM High resolution imaging and tomography
equipment:  
Christoph Rau rau@anl.gov Tue Apr 20 15:32:18 CDT 2004
603 34ID-C SAXS on self-assembled biological aggregates.
equipment:  
Rob Coridan coridan@uiuc.edu Tue Apr 20 14:03:36 CDT 2004
602 34ID-E Beamline R&D
equipment:  
Wenjun Liu wjliu@anl.gov Tue Apr 20 13:58:22 CDT 2004
601 34ID-E Characterization of grain boundary network by X-ray microdiffraction
equipment:  
Wenjun Liu wjliu@anl.gov Tue Apr 20 10:43:25 CDT 2004
600 34ID-E Diffusion couples
equipment:  
Gene Ice IceGE@ornl.gov Tue Apr 20 10:31:32 CDT 2004
599 34ID-E Characterization of nanobeam mirror
equipment:  
Gene Ice IceGE@ornl.gov Tue Apr 20 10:27:33 CDT 2004
598 34ID-E Sn whisker grain boundaries and strain
equipment:  
Gene Ice IceGE@ornl.gov Tue Apr 20 10:16:01 CDT 2004
597 33BM TDS under high magnetic field
equipment:  
Hawoong Hong h-hong@uiuc.edu Tue Apr 20 09:08:54 CDT 2004
596 34ID-C Filament Twist in F-actin Bundles
equipment:  
Thomas Angelini angelini@uiuc.edu Mon Apr 19 23:57:35 CDT 2004
595 33ID kinetics of island growth under quantum size effect
equipment:  
Hawoong Hong h-hong@uiuc.edu Mon Apr 19 17:08:45 CDT 2004
594 33BM f' and f'' determination of 3d elements in Waspaloy by XAFS measurement
equipment: XAFS
Pete Jemian jemian@uiuc.edu Mon Apr 19 17:04:06 CDT 2004
593 33ID Triple Phase Boundaries in SOFC Materials
equipment:  
Andrew Allen andrew.allen@nist.gov Mon Apr 19 15:22:29 CDT 2004
592 34ID-C Phase contrast imaging of fish-eye lenses
equipment: Microscope
Ian Robinson crecea@uiuc.edu Mon Apr 19 15:02:38 CDT 2004
591 34ID-C Coherent diffraction from Dislocation arrays at GeSi/Si interfaces
equipment: KB mirrors
Yang Da yangda@uiuc.edu Mon Apr 19 14:09:57 CDT 2004
590 33ID Nanoassembly and Nanocomposite Interactions in Flowiing Suspensions
equipment: NIST USAXS Flow Cell
Andrew Allen andrew,allen@nist.gov Mon Apr 19 13:47:57 CDT 2004
589 33ID Microstructure of Responsive Colloidal Fluids
equipment: Temperature bath. If this is not available at UNICAT, we can make arrangements to bring our own.
Prashant Mullick pmullick@scs.uiuc.edu Mon Apr 19 12:35:22 CDT 2004
588 33BM Topography
equipment:  
David Black david.black@nist.gov Mon Apr 19 12:07:58 CDT 2004
587 33BM Topography
equipment:  
David Black david.black@nist.gov Mon Apr 19 12:06:05 CDT 2004
586 33ID Structural Quantum Size Effects in Pb/Si(111)
equipment:  
Peter Czoschke czoschke@mrl.uiuc.edu Mon Apr 19 09:29:21 CDT 2004
585 33BM Phase transitions: real-time powder diffraction
equipment: CCD camera, spot-welder.
Eliot Specht spechted@ornl.gov Mon Apr 19 07:42:28 CDT 2004
584 33ID Quantum Size effects on the growth of thin films
equipment:  
Leonardo Basile lbasile@uiuc.edu Mon Apr 19 01:02:11 CDT 2004
583 34ID-C Effects on annealing on the microstructure of stainless steel
equipment: -Focusing mirrors -No need of vacuum chamber -at least 1/2 day of undulator control
Leonardo Basile lbasile@uiuc.edu Mon Apr 19 00:51:49 CDT 2004
582 33ID Microstructure characterization of high explosives
equipment:  
Jan Ilavsky ilavsky@aps.anl.gov Sun Apr 18 13:59:37 CDT 2004
581 34ID-C Pressure effects on pre-crystallization of ferritin
equipment: The entire 34-ID-C hutch!
Sebastien Boutet boutet@uiuc.edu Sun Apr 18 12:14:27 CDT 2004
580 34ID-C Coherent GISAXS study of Co and Ni thin films on Si
equipment: UHV
Wei Zhang wzhang4@uiuc.edu Sat Apr 17 12:54:38 CDT 2004
579 33BM High temperature phase transformations in the hafnia-tantala system
equipment: None
Waltraud M. Kriven kriven@uiuc.edu Fri Apr 16 14:56:09 CDT 2004
578 34ID-C Resonant GISAXS measurements of Quantum Dot arrays
equipment: KB Mirrors (uncoated) and Newport diffractometer
Ian Robinson ikr@uiuc.edu Fri Apr 16 14:33:33 CDT 2004
577 34ID-C Microscopy of sedimentation for Nanocubes
equipment: X-ray microscope
Ian Robinson ikr@uiuc.edu Fri Apr 16 14:25:49 CDT 2004
576 33ID Nanoparticle Halos: A New Stabilization Mechanism and Temperature Induced Gelation of COlloidal Suspensions
equipment: I definitely need a temperature bath for heating and cooling.
Subramanian Ramakrishnan ramakris@scs.uiuc.edu Fri Apr 16 08:33:48 CDT 2004
575 Nanoparticle Halos: A New Stabilization Mechanism and Temperature Induced Gelation of COlloidal Suspensions
equipment: I definitely need a temperature bath for heating and cooling.
Subramanian Ramakrishnan ramakris@scs.uiuc.edu Fri Apr 16 08:33:16 CDT 2004
574 33BM TDS temperature dependence study on Si
equipment: displex, CCD
Ruqing Xu ruqingxu@uiuc.edu Thu Apr 15 00:41:36 CDT 2004
573 33BM Investigation of inter-ion correlations in condensed polyelectrolyte systems
equipment: Typical EXAFS experimental equipment.
John Butler (experimenter) Gerard Wong (PI) jbutler1@uiuc.edu Wed Apr 14 16:38:15 CDT 2004
572 34ID-E Effects of grain boundary structure on deformation micromechanics
equipment:  
Judy Pang pangj@ornl.gov Tue Apr 13 16:55:09 CDT 2004
571 34ID-E Dependence of Deformation zone size in Al2024 alloy on fatigue conditions
equipment:  
Judy Pang pangj@ornl.gov Tue Apr 13 16:51:10 CDT 2004
570 33BM Noise study on the XAFS
equipment:  
Karapetrova Evguenia jenia@anl.gov Mon Apr 12 11:55:24 CDT 2004
569 33BM Operando catalyst XAFS
equipment:  
Simon Bare Simon.Bare@uop.com Thu Apr 01 10:16:05 CST 2004
568 34ID-E SXAFS, XRD, and PLD study of Hilarium Crystallization
equipment: SXAFS, XRD, & PLD CCD (the good one) temperature control to 0.001 degree We have no experience with X-rays. We have no formal education past the 2nd grade. We may need some assistance to reach the equipment since we have no hands.
Larry the Cucumber larry@hilarium-studies.org Thu Apr 01 07:31:55 CST 2004
567 SXAFS, XRD, and PLD study of Hilarium Crystallization
equipment: SXAFS, XRD, & PLD CCD (the good one) temperature control to 0.001 degree We have no experience with X-rays. We have no formal education past the 2nd grade. We may need some assistance to reach the equipment since we have no hands.
Larry the Cucumber larry@hilarium-studies.org Thu Apr 01 07:30:46 CST 2004
566 SXAFS, XRD, and PLD study of Hilarium Crystallization
equipment: SXAFS, XRD, & PLD CCD (the good one) temperature control to 0.001 degree We have no experience with X-rays. We have no formal education past the 2nd grade. We may need some assistance to reach the equipment since we have no hands.
Larry the Cucumber larry@hilarium-studies.org Thu Apr 01 07:27:58 CST 2004
565 SXAFS, XRD, & PLD study of Hilarium Crystallization
equipment: SXAFS, XRD, & PLD CCD (the good one) temperature control to 0.001 degree We have no experience with X-rays. We have no formal education past the 2nd grade. We may need some assistance to reach the equipment since we have no hands.
Larry the Cucumber larry@hilarium-studies.org Thu Apr 01 07:27:38 CST 2004
564 SXAFS, XRD, & PLD study of Hilarium Crystallization
equipment: SXAFS, XRD, & PLD CCD (the good one) temperature control to 0.001 degree We have no experience with X-rays. We have no formal education past the 2nd grade. We may need some assistance to reach the equipment since we have no hands.
Larry the Cucumber larry@hilarium-studies.org Thu Apr 01 07:27:12 CST 2004
563 33BM diffraction of strained Si on SiO2 and Si on SiGe and BaSrTiO3/SrTiO3 on Si
equipment:  
joseph woicik woicik@bnl.gov Sun Mar 28 18:29:27 CST 2004
562 33ID Anomalous scattering from inert gases
equipment:  
P Zschack zschack@anl.gov Thu Mar 25 13:15:41 CST 2004
561 33ID A-USAXS of Waspaloy with new USAXS optics
equipment:  
Pete Jemian jemian@uiuc.edu Mon Mar 22 15:04:18 CST 2004
560 34ID-C Proteins under high pressure
equipment:  
Sebastien Boutet boutet@uiuc.edu Fri Mar 19 16:45:20 CST 2004
559 33BM Absorption spectrum from Waspaloy
equipment:  
Pete Jemian jemian@top Fri Mar 19 14:10:34 CST 2004
558 structure studies of microporous materials
equipment:  
Bob Broach robert.broach@uop.com Wed Mar 17 10:56:03 CST 2004
557 High resolution powder diffraction
equipment:  
Bob Broach robert.broach@uop.com Wed Mar 17 10:53:32 CST 2004
556 33BM XAFS scan of Waspaloy
equipment:  
Karapetrova Evguenia jenia@anl.gov Wed Mar 17 09:43:53 CST 2004
555 33ID Structure of Superconducting Watery Cobaltate
equipment: displex, Ge detector
Takeshi Egami egami@utk.edu Wed Mar 17 09:28:29 CST 2004
554 34ID-E Texture in thick high Tc Superconducting RABiTS Films
equipment:  
Amit Goyal GoyalA@ornl.gov Thu Mar 11 12:26:42 CST 2004
553 33BM Beam study
equipment:  
Jenia Karapetrova jenia@anl.gov Wed Feb 11 12:38:41 CST 2004
552 Com. for 33bm
equipment:  
paul zschack@anl.gov Thu Jan 29 10:20:32 CST 2004
551 startup commissioning
equipment:  
zschack zschack@anl.gov Thu Jan 29 08:26:30 CST 2004
550 33BM Structural studies on a geometrically frustrated magnet ZnV2O4
equipment: Displex
Seunghun Lee shl@nist.gov Thu Jan 22 09:39:42 CST 2004
549 34ID-E In-situ measurement of phase transformation and plastic/elastic strain in nanoindented Si
equipment:  
Wenge Yang yangw@ornl.gov Fri Dec 19 15:49:10 CST 2003
548 34ID-E Local lattice rotation of Si substract around a Ni dot
equipment:  
Wenge Yang yangw@ornl.gov Fri Dec 19 15:40:53 CST 2003
547 34ID-E Elastic strain measurement under microindented Al2O3 single crystal in-situ and ex-situ
equipment:  
Wenge Yang yangw@ornl.gov Fri Dec 19 15:32:03 CST 2003
546 34ID-E In-situ nanoindentation setup and test
equipment:  
Wenge Yang yangw@ornl.gov Fri Dec 19 15:26:44 CST 2003
545 34ID-E Plastic deformation microstructure of (110) indented Cu
equipment:  
Wenge Yang yangw@ornl.gov Fri Dec 19 15:19:52 CST 2003
544 34ID-E Sn and Zn whiskers
equipment:  
Gene E. Ice IceGE@ornl.gov Fri Dec 19 07:55:40 CST 2003
543 34ID-E Microbeam/nanobeam optics
equipment:  
Gene E. Ice IceGE@ornl.gov Fri Dec 19 07:41:21 CST 2003
542 34ID-C Pressure effects on small crystals
equipment:  
Sebastien Boutet boutet@uiuc,edu Wed Dec 17 12:14:21 CST 2003
541 33BM Collimation of the 33BM mirrir
equipment:  
Karapetrova Jenia jenia@anl.gov 2-0865 Mon Dec 15 12:58:26 CST 2003
540 34ID-E FILAMENT TWIST IN F-ACTIN BUNDLES
equipment:  
Tommy Angelini angelini@uiuc.edu Fri Dec 12 16:29:38 CST 2003
539 33BM Local Atomic Structure of Electro-catalysts for Fuel Cell Applications
equipment:  
Takeshi Egami egami@utk.edu Fri Dec 12 15:39:06 CST 2003
538 34ID-C Surface nucleated melting of Pb nancrystals
equipment: UHV equipment in CXD hutch
Mark Pfeifer mapfeife@uiuc.edu Fri Dec 12 12:45:07 CST 2003
537 34ID-E Deformation microstructure of Fatigued and indented Cu crystals
equipment:  
Wenge Yang yangw@ornl.gov Thu Dec 11 10:23:42 CST 2003
536 34ID-C X-ray diffraction on Cu
equipment:  
Yang Da yangda@uiuc.edu Wed Dec 10 16:16:23 CST 2003
535 34ID-E Crack propagation of Al/Al2O3 composite
equipment:  
Judy Pang pangj@ornl.gov Wed Dec 10 15:03:34 CST 2003
534 33ID USAXS imaging from metals, polymers, ceramics, and biological materials
equipment: High-resolution imaging camera
Lyle Levine Lyle.Levine@nist.gov Wed Dec 10 09:24:17 CST 2003
533 34ID-C Dislocations in GeSi thin films
equipment: Mirror setup is needed
Ian Robinson ikr@uiuc.edu Tue Dec 09 12:52:37 CST 2003
532 34ID-C Nanocrystal deformations under high pressure
equipment: Mirror setup is needed
Meng Liang ikr@uiuc.edu Tue Dec 09 12:47:00 CST 2003
531 34ID-C Nanocrystal deformations under high pressure
equipment: Mirror setup is needed
Meng Liang ikr@uiuc.edu Tue Dec 09 12:46:55 CST 2003
530 33ID Pulsed Laser Ablation
equipment: Detector (probably Ktek) from detector pool and backscattering analyzer
Jon Tischler TischlerJZ@ornl.gov Mon Dec 08 09:45:10 CST 2003
529 33ID Pulsed Laser Ablation
equipment: Laser stuff
Jon Tischler TischlerJZ@ornl.gov Mon Dec 08 09:41:13 CST 2003
528 34ID-C Coherent Diffractive Imaging of Dosed Pb Nanocrystals
equipment: 34ID-C UHV chamber
G. Williams gjwillms@uiuc.edu Mon Dec 08 08:08:34 CST 2003
527 34ID-C In Situ Characterization fo UHV deposition of metals
equipment:  
Wei Zhang wzhang4@uiuc.edu Sun Dec 07 22:54:05 CST 2003
526 Thermal diffuse scattering under Magnetic field
equipment:  
Ruqing Xu ruqingxu@uiuc.edu Sun Dec 07 21:19:40 CST 2003
525 33ID Kinetics of Pb island growth on Si
equipment:  
Hawoong Hong h-hong@uiuc.edu Sun Dec 07 20:00:21 CST 2003
524 34ID-E Domain formation and strain in K(Nb,Ta)O3 films
equipment:  
John Budai budaijd@ornl.gov Sun Dec 07 16:25:48 CST 2003
523 33BM Phase Transformations in Ultra-high Temperature Ceramics
equipment:  
Waltraud M. Kriven kriven@uiuc.edu Sun Dec 07 15:49:05 CST 2003
522 33BM In situ Studies of Thermal Expansion of Doped Mullite Ceramics to 1800C
equipment: Huber 4 circle diffractometer
Waltraud M. Kriven kriven@uiuc.edu Sun Dec 07 15:35:01 CST 2003
521 33ID Quantum Size Effects in thin film growth
equipment:  
Leonardo Basile lbasile@uiuc.edu Sun Dec 07 01:20:31 CST 2003
520 33BM Microtomography with two dimensional collimated beam at 33BM
equipment:  
Christoph Rau rau@anl.gov Sat Dec 06 17:51:34 CST 2003
519 33BM Crystal structure analysis at low temperature of Gd5Ge2Si2 based alloys
equipment: Displex (for temperature ~250 K)
Michael Lufaso (collaboration with Robert Shull, Virgil Provenzano) michael.lufaso@nist.gov Sat Dec 06 15:24:10 CST 2003
518 33ID A-USAXS study: commercial silicon nitride
equipment:  
Pete Jemian jemian@uiuc.edu Fri Dec 05 23:51:32 CST 2003
517 33ID USAXS study: carbon black mass fractal aggregates
equipment:  
Tom Rieker - NSF trieker@nsf.gov Fri Dec 05 23:40:32 CST 2003
516 34ID-C Effects of annealing on the microstructure of stainless steel.
equipment: CCD roper, image plate MAR 345. Focusing mirrors.
Leonardo Basile lbasile@uiuc.edu Fri Dec 05 22:39:37 CST 2003
515 33BM EXAFS Studies of SOFC Cathode and Electrolyte Materials
equipment:  
Andrew Allen andrew.allen@nist.gov Fri Dec 05 17:27:24 CST 2003
514 33BM diffraction/dafs
equipment:  
Joseph Woicik woicik@anl.gov Fri Dec 05 17:25:29 CST 2003
513 33BM diffraction of strained films
equipment:  
Joseph Woicik woicik@anl.gov Fri Dec 05 17:23:12 CST 2003
512 33BM exafs of thin films
equipment:  
Joseph Woicik woicik@anl.gov Fri Dec 05 17:20:50 CST 2003
511 33ID In-Situ USAXS Studies of Flowing Suspensions.
equipment: Interfacing of pump, probes etc with epix control computers
Andrew Allen andrew.allen@nist.gov Fri Dec 05 17:14:35 CST 2003
510 33BM Crystallization and decomposition
equipment: Spot welder, CCD x-ray camera, and telescopic level. Up to 10 cylinders of He. One experiment (high temperature) will run on the 33BM-C Huber at 24 keV (below Pd K edge), the other (combinatorial analysis) will run on the 33BM-B topography stages at 12 keV; we will need multiple stages for aligning and rastering the sample as before.
Eliot Specht spechted@ornl.gov Fri Dec 05 13:50:32 CST 2003
509 33BM EXAFS of catalysts
equipment: Standard EXAFS equipment
Simon Bare simon.bare@uop.com Fri Dec 05 09:57:57 CST 2003
508 33BM topography
equipment: none
David Black david.black@nist.gov Thu Dec 04 13:12:26 CST 2003
507 33BM Evaluation of Wolter I optics
equipment: Huber plus table for CCD camera from Yong Chu
Mel Ulmer m-ulmer2@northwestern.edu Wed Nov 26 15:23:14 CST 2003
506 33ID Nano-imaging and tomography
equipment: - KB mirror (I. Robinson) - Apogee camera
Christoph Rau rau@anl.gov Tue Nov 25 17:16:00 CST 2003
505 33ID Small angle studies of gels
equipment: USAXS heater
Jan Ilavsky ilavsky@aps.anl.gov Tue Nov 25 14:45:49 CST 2003
504 33BM In-situ high temperature thermal expansion studies of metal-ion doped mullites.
equipment: None
Prof. Waltraud M. Kriven kriven.uiuc.edu Mon Nov 24 16:56:32 CST 2003
503 33BM Investigation of inter-ion correlations in condensed polyelectrolyte systems
equipment: Typical EXAFS experimental equipment.
Gerard Wong (PI) and John Butler gclwong@uiuc.edu jbutler1@uiuc.edu Thu Nov 20 12:12:06 CST 2003
502 33BM High resolution powder diffraction
equipment:  
Bob Broach robert.broach@uop.com Fri Nov 14 11:19:55 CST 2003
501 33ID test of beamtime request
equipment:  
another test jemian@top Mon Nov 03 18:23:55 CST 2003
500   Deformation microstructure study of indented Cu
equipment: 34 IDE microdiffraction station
Wenge Yang yangw@ornl.gov Mon Nov 03 14:39:21 CST 2003
499    
equipment:  
    Mon Nov 03 14:30:31 CST 2003
488 33BM Crystal Change
equipment:  
UNICAT STAFF zschack@anl.gov Thu Oct 02 14:01:19 CDT 2003
487 33BM Crystal Change
equipment:  
UNICAT Staff zschack@anl.gov Thu Oct 02 13:53:24 CDT 2003
486 34ID  
equipment:  
Paul Zschack zschack@anl.gov Fri Sep 26 11:02:05 CDT 2003
485 34ID Microbeam optics study
equipment:  
Gene Ice IceGE@ornl.gov Wed Sep 17 07:33:01 CDT 2003
484 34ID Survey of Engineering samples
equipment:  
Gene Ice IceGE@ornl.gov Wed Sep 17 07:19:30 CDT 2003
483 34ID Nanobeam focusing
equipment:  
Gene Ice IceGE@ornl.gov Wed Sep 17 07:14:52 CDT 2003
482 34ID Measurement of SiN films on SiC Single crystals
equipment:  
Rosa Barabash BarabashR@ornl.gov Wed Sep 17 07:11:26 CDT 2003
481 34ID Strain and Morphology of Sn Whiskers
equipment: Normal 34-ID optics
Gene E. Ice IceGE@ornl.gov Wed Sep 17 07:06:28 CDT 2003
480 34ID Microdiffraction of indented Cu single crystals
equipment: microbeam station 34 IDE
Wenge Yang yangw@ornl.gov Mon Sep 15 16:38:54 CDT 2003
479 34ID X-ray microdiffraction on Ti alloys
equipment: Microbeam station 34 IDE and micro-monochromator 34 ID-D
Wenge Yang yangw@ornl.gov Mon Sep 15 16:27:29 CDT 2003
478 33BM xafs
equipment:  
Laurent Menard lmenard@uiuc.edu Fri Sep 05 09:35:03 CDT 2003
477 33ID USAXS setup and calibration standard measurements
equipment:  
Jan Ilavsky, Pete Jemian 20866 Tue Sep 02 13:45:28 CDT 2003
476 34ID Align monochromator
equipment:  
Ian Robinson ikr@uiuc.edu Fri Aug 29 17:54:56 CDT 2003
475 34ID FILAMENT TWIST IN F-ACTIN BUNDLES
equipment:  
Tommy Angelini angelini@uiuc.edu Fri Aug 29 15:35:04 CDT 2003
474 34ID Load partition across the crack region of composite
equipment:  
Judy Pang pangj@ornl.gov Fri Aug 29 12:46:30 CDT 2003
473 34ID Effects of grain boundary structure on the micromechanics of deformation in Ni
equipment:  
Judy Pang pangj@ornl.gov Fri Aug 29 12:43:57 CDT 2003
472 34ID Stabilization of Ag Nanocrystals
equipment: KB mirrors.
Ian Robinson ikr@uiuc.edu Fri Aug 29 12:10:58 CDT 2003
471 34ID Microstructure of Damascene Nanowires
equipment: KB mirrors.
Ian Robinson ikr@uiuc.edu Fri Aug 29 11:58:09 CDT 2003
470 34ID Wulf plot determination of Pb equillibrium shapes by coherent diffraction
equipment:  
Mark Pfeifer mapfeife@uiuc.edu Fri Aug 29 10:45:01 CDT 2003
469 34ID Coherent Diffactive Imaging of Pb Nanocrystals
equipment:  
Garth Williams gjwillms@uiuc.edu Fri Aug 29 10:42:22 CDT 2003
468 34ID microbeam diffraction
equipment:  
Wenjun Liu wjliu@anl.gov Wed Aug 27 16:17:19 CDT 2003
467 34ID Beamline R&D
equipment:  
Wenjun Liu wjliu@anl.gov Wed Aug 27 16:09:38 CDT 2003
466 33ID RSXD study of Quantum well system growth
equipment:  
Hawoong Hong h-hong@uiuc.edu Mon Aug 25 09:12:09 CDT 2003
465 33BM TDS at Low temperature and High Magnetic field
equipment: Superconducting Magnet
Hawoong Hong h-hong@uiuc.edu Mon Aug 25 09:06:27 CDT 2003
464 33BM Study of Temperature dependence of TDS
equipment: displex, CCD, image plate
Ruqing Xu ruqingxu@uiuc.edu Sun Aug 24 22:36:43 CDT 2003
463 33ID Quantum Size Effects in Pb/Si
equipment:  
Peter Czoschke czoschke@mrl.uiuc.edu Sun Aug 24 19:32:11 CDT 2003
462 33ID Growth of Ag overlayers on Ge(111) at low temperature
equipment:  
Leonardo Basile lbasile@uiuc.edu Sun Aug 24 18:08:22 CDT 2003
461 33BM In-situ high temperature phase transformations in dysprosium titanate
equipment: Water chiller
Waltraud Kriven kriven@uiuc.edu Sun Aug 24 15:31:24 CDT 2003
460 33BM Transition metal-ion doped mullite studies
equipment: Water chiller
Waltraud Kriven kriven@uiuc.edu Sun Aug 24 15:26:17 CDT 2003
459 33BM Evaluation of a 2-D detector for in-situ hgih temperature synchrotron studies
equipment: 2-D image plate detector
Waltraud M. Kriven kriven@uiuc.edu Sun Aug 24 15:20:43 CDT 2003
458 33BM Spectroelectrochemistry of Re
equipment: Standard EXAFS equipment
Simon Bare simon.bare@uop.com Sun Aug 24 04:32:53 CDT 2003
457 33BM In situ EXAFS of catalysts
equipment: Standard EXAFS equipment
Simon Bare simon.bare@uop.com Sun Aug 24 04:30:01 CDT 2003
456 33ID Anomalous USAXS investigation of Ni-base superalloys
equipment: USAXS
Pete Jemian 2-0863 Sun Aug 24 01:51:30 CDT 2003
455 33BM Phase transformations in steel
equipment: Resistive sample heater can mount on large Huber. CCD detector. Spot welder for thermocouples.
Eliot Specht spechted@ornl.gov Sat Aug 23 13:09:13 CDT 2003
454 33ID Pulsed Laser Ablation
equipment: ususal stuff for the PLD, also probably the CCD
Jon Tischler TischlerJZ@ornl.gov Fri Aug 22 17:18:08 CDT 2003
453 33ID Inealastic X-ray Scattering
equipment: Inelastic analyzer
Jon Tischler TischlerJZ@ornl.gov Fri Aug 22 17:16:05 CDT 2003
452 34ID Coherent diffraction on biological crystals
equipment:  
Sebastien Boutet boutet@uiuc.edu Fri Aug 22 14:12:33 CDT 2003
451 34ID Grain Boundary Motions in Bulk Aluminum
equipment:  
John Budai budaijd@ornl.gov Fri Aug 22 13:15:21 CDT 2003
450 33BM x-ray topography
equipment:  
David Black david.black@nist.gov Fri Aug 22 11:42:41 CDT 2003
449 33ID Studies of complex ceramic layers
equipment:  
Jan Ilavsky ilavsky@aps.anl.gov Fri Aug 22 11:14:09 CDT 2003
448 33ID USAXS imaging of human and artificial tissues
equipment: no additional
Gabrielle Long gabrielle.long@nist.gov Fri Aug 22 10:37:46 CDT 2003
447 33BM Evaluation of Wolter I optics
equipment: Huber plus table for CCD camera from Yong Chu
Ulmer m-ulmer2@northwestern.edu Fri Aug 22 08:12:15 CDT 2003
446 33BM Evaluation of Wolter I optics
equipment: Huber plus table for CCD camera from Yong Chu
Ulmer m-ulmer2@northwestern.edu Fri Aug 22 08:11:14 CDT 2003
445 33ID Microcrystal Diffraction of Microporous Materials
equipment: Bruker Smart CCD system
Bob Broach robert.broach@uop.com Wed Aug 20 14:39:29 CDT 2003
444 33BM Powder Diffraction of Zeolites
equipment:  
Bob Broach robert.broach@uop.com Wed Aug 20 14:34:42 CDT 2003
443 33BM DAFS of BaTiO3/SrTiO3/SrTiO3 superlattices
equipment: Eventually, this experiment will require the use of the displex with the diffractometer. But, not the first time due to the complexity of the experiment.
Joseph Woicik woicik@anl.gov Wed Aug 20 12:06:35 CDT 2003
442 33BM DAFS of BaTiO3/SrTiO3/SrTiO3 superlattices
equipment: Eventually, this experiment will require the use of the displex with the diffractometer. But, not the first time due to the complexity of the experiment.
Joseph Woicik woicik@anl.gov Wed Aug 20 12:05:49 CDT 2003
441 33BM EXAFS of LaAlO3 films on Si
equipment:  
Joseph Woicik woicik@anl.gov Wed Aug 20 12:00:46 CDT 2003
440 33BM EXAFS of Ca(ZrTi)O3
equipment:  
Joseph Woicik woicik@anl.gov Wed Aug 20 11:57:35 CDT 2003
439 33BM TDS
equipment: displex
Hawoong Hong h-hong@uiuc.edu Mon Aug 18 15:22:57 CDT 2003
438 33ID Testing a hard X-ray microscope for nano-imaging
equipment:  
Christoph Rau rau@anl.gov Fri Aug 15 20:01:33 CDT 2003
437 33BM Tomography with micrometer resolution: Study of silicon dioxide micro-spheres
equipment:  
Christoph Rau rau@anl.gov Fri Aug 15 19:51:12 CDT 2003
436 33ID Structure of Superconducting Watery Cobaltate
equipment: Displex, Ge detector or equivalent.
Takeshi Egami egami@utk.edu Fri Aug 15 14:12:52 CDT 2003
435 34ID In-situ Characterization of Au polycrystalline growth
equipment:  
Wei Zhang wzhang4@uiuc.edu Thu Aug 14 19:34:03 CDT 2003
434 33ID In-situ USAXS studies of nanoparticle suspensions
equipment: RS232 interfacing for several components. Discussions with Pete Jemian underway.
Andrew Allen andrew.allen@nist.gov Thu Aug 14 15:33:36 CDT 2003
433 33ID Various USAXS measurements
equipment:  
Jan Ilavsky, Pete Jemian 20866 Wed Aug 13 15:10:07 CDT 2003
432 34ID microdiffraction
equipment:  
Wenjun Liu wjliu@anl.gov Wed Aug 13 11:43:58 CDT 2003
431 33ID test: revised summary algorithm
equipment:  
P Jemian 2-0863 Wed Aug 13 07:39:09 CDT 2003
430 33ID test of summary file: beamtimeReqSummary.html
equipment:  
Pete Jemian jemian@uiuc.edu Tue Aug 12 22:54:48 CDT 2003
429 33ID N/X School USAXS
equipment: USAXS
Pete Jemian jemian@uiuc.edu Mon Aug 11 14:44:19 CDT 2003
428 33BM Testing of a high-precision hard X-ray tomograph
equipment:  
CHristoph Rau   Sat Aug 09 13:05:25 CDT 2003
427 33ID Please description below for all 4 projects
equipment: SB-USAXS
S. Ramakrishnan ramakris@scs.uiuc.edu, 217-244-8358 Thu Jul 31 15:53:37 CDT 2003
426 33ID anomalous scattering
equipment:  
p zschack   Wed Jul 30 09:17:32 CDT 2003
425 33BM Testing of a high-precision hard X-ray tomograph
equipment:  
Christoph Rau rau@anl.gov Tue Jul 08 17:53:41 CDT 2003
424 33ID USAXS study of precipitation in Ni-based superalloy
equipment: USAXS
Pete Jemian jemian@uiuc.edu Tue Jun 03 11:34:23 CDT 2003
423 33ID Short-range order inhomogeneities in magnetically annealed FeNi alloys
equipment: Newport Kappa diffractometer
Gene Ice IceGE@ornl.gov Mon Jun 02 10:17:48 CDT 2003
422 33BM diffraction of oxide films
equipment:  
joseph woicik woicik@anl.gov Wed May 28 15:24:43 CDT 2003
421 33BM Diffraction
equipment:  
Paul Zschack zschack@anl.gov Wed May 28 09:32:34 CDT 2003
420 33BM Studies
equipment:  
Unicat Staff 0868 Wed May 28 09:20:51 CDT 2003
419 34ID Beamline Studies
equipment:  
Curtis Benson cabenson@uiuc.edu Tue May 27 12:30:59 CDT 2003
418 33ID Calibration of CCD camera
equipment:  
Jon Tischler TischlerJZ@ornl.gov Tue May 27 11:17:54 CDT 2003
417 33ID operations
equipment:  
zschack zschack Thu May 22 11:35:05 CDT 2003
416 33ID Radiation induced defects in Single Crystals
equipment:  
Gene Ice IceGE@ornl.gov Tue May 20 08:10:20 CDT 2003
415 33ID another test of form processing software
equipment:  
Pete jemian@anl.gov Fri Apr 18 15:38:51 CDT 2003
414 33ID test of WWW form software
equipment:  
Pete Jemian prjemian@ameritech.net Wed Apr 16 20:35:00 CDT 2003
413 33BM install software to control DCM%26mirrors
equipment:  
Pete Jemian jemian@uiuc.edu Tue Apr 08 16:58:23 CDT 2003
412 33BM XAFS study of catalysts
equipment:  
Simon Bare simon.bare@uop.com Thu Mar 27 23:40:29 CST 2003
411 33BM Studies
equipment:  
Pete Jemian jemian@uiuc.edu Mon Mar 24 12:38:52 CST 2003
410 33ID Pulsed Laser Deposition
equipment:  
Jon Tischler TischlerJZ@ornl.gov Mon Mar 24 11:01:11 CST 2003
409 33ID Inelastic X-ray Scattering
equipment:  
Jon Tischler TischlerJZ@ornl.gov Mon Mar 24 10:58:35 CST 2003
408 33BM Calibrate CCD
equipment:  
Jon Tischler TischlerJZ@ornl.gov Mon Mar 24 10:53:58 CST 2003
407 34ID Cu damascene microstructure
equipment:  
Ian Robinson ikr@uiuc.edu Wed Mar 19 15:30:20 CST 2003
406 34ID Silver and Gold nanocrystals
equipment:  
Franz Pfeiffer franzpfeiffer@web.de Wed Mar 19 15:23:36 CST 2003
405 34ID Dislocations in GeSi thin films
equipment:  
Ian Robinson ikr@uiuc.edu Wed Mar 19 14:37:06 CST 2003
404 34ID Ferritin crystallization
equipment:  
Sebastien Boutet boutet@uiuc.edu Wed Mar 19 13:06:23 CST 2003
403 34ID Fluctuation on Au(111) Surface
equipment:  
WEI ZHANG wzhang4@uiuc.edu Wed Mar 19 12:49:24 CST 2003
402 34ID Surface Melting on Pb Nanostructures
equipment:  
M. Pfeifer mapfeife@uiuc.edu Wed Mar 19 11:22:25 CST 2003
401 34ID Eqiulibrium Crystal Shape of Pb Nanocrystals on Si
equipment:  
G. Williams gjwillms@uiuc.edu Wed Mar 19 11:16:29 CST 2003
400 34ID Strain and Deformation in Crept Ti
equipment:  
Wenge Yang yangw@ornl.gov Tue Mar 18 14:48:02 CST 2003
399 34ID Strain/fracture/deformation in thin Si
equipment:  
Ben Larson bcl@ornl.gov Tue Mar 18 14:41:08 CST 2003
398 34ID Nanoindent Deformation Investigation
equipment:  
Wenge Yang yangw@ornl.gov Tue Mar 18 14:18:49 CST 2003
397 34ID Electromigration in Metal Interconnects
equipment:  
Ben Larson bcl@ornl.gov Tue Mar 18 13:42:40 CST 2003
396 33ID Time-resolved study of islands growth
equipment:  
Hawoong Hong h-hong@uiuc.edu Tue Mar 18 10:22:11 CST 2003
395 34ID diffraction and scattering from micron-sized crystals
equipment:  
Hawoong Hong h-hong@uiuc.edu Tue Mar 18 10:11:45 CST 2003
394 33BM In-situ, high-temperature phase transformations in tantala, mullite and calcium phosphatesM
equipment:  
Waltraud M. Kriven w-kriven@uiuc.edu Mon Mar 17 17:02:00 CST 2003
393 33BM In situ, high temperature phase transformation studies in lanthanide niobates and titanates
equipment:  
Waltraud M. Kriven w-kriven@uiuc.edu Mon Mar 17 16:47:04 CST 2003
392 33BM Sorting out computer bugs
equipment:  
joseph woicik woicik@anl.gov Mon Mar 17 16:26:36 CST 2003
391 34ID the TDS study on Cr and MgB2 crystals
equipment:  
Ruqing Xu ruqingxu@uiuc.edu Mon Mar 17 16:14:21 CST 2003
390 33ID Quantum Size Effects in Pb/Si(111)
equipment:  
Peter Czoschke czoschke@mrl.uiuc.edu Mon Mar 17 13:03:47 CST 2003
389 33ID Phase Transitions in Temperature Sensitive Colloidal Suspensions
equipment:  
Prashant Mullick pmullick@scs.uiuc.edu Mon Mar 17 10:55:29 CST 2003
388 33ID Texture studies on USAXS table
equipment:  
Jan Ilavsky ilavsky@aps.anl.gov Mon Mar 17 10:48:21 CST 2003
387 33BM High resolution diffraction investigation of hydride phase transformations in epitaxial Nb
equipment:  
Brent Heuser bheuser@uiuc.edu Mon Mar 17 10:25:02 CST 2003
386 33ID Ag film growth on Ge(111) at low temperature
equipment:  
Leonardo Basile/ T. -C. Chiang lbasile@uiuc.edu Mon Mar 17 09:40:43 CST 2003
385 33ID Charge inhomogeniety in the cuprates
equipment:  
Takeshi Egami egami@seas.upenn.edu Sun Mar 16 16:21:38 CST 2003
384 33ID Anisotropic USAXS studies on new Thermal Barrier Coating Chemistries and Solid Oxide Fuel Cell Layers
equipment:  
Jan Ilavsky ilavsky@aps.anl.gov Sun Mar 16 09:44:30 CST 2003
383 33BM Combinatorial Analysis
equipment:  
Eliot Specht spechted@ornl.gov Fri Mar 14 15:59:03 CST 2003
382 34ID Load partitioning in Ni g/g' single crystal under load
equipment:  
Judy Pang pangj@ornl.gov Fri Mar 14 14:23:28 CST 2003
381 34ID In-situ measurements of local deformation features in polycrystalline Ni
equipment:  
Judy Pang pangj@ornl.gov Fri Mar 14 14:19:50 CST 2003
380 33BM Gas sorption mechanisms of modified molecular sieve
equipment:  
Joseph Woicik woicik@anl.gov Fri Mar 14 13:07:58 CST 2003
379 33BM Magnetism in Spintronics
equipment:  
Joseph Woicik woicik@anl.gov Fri Mar 14 13:03:55 CST 2003
378 34ID Filament Twist in F-actin Bundles
equipment:  
Thomas Angelini angelini@uiuc.edu Fri Mar 14 11:53:07 CST 2003
377 34ID Grain-boundary mapping
equipment:  
Gene E. Ice IceGE@ornl.gov Thu Mar 13 19:07:20 CST 2003
376 34ID Second phase in ultrasonically joined material
equipment:  
Gene E. Ice IceGE@ornl.gov Thu Mar 13 19:03:16 CST 2003
375 33ID Grain structure of friction stir welds
equipment:  
Gene E. Ice IceGE@ornl.gov Thu Mar 13 18:58:06 CST 2003
374 34ID Strain Distributions Near Tn Whiskers
equipment:  
Gene E. Ice IceGE@ornl.gov Thu Mar 13 18:46:24 CST 2003
373 33ID Microstructure of Gels
equipment:  
Subramanian Ramakrishnan ramakris@scs.uiuc.edu Wed Mar 12 09:17:59 CST 2003
372 34ID Three dimensional grain growth
equipment:  
John Budai xry@ornl.gov Tue Mar 11 10:37:12 CST 2003
371 33ID USAXS studies
equipment:  
Jan Ilavsky ilavsky@aps.anl.gov Fri Mar 07 15:42:04 CST 2003
370 33BM Charaterizing a Wolter I Mirror
equipment:  
Mel Ulmer Badge #85333 m-ulmer2@northwestern.edu Thu Mar 06 15:10:09 CST 2003
369 33ID USAXS imaging and spectroscopy of human and man-made tissues
equipment:  
Gabrielle Long gabrielle.long@nist.gov Thu Mar 06 11:42:55 CST 2003
368 33BM high resolution powder diffraction
equipment:  
Bob Broach robert.broach@uop.com Wed Mar 05 11:56:01 CST 2003
367 33BM debugging StarNet X-Win32 with MEDM
equipment:  
Pete Jemian jemian@uiuc.edu Fri Feb 21 11:25:38 CST 2003
366 33BM 33BM beamline R%26D
equipment:  
Evguenia Karapetrova 2-0865 Wed Feb 19 17:08:14 CST 2003
365 33BM Multi-Sample Reactor for In Situ XRD Characterization of Zeolite Synthesis Gels
equipment:  
Bob Broach robert.broach@uop.com Tue Feb 18 14:35:28 CST 2003
364 33ID USAXS Setup
equipment:  
UNICAT fredericks@anl.gov Mon Jan 13 13:55:58 CST 2003
363 33ID Beamline R%26D
equipment:  
UNICAT fredericks@anl.gov Mon Jan 13 13:54:49 CST 2003
362 33BM Beamline R%26D
equipment:  
UNICAT fredericks@anl.gov Mon Jan 13 13:53:39 CST 2003
361 33BM Anomalous Scattering
equipment:  
P Zschack zschack@anl.gov Mon Jan 13 09:23:31 CST 2003
360 33BM Search for Charge ordering in Untwinned LSCO
equipment:  
Eric D. Isaacs isaacs@Lucent.com Mon Jan 13 09:09:53 CST 2003
359 33BM quick diffraction of SrTiO3 films on Si(001)
equipment:  
woicik woicik@anl.gov Thu Jan 09 15:00:32 CST 2003
358 34ID Fluorescence/Bone Apatite/Si-Cone
equipment:  
Ben Larson bcl@ornl.gov Tue Jan 07 10:33:49 CST 2003
357 34ID Ni Grain Boundary Orientations
equipment:  
Wenjun Liu wliu@top.uni.aps.anl.gov Tue Jan 07 10:29:12 CST 2003
356 34ID CCD Calibration and beamline testing
equipment:  
Wenjun Liu wliu@top.uni.aps.anl.gov Tue Jan 07 10:24:07 CST 2003
355 34ID Anticlastic curvature in Bent Si
equipment:  
Wenge Yang yangw@ornl.gov Tue Jan 07 10:07:08 CST 2003
354 34ID transmission monochromator test
equipment:  
Gene Ice gei@ornl.gov Tue Jan 07 10:04:39 CST 2003
353 34ID New CCD Calibration/deployment
equipment:  
Wenjun Liu wliu@top.uni.aps.anl.gov Tue Jan 07 09:56:50 CST 2003
352 34ID Creep Deformation in Ti Alloy
equipment:  
Ben Larson bcl@orl.gov Tue Jan 07 09:50:56 CST 2003
351 34ID Copper Nanoindentation Deformation
equipment:  
Wenge Yang yangw@ornl.gov Tue Jan 07 09:47:42 CST 2003
350 33ID this is a test
equipment:  
Pete 847 / 615 - 8069 Thu Jan 02 17:35:25 CST 2003
349 33ID Electronic inhomogeneity in the superconducting cuprates probed by
equipment:  
T. Egami egami@seas.upenn.edu Mon Dec 23 10:43:48 CST 2002
348 34ID Load partitioning in Ni g/g%92 single crystal under load
equipment:  
Judy Pang pangj@ornl.gov Fri Dec 20 15:49:24 CST 2002
347 34ID Crack tip propagation of Ni3Al-TiC alloys
equipment:  
Judy Pang pangj@ornl.gov Fri Dec 20 15:46:02 CST 2002
346 34ID Transmission monochromator for microdiffraction
equipment:  
Gene E. Ice IceGE@ornl.gov Fri Dec 20 07:51:12 CST 2002
345 34ID Microstructres of electrodeposited Copper
equipment:  
Dorothy Miller djmiller@scs.uiuc.edu Wed Dec 18 12:36:16 CST 2002
344 34ID Tin Wisker Strain and Orientation
equipment:  
Gene Ice IceGE@ornl.gov Tue Dec 17 12:44:28 CST 2002
343 34ID Crystallization precursors of Ferritin
equipment:  
Sebastien Boutet 217-333-7382 Mon Dec 16 14:22:38 CST 2002
342 34ID 3D reconstruction of Au nanocrystals from higher order reflections
equipment:  
Garth Williams gjwillms@uiuc.edu Mon Dec 16 09:33:27 CST 2002
341 34ID 3-D Gain Growth in Aluminum
equipment:  
John Budai xry@ornl.gov Mon Dec 16 09:30:23 CST 2002
340 34ID FILAMENT TWIST IN F-ACTIN BUNDLES
equipment:  
Tommy Angelini angelini@uiuc.edu Mon Dec 16 00:45:37 CST 2002
339 34ID Thermally Driven Evolution of Pb Crystal Shapes
equipment:  
Mark Pfeifer mapfeife@uiuc.edu Fri Dec 13 16:01:40 CST 2002
338 34ID Step roughening of Au(110) at high temperature in UHV
equipment:  
WEI ZHANG wzhang4@uiuc.edu Fri Dec 13 12:59:09 CST 2002
337 34ID Imaging the strain field of dislocations in SiGe thin films
equipment:  
Ian Robinson ikr@uiuc.edu Fri Dec 13 11:18:11 CST 2002
336 34ID Co nanoprecipitates by dealloying in Cu
equipment:  
Ian Robinson ikr@uiuc.edu Fri Dec 13 11:14:48 CST 2002
335 33BM High Resolution Powder Diffraction
equipment:  
Bob Broach rwbroach@uop.com Thu Dec 12 15:48:43 CST 2002
334 33BM exafs of BaZrO3 and CaZrO3
equipment:  
woicik woicik@anl.gov Wed Dec 11 15:55:14 CST 2002
333 33BM Martensitic Phase Transformaitons in Yttrium Niobate and Dysprosium Titanate
equipment:  
Kriven w-kriven@uiuc.edu Mon Dec 09 21:14:01 CST 2002
332 33BM In situ, High temperature, Ferroelastic Transformations in Tantalates
equipment:  
Waltraud M. Kriven w-kriven@uiuc.edu Mon Dec 09 20:41:13 CST 2002
331 34ID Utilization of 34 ID for micro xtallograpy
equipment:  
Hawoong Hong h-hong@uiuc.edu Mon Dec 09 17:21:14 CST 2002
330 33ID Wetting layers in QWS
equipment:  
Hawoong Hong h-hong@uiuc.edu Mon Dec 09 17:14:41 CST 2002
329 33ID Functional Microstructures for Optimized Thermal Barrier and Wear Resistant Coatings using Side-Bounce USAXS
equipment:  
Tabbetha A. Dobbins tdobbins@nist.gov Mon Dec 09 15:43:32 CST 2002
328 33BM X-ray topography of LiAlO2
equipment:  
David Black david.black@nist.gov Mon Dec 09 14:55:53 CST 2002
327 33ID Preliminary in-situ investigation of surfactant-mediated nanoparticle assembly
equipment:  
Andrew Allen andrew.allen@nist.gov, 301-975-5982 Mon Dec 09 14:33:47 CST 2002
326 33ID Inelastic Scattering
equipment:  
Jon Tischler TischlerJZ@ornl.gov Mon Dec 09 14:30:28 CST 2002
325 33ID PLD on oxide (late)
equipment:  
Jon Tischler TischlerJZ@ornl.gov Mon Dec 09 14:29:07 CST 2002
324 33ID PLD
equipment:  
Jon Tischler TischlerJZ@ornl.gov Mon Dec 09 14:27:35 CST 2002
323 33ID X-ray induced bubbles
equipment:  
Hacene Boukari boukarih@mail.nih.gov Mon Dec 09 14:04:50 CST 2002
322 33ID Texture of Pt film on Si substrate
equipment:  
Jan Ilavsky ilavsky@aps.anl.gov Mon Dec 09 13:14:59 CST 2002
321 33ID USAXS imaging
equipment:  
Gabrielle Long gabrielle.long@nist.gov Mon Dec 09 13:04:26 CST 2002
320 33BM High resolution XRD measurements of hydride phase transformations in epitaxial Nb
equipment:  
Brent J. Heuser bheuser@uiuc.edu Mon Dec 09 12:40:47 CST 2002
319 33ID Small Angle Scattering Studies of Sticky Spheres
equipment:  
Subramanian Ramakrishnan ramakris@scs.uiuc.edu Fri Dec 06 16:57:49 CST 2002
318 33ID Quantum Size Effects in ultrathin films of Pb/Si(111)
equipment:  
Peter Czoschke czoschke@mrl.uiuc.edu Fri Dec 06 16:06:59 CST 2002
317 33BM In situ studies of catalysts
equipment:  
Simon Bare simon.bare@uop.com Fri Dec 06 11:31:29 CST 2002
316 33BM In situ studies of catalysts
equipment:  
Simon Bare simon.bare@uop.com Fri Dec 06 11:31:06 CST 2002
315 33BM In situ studies of catalysts
equipment:  
Simon Bare simon.bare@uop.com Fri Dec 06 11:29:50 CST 2002
314 33ID Ag film growth on Ge(111) at low temperature
equipment:  
T.-C. Chiang/ Leonardo Basile lbasile@uiuc.edu Fri Dec 06 11:10:28 CST 2002
313 33ID Phase Transformation and Oxidation Experiments on Nickel Base Superalloys
equipment:  
Eliot Specht spechted@ornl.gov Fri Dec 06 09:01:33 CST 2002
312 34ID Microstructure of Copper Electrodeposits
equipment:  
Ian Robinson 217-244-2278 Thu Dec 05 15:54:19 CST 2002
311 33ID Surface melting of Pb nanocrystals IV
equipment:  
Ian Robinson ikr@uiuc.edu Thu Dec 05 14:16:23 CST 2002
310 33ID Stress in protective oxides
equipment:  
Eliot Specht spechted@ornl.gov Thu Dec 05 13:19:13 CST 2002
309 33ID Phonon softening and critical exponents in SrTiO3
equipment:  
Martin Holt mvholt@uiuc.edu Thu Dec 05 13:13:34 CST 2002
308 33BM  
equipment:  
Joe Woicik 0868 Wed Dec 04 13:00:37 CST 2002
307 33BM Variable Temperature Powder Diffraction
equipment:  
Bob Broach rwbroach@uop.com Mon Nov 25 14:42:45 CST 2002
306 33BM exafs of BaCaZrO3
equipment:  
Joseph C. Woicik woicik@anl.gov Mon Nov 18 16:29:11 CST 2002
305 33BM X-ray diffraction search for charge ordering in La2CuO4
equipment:  
Eric D. Isaacs isaacs@lucent.com Mon Nov 18 10:31:53 CST 2002
304 33ID Charge ordering / orbital ordering
equipment:  
Jim Zuo   Thu Nov 14 14:40:46 CST 2002
303 33ID Depletion Interactions in Attractive Systems
equipment:  
SUbramanian Ramakrishnan ramakris@scs.uiuc.edu Sun Nov 03 11:14:39 CST 2002
302 34ID Coherent X-ray Diffraction from Au and Pb Microcrystals
equipment:  
Mark Pfeifer mapfeife@uiuc.edu Thu Oct 31 09:12:33 CST 2002
301 33ID Structure of mixtures of thermoresponsive microgels and hard sphere colloids via USAXS
equipment:  
William Smith wesmith@uiuc.edu Wed Oct 30 15:06:05 CST 2002
300 33BM IPRO 302 - In situ characterization of zeolite synthesis
equipment:  
Bob Broach rwbroach@uop.com Tue Oct 29 11:28:17 CST 2002
299 33ID USAXS Setup
equipment:  
Paul Zschack 0860 Mon Oct 14 09:01:35 CDT 2002
298 33BM Study of the beamline, bender and crystal
equipment:  
Jenia Karapetrova 2-0865 Wed Oct 09 10:20:45 CDT 2002
297 33ID Beamline R%26D Studies and Operations Startup
equipment:  
P. Zschack zschack@anl.gov Wed Oct 09 08:42:34 CDT 2002
296 33ID Follow-up visit for Phase Identification of Nb/Zr Multilayers by Transmission XRD
equipment:  
Greg Thompson thompson.748@osu.edu or (614)486-4957(home) or (614)292-5695(work) Wed Oct 02 16:19:23 CDT 2002
295 33BM magnetically driven lattice distortion in ZnCr2O4
equipment:  
Colin Broholm   Wed Sep 18 17:39:21 CDT 2002
294 33BM Thin film diffraction
equipment:  
brent heuser   Wed Sep 18 17:36:01 CDT 2002
293 33BM Spatially resolved powder diffraction
equipment:  
Andrzej Ringwelski and Bob Broach azringwe@uop.com Wed Sep 18 12:23:52 CDT 2002
292 33ID Nanosized Homopalladium and Heteronickel/Heteropalladium Carbonyl Clusters
equipment:  
Bob Broach rwbroach@uop.com Thu Sep 05 13:35:03 CDT 2002
291 33ID Pulsed Laser Ablation
equipment:  
Jon Tischler TischlerJZ@ornl.gov Tue Sep 03 16:47:30 CDT 2002
290 33BM Topo and XAFS study
equipment:  
Jenia Karapetrova jenia@anl.gov Tue Sep 03 12:14:31 CDT 2002
289 33ID USAXS imaging of natural and man-made tissues
equipment:  
Gabrielle Long gabrielle.long@nist.gov Fri Aug 30 09:26:38 CDT 2002
288 33ID Phonon softening and surface effects in the 110K phase transition of SrTiO3
equipment:  
Martin Holt mvholt@uiuc.edu Tue Aug 27 16:25:51 CDT 2002
287 33BM EXAFS of catalytic materials
equipment:  
Frank Modica 847-375-7641 Mon Aug 26 09:48:20 CDT 2002
286 33ID In Situ Study of Growth Processes in TiN/Sapphire Using Pulsed Laser Deposition
equipment:  
Peter Czoschke czoschke@mrl.uiuc.edu Fri Aug 23 17:29:26 CDT 2002
285 33ID Interlayer Relaxations in Preferred Height Pb Islands on Si(111)-7x7
equipment:  
Peter Czoschke czoschke@mrl.uiuc.edu Fri Aug 23 17:12:40 CDT 2002
284 33ID Inelastic X-ray Scattering
equipment:  
Jon Tischler   Fri Aug 23 14:06:39 CDT 2002
283 33ID Application of Effective Pin-hole Collimated SBUSAXS to Arbitrarily Anisotropic Coatings
equipment:  
Andrew Allen andrew.allen@nist.gov Thu Aug 22 15:09:35 CDT 2002
282 33ID Ag film growth on Ge(111) and Si(111) at low temperature
equipment:  
T.C. Chiang/ Leonardo Basile lbasile@uiuc.edu Thu Aug 22 13:49:01 CDT 2002
281 33ID combinatorial multicomponent films
equipment:  
Eliot Specht spechted@ornl.gov Thu Aug 22 12:45:53 CDT 2002
280 33ID Agglomeration of Nanoparticles
equipment:  
Andrew Allen andrew.allen@nist.gov Thu Aug 22 11:41:20 CDT 2002
279 33BM Topography commissioning
equipment:  
David Black david.black@nist.gov Wed Aug 21 15:49:47 CDT 2002
278 33BM Beam line R%26D
equipment:  
Jenia Karapetrova jenia@anl.gov Wed Aug 21 12:54:31 CDT 2002
277 33BM EXAFS studies of catalysts
equipment:  
Simon Bare srbare@uop.com Tue Aug 20 12:56:19 CDT 2002
276 33ID Surface melting of Pb nonparticles
equipment:  
Ian Robinson ikr@uiuc.edu Tue Aug 20 12:30:14 CDT 2002
275 33BM High Resolution Powder Diffraction
equipment:  
Bob Broach rwbroach@uop.com Mon Aug 19 12:42:21 CDT 2002
274 33ID Ag film growth at LT
equipment:  
Hawoong Hong h_hong@uiuc.edu Fri Jul 12 11:06:32 CDT 2002
273 33BM Beam line R%26D
equipment:  
Evguenia Karapetrova jenia@anl.gov Thu Jul 11 10:58:55 CDT 2002
272 33ID Bruker Xtallography
equipment:  
Bob Broach   Wed Jul 10 15:47:54 CDT 2002
271 33ID Microstructure of fractals and proteins
equipment:  
William Edwin Smith wesmith@uiuc.edu Mon Jul 01 10:21:59 CDT 2002
270 33ID Microstructure of depletion flocculated gels
equipment:  
Syed Ali Shah syedshah@uiuc.edu Fri Jun 28 16:37:05 CDT 2002
269 33BM High Temperature Phase Transformations in Oxide Ceramics
equipment:  
Waltraud Kriven w-kriven@uiuc.edu Fri Jun 14 01:25:17 CDT 2002
268 33BM High Temperature Phase Transformations in Oxide Ceramics
equipment:  
Waltraud Kriven w-kriven@uiuc.edu Fri Jun 14 01:25:14 CDT 2002
267 34ID Coherent X-ray Diffraction from Nanocrystals
equipment:  
Mark Pfeifer mapfeife@uiuc.edu Thu May 30 14:02:04 CDT 2002
266 33BM Preliminary EXAFS
equipment:  
Joseph Woicik joseph.woicik@nist.gov Mon May 13 13:15:27 CDT 2002
265 33BM Preliminary EXAFS
equipment:  
Joseph Woicik joseph.woicik@nist.gov Mon May 13 13:13:02 CDT 2002
264 33ID Dynamics of Nanophase Interractions During Nanotube Formation using Biotemplates
equipment:  
Mike Harris mtharris@ecn.purdue.edu Mon Apr 22 09:41:09 CDT 2002
263 33ID USAXS of silica and titania
equipment:  
Greg Beaucage gbeaucag@uc.edu Fri Apr 19 10:49:20 CDT 2002
262 33BM Glancing and Grazing Incident X-ray Diffraction of Metallic Thin Film Multilayers
equipment:  
Gregory Thompson thompson.748@osu.edu or 614-292-6263 Mon Apr 15 15:55:02 CDT 2002
261 33ID Side-Bounce USAXS, studies of TBC and polymers
equipment:  
Jan Ilavsky x0866 or ilavsky@aps.anl.gov Mon Apr 08 13:49:25 CDT 2002
260 33BM In situ EXAFS experiments
equipment:  
Simon Bare srbare@uop.com Fri Apr 05 09:11:35 CST 2002
259 33BM In situ EXAFS experiments
equipment:  
Simon Bare srbare@uop.com Fri Apr 05 09:09:44 CST 2002
258 33ID Phonon dispersion of MgB2
equipment:  
Hawoong Hong h-hong@uiuc,edu Thu Apr 04 12:09:45 CST 2002
257 33ID N/X School USAXS
equipment:  
Dean Haeffner haeffner@aps.anl.gov Tue Apr 02 17:06:30 CST 2002
256 33BM High Resolution Powder Diffraction
equipment:  
Bob Broach rwbroach@uop.com Mon Apr 01 14:46:26 CST 2002
255 33ID Beamline R%26D
equipment:  
P Zschack 2-0860 Fri Mar 29 14:19:50 CST 2002
254 33ID Inelastic scattering
equipment:  
Jon Tischler TischlerJZ@ornl.gov Wed Mar 27 11:12:35 CST 2002
253 33ID Pulsed Laser Deposition
equipment:  
Jon Tischler TischlerJZ@ornl.gov Wed Mar 27 11:01:13 CST 2002
252 33ID USAXS Imaging
equipment:  
Gabrielle Long gabrielle.long@nist.gov Mon Mar 18 07:41:24 CST 2002
251 33BM TDS analysis of low temperature phonon renormalization in superconducting Nb
equipment:  
Martin Holt mvholt@uiuc.edu Fri Mar 15 20:05:26 CST 2002
250 33ID Investigation of low temperature phase transitions in SrTiO3
equipment:  
Martin Holt mvholt@uiuc.edu Fri Mar 15 19:55:12 CST 2002
249 33ID Epitaxial growth and in-situ x-ray structural analysis of single crystal TiN films by PLD
equipment:  
Z. Q. Ma zhongma@uiuc.edu Fri Mar 15 14:39:34 CST 2002
248 33ID Preferred height and bilayer relaxation of Pb islands on Si(111)(7x7)
equipment:  
Peter Czoschke czoschke@uiuc.edu Fri Mar 15 14:21:33 CST 2002
247 33ID Ag film growth on Si(111) @ low temperatures
equipment:  
Leonardo Basile, Haydn Chen lbasile@uiuc.edu Fri Mar 15 14:16:46 CST 2002
246 33ID Surface melting of Lead Nanocrystals III
equipment:  
Ian Robinson ikr@uiuc.edu Tue Mar 12 19:21:02 CST 2002
245 34ID CXD from small Crystals
equipment:  
G. Williams gjwillms@uiuc.edu Tue Feb 26 18:46:12 CST 2002
244 33ID Growth stress of native oxides
equipment:  
Eliot Specht spechted@ornl.gov, (865)574-7682 Mon Feb 25 14:21:12 CST 2002
243 34ID CXD from Pb and Au 'Nanocrystals'
equipment:  
G. Williams gjwillms@uiuc.edu Tue Feb 19 13:43:21 CST 2002
242 34ID CXD from Small Crystals
equipment:  
G. Williams gjwillms@uiuc.edu Sat Jan 26 16:31:54 CST 2002
241 33BM high resolution powder diffraction
equipment:  
Bob Broach rwbroach@uop.com Fri Jan 11 13:44:23 CST 2002
240 33BM topography commissioning
equipment:  
David Black david.black@nist.gov Wed Dec 19 20:08:49 CST 2001
239   Test the beamtime request form
equipment:  
Pete Jemian jemian@uiuc.edu Mon Dec 17 18:10:34 CST 2001
238   Test the beamtime request form
equipment:  
Pete Jemian jemian@uiuc.edu Mon Dec 17 18:09:14 CST 2001
237   Test the beamtime request form
equipment:  
Pete Jemian jemian@uiuc.edu Mon Dec 17 18:03:37 CST 2001
236   In situ EXAFS experiments
equipment:  
Simon R. Bare srbare@uop.com Tue Dec 04 11:54:50 CST 2001
235   In situ EXAFS experiments
equipment:  
Simon R. Bare srbare@uop.com Tue Dec 04 11:54:04 CST 2001
234   USAXS studies of soft temperature sensitive microgel particle suspensions
equipment:  
Prashant Mullick pmullick@scs.uiuc.edu Mon Dec 03 13:21:00 CST 2001
233   USAXS Studies of Depletion Flocculated Gels
equipment:  
Syed Ali Shah syedshah@uiuc.edu Mon Dec 03 12:55:26 CST 2001
232   USAXS Imaging
equipment:  
Gabrielle Long gabrielle.long@nist.gov Mon Dec 03 11:14:56 CST 2001
231   Distribution of primary and secondary gamma-prime precipitates in Waspaloy as a function of high temperature exposure
equipment:  
Gabrielle Long gabrielle.long@nist.gov Mon Dec 03 11:05:04 CST 2001
230   Inelastic X-ray scattering
equipment:  
Jon Tischler TischlerJZ@ornl.gov Mon Dec 03 10:34:48 CST 2001
229   Pulsed Laser Deposition (Late)
equipment:  
Jon Tischler TischlerJZ@ornl.gov Mon Dec 03 10:29:33 CST 2001
228   Pulsed Laser Deposition
equipment:  
Jon Tischler TischlerJZ@ornl.gov Mon Dec 03 10:27:44 CST 2001
227   scattering from metallic nano scale islands
equipment:  
Hawoong Hong h-hong@uiuc.edu Sun Dec 02 22:32:56 CST 2001
226   Diffuse scattering in colossal magnetoresistive manganite La(2-2x)Sr(1+2x)Mn2O7
equipment:  
Martin Holt mvholt@uiuc.edu Sun Dec 02 21:58:22 CST 2001
225   Phonon softening in SrTiO3
equipment:  
Martin Holt mvholt@uiuc.edu Sun Dec 02 21:53:19 CST 2001
224   Diffuse scattering in Lead Magnesium Niobate
equipment:  
Andrei Tkachuk tkachuk@uiuc.edu Sun Dec 02 21:46:19 CST 2001
223   In situ study of layer-by-layer ripening of TiN films on sapphire using Pulsed Laser Deposition
equipment:  
Peter Czoschke czoschke@uiuc.edu Sun Dec 02 17:09:10 CST 2001
222   Preferred island height and layer relaxation of Ag/Si(111)(7x7)
equipment:  
Peter Czoschke czoschke@uiuc.edu Sun Dec 02 17:04:39 CST 2001
221   Optimization of Dispersion in Nanoparticulate Suspensions
equipment:  
Andrew Allen andrew.allen@nist.gov Fri Nov 30 17:08:01 CST 2001
220   SBUSAXS of Advanced HVOF, Thermal-Spray and EB-PVD Coatings on Substrates
equipment:  
Andrew Allen andrew.allen@nist.gov Fri Nov 30 16:25:08 CST 2001
219   Surface melting of Lead nanocrystals
equipment:  
Ian Robinson ikr@uiuc.edu Tue Nov 27 16:44:57 CST 2001
218   Defect structure of steel alloys
equipment:  
Gene Ice IceGE@ornl.gov Wed Nov 21 12:40:19 CST 2001
217   USAXS collimation investigation
equipment:  
Pete Jemian 2-0863 Mon Nov 19 18:19:54 CST 2001
216   Ag film growth on Si(111) @ low temperatures
equipment:  
Leonardo Basile lbasile@uiuc.edu Thu Nov 15 10:34:20 CST 2001
215   XPCS from Colliodal Silica
equipment:  
Garth Williams gjwillms@uiuc.edu Thu Nov 01 11:27:49 CST 2001
214   Studies
equipment:  
c. benson cabenson@uiuc.edu Wed Oct 31 08:43:43 CST 2001
213   Investigation of layered silicates for polymer reinforcement
equipment:  
Doug Kohls kohlsdj@email.uc.edu Sun Oct 14 11:35:35 CDT 2001
212   Investigation of layered silicates for polymer reinforcement
equipment:  
Doug Kohls kohlsdj@email.uc.edu Sun Oct 14 11:28:44 CDT 2001
211   Investigation of layered silicates for polymer reinforcement
equipment:  
Doug Kohls kohlsdj@email.uc.edu Sun Oct 14 11:28:43 CDT 2001
210   topography commissioning
equipment:  
David Black david.black@nist.gov Wed Oct 03 04:57:41 CDT 2001
209   Inert Gas Scattering
equipment:  
paul zschack zschack@anl.gov Tue Oct 02 11:08:35 CDT 2001
208   Beamline R%26D and beamline setup and recovery
equipment:  
P. Zschack zschack Mon Oct 01 16:48:21 CDT 2001
207   Beamline R%26D and beamline setup and recovery
equipment:  
P. Zschack zschack Mon Oct 01 16:46:40 CDT 2001
206   Ag film growth on Si(111) @ low temperatures
equipment:  
Leonardo Basile, Haydn Chen lbasile@uiuc.edu Mon Oct 01 13:54:44 CDT 2001
205   Physics of Fine Particle Agglomeration in Suspensions
equipment:  
Andrew Allen andrew.allen@nist.gov Mon Oct 01 13:07:32 CDT 2001
204   Diffuse scattering in Lead Magnesium Niobate
equipment:  
Andrei Tkachuk tkachuk@uiuc.edu Sun Sep 30 22:12:23 CDT 2001
203   Further Commissioning XAFS experiments
equipment:  
Simon R. Bare srbare@uop.com Fri Sep 28 13:47:26 CDT 2001
202   Commissioning XAFS experiments
equipment:  
Simon R. Bare srbare@uop.com Fri Sep 28 13:42:03 CDT 2001
201   USAXS Imaging of Deformation Structures
equipment:  
Gabrielle Long gabrielle.long@nist.gov Fri Sep 28 11:04:35 CDT 2001
200   Phonon softening in SrTiO3
equipment:  
T.-C. Chiang t-chiang@uiuc.edu Fri Sep 28 10:51:31 CDT 2001
199   CTR measurement of oscillatory layer relaxation and preferred island height of Pb islands on Si(111)
equipment:  
T.-C. Chiang t-chiang@uiuc.edu Fri Sep 28 10:45:36 CDT 2001
198   Oxidation of NiCr alloys
equipment:  
Eliot Specht spechted@ornl.gov Fri Sep 21 14:40:16 CDT 2001
197   Surface melting of Lead Nanocrystals
equipment:  
Ian Robinson ikr@uiuc.edu Thu Sep 20 08:34:26 CDT 2001
196   Diffuse scattering in PbMgNbO3 single crystal
equipment:  
Andrei Tkachuk tkachuk@uiuc.edu Wed Sep 19 16:40:57 CDT 2001
195   In-situ phase kinetics
equipment:  
Gene E. Ice IceGE@ornl.gov Tue Aug 14 05:40:52 CDT 2001
194   Commissioning of 34-ID-C
equipment:  
Ian Robinson ikr@uiuc.edu Thu Aug 02 16:57:43 CDT 2001
193   Beamline R%26D studies
equipment:  
P. Zschack zschack@anl.gov Thu Aug 02 14:23:51 CDT 2001
192   Phonon softening in SrTiO3
equipment:  
T.-C. Chiang t-chiang@uiuc.edu Tue Jun 19 15:03:10 CDT 2001
191   Microcrystal Diffraction
equipment:  
Bob Broach rwbroach@uop.com Mon Jun 11 14:59:38 CDT 2001
190   PLD
equipment:  
Jon Tischler TischlerJZ@ornl.gov Thu Jun 07 13:10:23 CDT 2001
189   Structural Transitions in Epitaxial Co layers
equipment:  
S.C. Moss SMoss@uh.edu Tue Jun 05 13:04:57 CDT 2001
188   Ag film growth on Si(111) @ low temperatures
equipment:  
Leonardo Basile lbasile@uiuc.edu Mon Jun 04 10:19:55 CDT 2001
187   Growth stress of protective oxides
equipment:  
Eliot Specht spechted@ornl.gov Sat Jun 02 15:02:34 CDT 2001
186   RSXD from strained and facetted films
equipment:  
Hawoonh Hong h-hong@uiuc.edu Sat Jun 02 12:37:32 CDT 2001
185   Development of Side-Bounce USAXS and studies of YSZ deposits
equipment:  
Jan Ilavsky ilavsky@aps.anl.gov Fri Jun 01 16:16:23 CDT 2001
184   USAXS Imaging
equipment:  
Gabrielle Long gabrielle.long@nist.gov Tue May 29 17:38:13 CDT 2001
183   High Resolution Powder Diffraction
equipment:  
Bob Broach rwbroach@uop.com Tue May 29 08:57:40 CDT 2001
182   Diffuse scattering
equipment:  
Andrei Tkachuk tkachuk@uiuc.edu Tue May 29 01:08:03 CDT 2001
181   N/X School Experiment
equipment:  
Dean Haeffner haeffner@aps.anl.gov Fri May 25 14:45:09 CDT 2001
180   Determination of changes in suspension microstructure during phase transitions induced by the addition of non-adsorbing polymer
equipment:  
Syed Ali Shah syedshah@uiuc.edu Thu May 24 11:36:02 CDT 2001
179   Investigation of structure and reinforcement properties of layered and precipitated silicates
equipment:  
Doug Kohls kohlsdj@email.uc.edu Thu Apr 26 07:58:40 CDT 2001
178   This is another test
equipment:  
another test   Wed Apr 04 15:02:31 CDT 2001
177   Testing form
equipment:  
Andrei Tkachuk tkachuk@uiuc.edu Wed Apr 04 14:28:38 CDT 2001
176   this is a test of the form tool
equipment:  
Pete is testing again jemian@anl.gov Wed Apr 04 14:27:20 CDT 2001
175   test #3 of the beamtime request form
equipment:  
Pete jemian@anl.gov Wed Apr 04 14:20:16 CDT 2001
174   test #3 of the beamtime request form
equipment:  
Pete jemian@anl.gov Wed Apr 04 14:19:51 CDT 2001
173   UNICAT Beamline Studies
equipment:  
Paul Zschack zschack@anl.gov Wed Mar 14 13:26:35 CST 2001
172   polarization studies of anomalous scattering from inert gases
equipment:  
Paul Zschack zschack@anl.gov Mon Mar 12 14:37:36 CST 2001
171   Pulsed Laser Ablation
equipment:  
Jon Tischler TischlerJZ@ornl.gov Fri Mar 09 15:58:38 CST 2001
170   Jill is added to the list
equipment:  
this is a test test email Fri Mar 09 14:42:14 CST 2001
169    
equipment:  
    Fri Mar 09 14:39:55 CST 2001
168   Growth stress of native oxides
equipment:  
Eliot Specht spechted@ornl.gov Fri Mar 09 07:26:13 CST 2001
167   USAXS studies of drug-induced tubulin ring polymers
equipment:  
Hacene Boukari boukarih@mail.nih.gov Thu Mar 08 20:37:43 CST 2001
166   Growth of metal nanocrystals at low temperature (II)
equipment:  
Hawoong Hong h-hong@uiuc.edu Thu Mar 08 16:27:21 CST 2001
165   TDS study of superconducting Nb
equipment:  
T.-C. Chiang t-chiang@uiuc.edu Thu Mar 08 14:32:21 CST 2001
164   USAXS %26 SB USAXS at 17-19keV
equipment:  
Jan Ilavsky ilavsky@aps.anl.gov Wed Mar 07 16:14:36 CST 2001
163   High Resolution Powder Diffraction
equipment:  
Bob Broach rwbroach@uop.com Wed Mar 07 10:49:31 CST 2001
162   Microcrystal Diffraction
equipment:  
Bob Broach rwbroach@uop.com Wed Mar 07 10:47:15 CST 2001
161   Anomalous USAXS from silicon nitride
equipment:  
Gabrielle Long gabrielle.long@nist.gov Wed Mar 07 08:31:48 CST 2001
160   Coherence effects on CXD from nanocrystals
equipment:  
Ian Robinson ikr@uiuc.edu Mon Mar 05 16:33:58 CST 2001
159   In-situ corrosion growth dynamics
equipment:  
Eliot Specht SpechtED@ornl.gov Thu Dec 21 13:58:41 CST 2000
158   Inelastic x-ray scattering
equipment:  
Jon Tischler TischlerJZ@ornl.gov Tue Dec 19 12:19:35 CST 2000
157   Pulsed Laser Deposition
equipment:  
Jon Tischler TischlerJZ@ornl.gov Tue Dec 19 12:11:31 CST 2000
156   USAXS studies of drug-induced tubulin ring polymers
equipment:  
Hacene Boukari boukarih@mail.nih.gov Mon Dec 18 16:02:14 CST 2000
155   USAXS development - use of scintilator as detector
equipment:  
Jan Ilavsky %26 Pete Jemian ilavsky@aps.anl.gov Mon Dec 18 13:02:04 CST 2000
154   Growth of metal nanocrystals at low temperature
equipment:  
Hawoong Hong h-hong@uiuc.edu Sat Dec 16 14:49:14 CST 2000
153    
equipment:  
    Fri Dec 15 11:36:37 CST 2000
152   USAXS imaging of deformation in copper
equipment:  
Gabrielle Long gabrielle.long@nist.gov Fri Dec 15 11:35:56 CST 2000
151   Anisotropic USAXS studies of coatings on substrates.
equipment:  
Andrew Allen andrew.allen@nist.gov Fri Dec 15 08:25:34 CST 2000
150   Structural studies of D2O in cements and defects in ceramics
equipment:  
Andrew Allen andrew.allen@nist.gov Fri Dec 15 08:15:22 CST 2000
149   Structural studies of D2O in cements
equipment:  
Andrew Allen andrew.allen@nist.gov Fri Dec 15 08:03:55 CST 2000
148    
equipment:  
    Tue Dec 12 17:16:34 CST 2000
147   Laser ablation of TiN on MgO[001]
equipment:  
T.-C. Chiang t-chiang@uiuc.edu Tue Dec 12 11:27:51 CST 2000
146   Diffuse scattering in Pb(Mg_1/3Nb_2/3)O_3 under applied electric field
equipment:  
Andrei Tkachuk tkachuk@uiuc.edu Fri Dec 01 16:29:32 CST 2000
145   High-throughput characterization of Mn phosphates and Mn-Fe phosphates
equipment:  
Simon R. Bare srbare@uop.com Fri Dec 01 15:26:17 CST 2000
144   High Resolution Powder Diffraction
equipment:  
Bob Broach rwbroach@uop.com Mon Nov 27 13:04:46 CST 2000
143   Single Crystal Diffraction from Tiny Crystals
equipment:  
Bob Broach rwbroach@uop.com Mon Nov 27 13:02:42 CST 2000
142   Inelastic Scattering
equipment:  
Jon Tischler TischlerJZ@ornl.gov Mon Sep 25 14:14:24 CDT 2000
141   Pulsed Laser Ablation
equipment:  
Jon Tischler TischlerJZ@ornl.gov Mon Sep 25 14:09:25 CDT 2000
140   Anomalous scattering from As/Si(111)
equipment:  
T.-C. Chiang t-chiang@uiuc.edu Sun Sep 24 22:56:26 CDT 2000
139   transition properties of Nb through low-temperature thermal diffuse scattering
equipment:  
T.-C. Chiang t-chiang@uiuc.edu Sun Sep 24 22:15:33 CDT 2000
138   USAXS equipment setup and development
equipment:  
Pete Jemian jemian@anl.gov Fri Sep 22 16:51:47 CDT 2000
137   Microstructure in Suspensions Experiencing Depletion Interactions
equipment:  
Charles F. Zukoski czukoski@uiuc.edu Fri Sep 22 13:05:07 CDT 2000
136   Smart Interfaces in Reinforced Polymers
equipment:  
Dale W. Schaefer dwschae@uceng.uc.edu Fri Sep 22 13:02:54 CDT 2000
135   Kinetics of Pb islands growth on Si(111) by RSXD
equipment:  
Hawoong Hong h-hong@uiuc.edu Thu Sep 21 18:02:12 CDT 2000
134   In-situ high-temperature evolution of Au nanocrystals
equipment:  
Ian Robinson ikr@uiuc.edu Tue Sep 12 14:32:30 CDT 2000
133   Single Crystal Diffraction from Tiny Crystals
equipment:  
Bob Broach rwbroach@uop.com Tue Sep 12 10:01:51 CDT 2000
132   Magnetic x-ray study of Neel order in (Dy-Tb)Ni2B2C
equipment:  
Myron Salamon salamon@uiuc.edu Mon Sep 11 14:56:22 CDT 2000
131   Beamline R%26D Studies
equipment:  
P. zschack   Mon Sep 11 09:58:10 CDT 2000
130   Transformation of amorphous alloy during deformation
equipment:  
Gene Ice   Mon Jul 10 15:34:40 CDT 2000
129   Pulsed Laser Deposition
equipment:  
Jon Tischler   Mon Jul 10 11:05:53 CDT 2000
128   micro diffuse scattering
equipment:  
Jon Tischler   Mon Jul 10 10:59:02 CDT 2000
127   Calibration of Pinhole USAXS and Nature of C-S-H in Cement (conclusion)
equipment:  
Andrew Allen   Wed Jul 05 16:24:46 CDT 2000
126   USAXS of polymers, fractal powders, cores and shells
equipment:  
Gabrielle Long   Wed Jul 05 14:23:56 CDT 2000
125   USAXS imaging, and feasibility studies
equipment:  
Gabrielle long   Wed Jul 05 14:06:25 CDT 2000
124   Anomalous scattering
equipment:  
Paul Zschack   Wed Jul 05 08:19:13 CDT 2000
123   Beamline R%26D Studies
equipment:  
Paul Zschack   Wed Jul 05 08:12:24 CDT 2000
122   Determination of phonon dispersions of elemental Nb through x-ray thermal diffuse scattering
equipment:  
T.-C. Chiang   Thu Jun 29 14:25:11 CDT 2000
121   Time resolved surface diffraction study of pulsed laser ablation of TiN on Si[100]
equipment:  
T.-C. Chiang   Thu Jun 29 13:53:32 CDT 2000
120   Depletion Effects in Binary Mixtures
equipment:  
Valeria Tohver   Tue Jun 27 21:04:48 CDT 2000
119   Single Crystal Diffraction from Tiny Crystals
equipment:  
Bob Broach   Mon Jun 26 15:29:40 CDT 2000
118   Carbon coated silica for elastomer reinforcement
equipment:  
Doug Kohls, kohlsdj@email.uc.edu   Thu Jun 22 11:14:55 CDT 2000
117   Structure of Silica Suspensions with Depletion Interactions.
equipment:  
Charles F. Zukoski   Mon Jun 19 17:40:24 CDT 2000
116   In-situ studies of the atomic displacements in Pb(Mg_2/3Nb_1/3)O_3 single crystal with ab applied electric field.
equipment:  
Andrei Tkachuk   Mon Jun 19 14:56:50 CDT 2000
115   Laser Ablation
equipment:  
Jon Tischler   Mon Apr 03 12:46:53 CDT 2000
114   High Temperature Phase Transformations in Oxide Ceramics
equipment:  
Haydn Chen   Sat Apr 01 13:22:38 CST 2000
113   Kinetics of uniform-height metal-islands fromation
equipment:  
Hawoong Hong   Fri Mar 31 17:41:43 CST 2000
112   Anomalous Scattering from Inert Gases
equipment:  
Paul Zschack   Fri Mar 31 14:08:16 CST 2000
111   Beamline Studies and R%26D
equipment:  
Paul Zschack   Fri Mar 31 14:01:20 CST 2000
110   Shapes of minority domains in Cu_3Au thin films
equipment:  
Robinson   Fri Mar 31 11:30:51 CST 2000
109   USAXS of Potential Groundwater-Borne Colloids in Geologic Repository
equipment:  
Pete Jemian   Thu Mar 30 12:01:52 CST 2000
108   counter-ion distribution around an aquatic colloidal particle
equipment:  
Pete Jemian   Thu Mar 30 11:40:50 CST 2000
107   USAXS of Waspaloy
equipment:  
Pete Jemian   Thu Mar 30 11:24:32 CST 2000
106   USAXS and Anisotropic USAXS Studies of Alumina, Cement, Coatings and Iron Titanate
equipment:  
Andrew Allen   Wed Mar 29 16:11:02 CST 2000
105   dislocation USAXS and imaging
equipment:  
Gabrielle Long   Wed Mar 29 15:52:06 CST 2000
104   Combined XRD, XRF %26 XANES studies of novel oxides
equipment:  
Simon R. Bare   Wed Mar 15 16:51:41 CST 2000
103    
equipment:  
    Fri Jan 28 03:59:21 CST 2000
102    
equipment:  
    Fri Jan 28 03:26:27 CST 2000
101    
equipment:  
    Fri Jan 28 03:26:24 CST 2000
100   Beamline Studies %26 Startup
equipment:  
P. Zschack   Thu Dec 09 12:25:26 CST 1999
99   Evolution of magnetic order in Dy_(1-x)Tb_xNi_2B_2C
equipment:  
Myron Salamon   Wed Dec 08 10:17:06 CST 1999
98   Strain and Alloying in Heteroepitaxial Islands Growth
equipment:  
Hawoong Hong   Mon Dec 06 22:53:37 CST 1999
97   Diffuse scatering with a microbeam
equipment:  
Jon Tischler   Mon Dec 06 17:05:28 CST 1999
96   Time Resolved Diffraction During Laser Deposition
equipment:  
Jon Tischler   Mon Dec 06 16:58:12 CST 1999
95   USAXS, USAXS optics, and A-USAXS
equipment:  
Gabrielle Long   Mon Dec 06 13:36:10 CST 1999
94   Anomalous Scattering
equipment:  
Paul Zschack   Mon Dec 06 09:42:42 CST 1999
93   High temperature surface long-range order of Ni-10at%Al(111)
equipment:  
Haydn Chen   Sat Dec 04 16:52:19 CST 1999
92   Copper A-USAXS from Model Reactor Pressure Vessel Steel
equipment:  
Pete Jemian   Fri Dec 03 18:00:13 CST 1999
91   CDW Phase Transitions in TiSe2
equipment:  
T.-C. Chiang   Fri Dec 03 14:51:06 CST 1999
90   Low temperature anomalous diffraction of superlattice reflections in Lead Magnesium Niobade.
equipment:  
Andrei Tkachuk   Wed Dec 01 16:08:32 CST 1999
89   Equilibrium crystal shapes of gold microparticles
equipment:  
Ian Robinson   Mon Nov 22 17:21:03 CST 1999
88   High resolution powder diffraction
equipment:  
rwbroach   Wed Oct 27 11:10:45 CDT 1999
87   USAXS of standard samples
equipment:  
Pete Jemian   Mon Oct 04 13:00:18 CDT 1999
86   Time resolved diffraction during pulsed laser ablation
equipment:  
Jon Tischler   Mon Oct 04 12:25:27 CDT 1999
85   USAXS for materials characterization
equipment:  
Gabrielle Long   Fri Oct 01 12:29:25 CDT 1999
84   Phase transitions in Sn/Ge(111)
equipment:  
T.-C. Chiang   Fri Oct 01 11:53:30 CDT 1999
83   Realtime RSXD %26 surface-SAXS during Hetero-epitaxy
equipment:  
Hawoong Hong   Fri Oct 01 10:50:01 CDT 1999
82   X-ray scattering study of Cd2Os2O7
equipment:  
Mark D. Lumsden   Wed Sep 29 14:17:34 CDT 1999
81   Magnetic X-ray scattering study of K2ReBr6
equipment:  
Mark D. Lumsden   Wed Sep 29 14:13:45 CDT 1999
80   surface structures of a Ni-10at%Al(111)
equipment:  
Haydn Chen   Mon Sep 27 10:42:43 CDT 1999
79   Residual stresses in diesel engine components.
equipment:  
Tom Watkins   Tue Sep 21 16:36:32 CDT 1999
78   Anomalous Scattering
equipment:  
P. Zschack   Fri Sep 17 18:21:33 CDT 1999
77   Anomalous Scattering
equipment:  
P. Zschack   Fri Sep 17 18:21:05 CDT 1999
76   Anomalous Scattering
equipment:  
P. Zschack   Fri Sep 17 18:20:44 CDT 1999
75   Resonant Plasmon Dispersion
equipment:  
E.D.Isaacs   Fri Jul 02 16:09:20 CDT 1999
74   Anomalous Scattering from inert gases
equipment:  
Paul Zschack   Thu Jul 01 11:38:23 CDT 1999
73   Diffuse scattering with nano-focus beam
equipment:  
Jon Tischler   Wed Jun 30 23:09:56 CDT 1999
72   Time Resolved Pulsed Laser Ablation
equipment:  
Jon Tischler   Wed Jun 30 23:05:50 CDT 1999
71   Time resolved RSXD during MBE growth
equipment:  
Hawoong Hong   Wed Jun 30 16:51:23 CDT 1999
70   USAXS optics
equipment:  
Gabrielle Long, Jan Ilavsky and Pete Jemian   Wed Jun 30 14:11:18 CDT 1999
69   MagneticX-ray scattering study of K2ReBr6 and/or Cd2Os2O7
equipment:  
Mark Lumsden / Stephen Nagler   Tue Jun 29 15:27:43 CDT 1999
68   microstructure of polymers %26 cements; side-refl. stage commissioning
equipment:  
Gabrielle Long, Andrew Allen, Jan Ilavsky, Pete Jemian   Tue Jun 29 14:09:05 CDT 1999
67   XRRS
equipment:  
Gene Ice   Mon Jun 28 15:16:05 CDT 1999
66   Surface reconstruction on Ge(111) induced by Sn
equipment:  
Tai C. Chiang   Mon Jun 28 14:44:12 CDT 1999
65   Structure Solution from High Resolution Powder Data
equipment:  
Bob Broach   Tue Jun 22 14:03:14 CDT 1999
64   Imaging of grains of polycrystalline metals
equipment:  
Ian Robinson   Tue Jun 22 10:30:11 CDT 1999
63   Low Temperature Diffuse Scattering
equipment:  
Andrei Tkachuk students@uiuc.edu   Tue Jun 22 02:32:15 CDT 1999
62   ASAXS of Cu-precipitation in Fe-0.9Cu-1.0Mn steel
equipment:  
Pete Jemian   Fri Jun 18 16:15:27 CDT 1999
61   Spacer-layer magnetization in exchange coupled superlattices
equipment:  
M. B. Salamon   Mon May 10 17:06:57 CDT 1999
60   Time resolved RSXD during epitaxial growth
equipment:  
Hawoong Hong   Fri May 07 11:10:48 CDT 1999
59   Feasibility USAXS Study of Different Clases of Materials
equipment:  
G.G. Long and A.J. Allen   Fri May 07 10:02:23 CDT 1999
58   Charge density wave transitions in TiSe2
equipment:  
T.-C. Chiang   Thu May 06 16:59:44 CDT 1999
57   micro diffuse scattering
equipment:  
Jon Tischler   Thu May 06 14:58:51 CDT 1999
56   Resonant Magnetic X-ray Scattering Study of K2ReBr6
equipment:  
Stephen E. Nagler   Wed May 05 14:07:56 CDT 1999
55   X-Ray Scattering Study of Cd2Os2O7
equipment:  
Stephen E. Nagler   Wed May 05 14:04:27 CDT 1999
54   Crystallization of Molecular Sieves
equipment:  
Robert W. Broach   Thu Mar 04 12:48:26 CST 1999
53   Resonant Raman Scattering
equipment:  
Gene Ice   Mon Mar 01 17:06:54 CST 1999
52    
equipment:  
    Mon Mar 01 15:29:14 CST 1999
51   diffuse scattering with tiny beam (zone plate)
equipment:  
Jon Tischler   Mon Mar 01 15:28:40 CST 1999
50    
equipment:  
    Mon Mar 01 15:26:32 CST 1999
49   Laser Ablaiont
equipment:  
Jon Tischler   Mon Mar 01 15:26:09 CST 1999
48   creep in SiN, ceramic suspensions, x-ray optics
equipment:  
Gabrielle Long, A.J. Allen, P. Jemian, J. Ilavsky   Mon Mar 01 13:50:17 CST 1999
47   Thermal diffuse scattering images from superconducting oxides
equipment:  
T.-C. Chiang   Wed Feb 24 11:39:43 CST 1999
46   Resonant Magnetic X-Ray Scattering Study of K2ReBr6
equipment:  
Stephen E. Nagler (ORNL)   Wed Feb 24 11:21:23 CST 1999
45   X-Ray Scattering Study of Cd2Os2O7
equipment:  
Stephen E. Nagler (ORNL)   Wed Feb 24 10:36:00 CST 1999
44   EXAFS studies of dilute systems
equipment:  
Simon R. Bare   Wed Feb 17 11:00:32 CST 1999
43   Temperature dependent TDS images of superconducting oxides
equipment:  
T. C. Chiang   Tue Jan 05 13:12:34 CST 1999
42   USAXS commissioning, colloidal suspensions, ceramics
equipment:  
Gabrielle Long, Andrew Allen, and Pete Jemian   Tue Jan 05 12:57:18 CST 1999
41    
equipment:  
    Mon Jan 04 16:58:36 CST 1999
40   Laser Ablation of SrTiO3
equipment:  
Jon Tischler   Mon Jan 04 16:57:57 CST 1999
39   Micro Diffruse Scattering
equipment:  
Jon Tischler   Mon Jan 04 16:54:29 CST 1999
38   Real-time observation of surface structural transformation
equipment:  
Hawoong Hong   Mon Jan 04 12:26:41 CST 1999
37   Thermal Diffuse Scattering in PMN and PSN
equipment:  
Haydn Chen   Tue Dec 22 13:17:41 CST 1998
36   Spacer-layer magnetization in magnetic superlattices.
equipment:  
Myron B. Salamon   Fri Dec 18 13:27:38 CST 1998
35   Crystallization of Zeolites
equipment:  
Bob Broach   Thu Dec 17 13:33:39 CST 1998
34   2D mapping of surface coherent diffraction
equipment:  
Ian Robinson   Tue Dec 15 21:18:19 CST 1998
33   In situ slurry characterization
equipment:  
Andrew Allen, Gabrielle Long, and Pete Jemian   Tue Oct 20 15:33:16 CDT 1998
32   Fractal Structures in Nanostructured Materials
equipment:  
Andrew Allen, Gabrielle Long, and Pete Jemian   Tue Oct 20 15:25:37 CDT 1998
31   RSXD from strained layers
equipment:  
Hawoong Hong   Mon Oct 19 15:03:50 CDT 1998
30   EXAFS studies using ID beam
equipment:  
Simon R. Bare   Fri Oct 16 13:29:36 CDT 1998
29   Phonon scattering patterns
equipment:  
T. C. Chiang   Thu Oct 15 09:50:48 CDT 1998
28   Structural Studies of Microporous Materials
equipment:  
Robert W. Broach   Mon Oct 12 18:12:04 CDT 1998
27   Laser Ablation
equipment:  
Jon Tischler   Tue Aug 11 11:37:09 CDT 1998
26   Commissioning
equipment:  
Hawoong Hong   Tue Aug 11 09:16:04 CDT 1998
25   Induced magnetic order in GMR multilayers
equipment:  
Myron B. Salamon   Mon Aug 10 09:51:43 CDT 1998
24   Surfaces, interfaces, phonons, superconductivity, CDW, and phase transitions
equipment:  
Tai C. Chiang   Thu Jul 30 10:21:34 CDT 1998
23   Characterization of Zeolites and Microporous Materials
equipment:  
Bob Broach   Mon Jul 27 12:44:41 CDT 1998
22   Charge density wave in Pb/Ge(111)
equipment:  
Ian Robinson   Mon Jul 27 12:12:21 CDT 1998
21   Resonant Inelastic X-ray scattering from Sr2CuO2Cl2
equipment:  
Peter Abbamonte   Mon Jul 27 11:06:19 CDT 1998
20   X-ray Raman Scattering from Insulating Cuprates
equipment:  
Peter Abbamonte   Mon May 11 15:59:54 CDT 1998
19   Commissioning of the 33-ID conditioning table
equipment:  
A. Allen, G. Long, and P. Jemian   Thu Apr 23 13:18:56 CDT 1998
18   Commissioning of Surface Diffractometer
equipment:  
Hawoong Hong   Thu Apr 23 11:44:13 CDT 1998
17   EXAFS Studies of Catalysts
equipment:  
Simon R. Bare   Mon Apr 20 15:30:58 CDT 1998
16   Transmission diffraction/scattering from superconductors and charge density wave compounds
equipment:  
Tai C. Chiang   Wed Apr 15 09:06:42 CDT 1998
15   Real-time pulsed-deposition film-growth
equipment:  
Jon Tischler   Tue Apr 14 12:20:26 CDT 1998
14   Anomalous scattering
equipment:  
Paul Zschack   Mon Apr 13 17:03:14 CDT 1998
13   DSP calibration
equipment:  
Pete Jemian   Wed Mar 11 10:15:45 CST 1998
12   EXAFS Studies of Catalysts
equipment:  
Simon R. Bare   Thu Feb 26 12:45:28 CST 1998
11   Small Angle and Microbeam X-ray diffuse Scattering
equipment:  
G.E. Ice and B. C. Larson   Tue Feb 24 14:32:37 CST 1998
10   Coherent Diffraction from Domain Wall Structures
equipment:  
Ian Robinson   Thu Feb 19 17:53:34 CST 1998
9   Demonstration Experiments for UIUC Engineering Open House
equipment:  
Haydn Chen   Fri Feb 13 16:45:38 CST 1998
8   Transmission and reflection diffraction from Si and other materials
equipment:  
T. C. Chiang   Wed Feb 11 07:56:07 CST 1998
7   Structural Studies of Microporous Materials
equipment:  
Bob Broach   Mon Feb 09 15:47:03 CST 1998
6   Characterization of ion-implanted materials
equipment:  
Ben Larson   Tue Dec 16 11:55:41 CST 1997
5   Induced magnetic polarization in Co/Ir superlattices
equipment:  
Myron B. Salamon   Thu Dec 11 14:06:04 CST 1997
4   Inert Gas Form Factors
equipment:  
Paul Zschack   Tue Dec 9 12:05:08 CST 1997
3   Transmission and reflection diffraction from Si and other materials
equipment:  
Tai C. Chiang   Mon Nov 24 17:37:17 CST 1997
2   Ab Initio Structure Solution from Powder Data
equipment:  
Bob Broach   Thu Nov 20 09:40:15 CST 1997
1   Coherent Diffraction Test Experiment
equipment:  
Ian Robinson   Thu Nov 13 12:50:29 CST 1997